IN2012DE01202A - - Google Patents
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- Publication number
- IN2012DE01202A IN2012DE01202A IN1202DE2012A IN2012DE01202A IN 2012DE01202 A IN2012DE01202 A IN 2012DE01202A IN 1202DE2012 A IN1202DE2012 A IN 1202DE2012A IN 2012DE01202 A IN2012DE01202 A IN 2012DE01202A
- Authority
- IN
- India
- Prior art keywords
- capacitance
- charge
- voltage
- integrating
- convert
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/30—Single-ended push-pull [SEPP] amplifiers; Phase-splitters therefor
- H03F3/3001—Single-ended push-pull [SEPP] amplifiers; Phase-splitters therefor with field-effect transistors
- H03F3/3022—CMOS common source output SEPP amplifiers
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
- H03F3/45179—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using MOSFET transistors as the active amplifying circuit
- H03F3/45183—Long tailed pairs
- H03F3/45192—Folded cascode stages
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
- H03F3/45475—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using IC blocks as the active amplifying circuit
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45514—Indexing scheme relating to differential amplifiers the FBC comprising one or more switched capacitors, and being coupled between the LC and the IC
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45536—Indexing scheme relating to differential amplifiers the FBC comprising a switch and being coupled between the LC and the IC
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Amplifiers (AREA)
Abstract
One way to sense a capacitance is to convert it to charge and measure the charge quantity. Charge and capacitance are related by Q=CV where Q=charge, C=capacitance and V=voltage. The G3, G4 and G5 capacitance sense solutions convert the capacitance into charge by modulating the voltage across it and integrating the resulting current. On G4 this used an integration capacitor with two capacitors in feedback where one capacitor is always integrating while the second can be reset in parallel (see CD10109).
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IN1202DE2012 IN2012DE01202A (en) | 2012-04-18 | 2012-04-18 | |
US13/591,136 US8791753B2 (en) | 2012-04-18 | 2012-08-21 | Slew rate and bandwidth enhancement in reset |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IN1202DE2012 IN2012DE01202A (en) | 2012-04-18 | 2012-04-18 |
Publications (1)
Publication Number | Publication Date |
---|---|
IN2012DE01202A true IN2012DE01202A (en) | 2015-10-16 |
Family
ID=49379542
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IN1202DE2012 IN2012DE01202A (en) | 2012-04-18 | 2012-04-18 |
Country Status (2)
Country | Link |
---|---|
US (1) | US8791753B2 (en) |
IN (1) | IN2012DE01202A (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10084983B2 (en) * | 2014-04-29 | 2018-09-25 | Fermi Research Alliance, Llc | Wafer-scale pixelated detector system |
US20180121011A1 (en) * | 2016-10-31 | 2018-05-03 | iGlass Technology, Inc. | Electrochromic touchscreen device |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3868580A (en) | 1973-02-12 | 1975-02-25 | Tektronix Inc | Bootstrapped amplifier |
JPS6081685A (en) * | 1983-10-11 | 1985-05-09 | Toshiba Corp | Auto zero integrator |
US6140871A (en) | 1999-03-26 | 2000-10-31 | National Semiconductor Corporation | Switched capacitor amplifier circuit having bus precharge capability and method |
JP3984808B2 (en) | 2000-09-07 | 2007-10-03 | キヤノン株式会社 | Signal processing apparatus, imaging apparatus using the same, and radiation imaging system |
CN101095232B (en) | 2003-07-16 | 2010-12-08 | Nxp股份有限公司 | Input stage resistant against negative voltage swings |
US6891414B1 (en) * | 2004-03-05 | 2005-05-10 | Rf Micro Devices, Inc. | Digital calibration for capacitor voltage non-linearity |
US8299844B2 (en) * | 2005-09-29 | 2012-10-30 | Case Western Reserve University | System and circuitry to provide stable transconductance for biasing |
JP4237174B2 (en) | 2005-10-31 | 2009-03-11 | Necエレクトロニクス株式会社 | Operational amplifier, integrating circuit, feedback amplifier, and control method of feedback amplifier |
JP4744325B2 (en) | 2006-03-02 | 2011-08-10 | ルネサスエレクトロニクス株式会社 | Signal amplifier |
JP2009159508A (en) | 2007-12-27 | 2009-07-16 | Nec Electronics Corp | Operational amplifier and integrating circuit |
WO2010033078A1 (en) | 2008-09-19 | 2010-03-25 | Agency For Science, Technology And Research | A method for converting a sensor capacitance under parasitic capacitance conditions and a capacitance-to-voltage converter circuit |
TWI381173B (en) | 2008-10-29 | 2013-01-01 | Raydium Semiconductor Corp | Capacitance measurement circuit and capacitance measurement method thereof |
KR101511162B1 (en) | 2008-12-01 | 2015-04-13 | 삼성전자주식회사 | Multi touch sensing circuit |
US8018238B2 (en) | 2009-03-27 | 2011-09-13 | Texas Instruments Incorporated | Embedded sar based active gain capacitance measurement system and method |
US7936299B2 (en) | 2009-06-30 | 2011-05-03 | General Electric Company | Capacitive integrate and fold charge-to-digital converter |
KR20110112128A (en) | 2010-04-06 | 2011-10-12 | 삼성전자주식회사 | Method and apparatus for parasitic capacitance compensation in touch panel |
US8624870B2 (en) * | 2010-04-22 | 2014-01-07 | Maxim Integrated Products, Inc. | System for and method of transferring charge to convert capacitance to voltage for touchscreen controllers |
EP2428774B1 (en) * | 2010-09-14 | 2013-05-29 | Stichting IMEC Nederland | Readout system for MEMs-based capacitive accelerometers and strain sensors, and method for reading |
US9762234B2 (en) | 2011-02-10 | 2017-09-12 | Synaptics Incorporated | Input device interference determination |
-
2012
- 2012-04-18 IN IN1202DE2012 patent/IN2012DE01202A/en unknown
- 2012-08-21 US US13/591,136 patent/US8791753B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
US20130278334A1 (en) | 2013-10-24 |
US8791753B2 (en) | 2014-07-29 |
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