IL97183A0 - Method and arrangement for automatic monitoring of space shape data in the production of semi conductor parts - Google Patents
Method and arrangement for automatic monitoring of space shape data in the production of semi conductor partsInfo
- Publication number
- IL97183A0 IL97183A0 IL97183A IL9718391A IL97183A0 IL 97183 A0 IL97183 A0 IL 97183A0 IL 97183 A IL97183 A IL 97183A IL 9718391 A IL9718391 A IL 9718391A IL 97183 A0 IL97183 A0 IL 97183A0
- Authority
- IL
- Israel
- Prior art keywords
- arrangement
- production
- shape data
- automatic monitoring
- conductor parts
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/859—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector involving monitoring, e.g. feedback loop
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01014—Silicon [Si]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01039—Yttrium [Y]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01057—Lanthanum [La]
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE4003983A DE4003983C1 (en) | 1990-02-09 | 1990-02-09 | Automated monitoring of space=shape data for mfg. semiconductors - compares image signals for defined illumination angle range with master signals, to determine defects |
Publications (1)
Publication Number | Publication Date |
---|---|
IL97183A0 true IL97183A0 (en) | 1992-05-25 |
Family
ID=6399803
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IL97183A IL97183A0 (en) | 1990-02-09 | 1991-02-07 | Method and arrangement for automatic monitoring of space shape data in the production of semi conductor parts |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP0514393A1 (en) |
JP (1) | JPH05508702A (en) |
DE (1) | DE4003983C1 (en) |
IL (1) | IL97183A0 (en) |
WO (1) | WO1991012489A1 (en) |
Families Citing this family (34)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2845601B2 (en) * | 1990-10-09 | 1999-01-13 | 株式会社東芝 | Wire bonding inspection system |
US5825945A (en) * | 1992-05-15 | 1998-10-20 | Unisys Corp | Document imaging with illumination from lambertian surfaces |
DE4239039C2 (en) * | 1992-11-20 | 2001-08-16 | Hesse Gmbh | Method for acquiring data from bond pads for controlling a bonder |
US5446549A (en) * | 1993-01-14 | 1995-08-29 | The United States Of America As Represented By The Secretary Of The Navy | Method and apparatus for noncontact surface contour measurement |
DE4413831C2 (en) * | 1994-04-20 | 2000-05-31 | Siemens Ag | Method for checking semiconductor wafers |
DE4413832C2 (en) * | 1994-04-20 | 2000-05-31 | Siemens Ag | Devices for checking semiconductor wafers |
IE80676B1 (en) * | 1996-08-02 | 1998-11-18 | M V Research Limited | A measurement system |
GB2316168B (en) * | 1996-08-06 | 2000-04-12 | M V Research Limited | A measurement system |
DE19652124C2 (en) * | 1996-12-14 | 2002-10-17 | Micronas Gmbh | Method and device for automatically checking position data of J-shaped electrical contact connections |
US6055054A (en) * | 1997-05-05 | 2000-04-25 | Beaty; Elwin M. | Three dimensional inspection system |
US5909285A (en) * | 1997-05-05 | 1999-06-01 | Beaty; Elwin M. | Three dimensional inspection system |
US6915007B2 (en) | 1998-01-16 | 2005-07-05 | Elwin M. Beaty | Method and apparatus for three dimensional inspection of electronic components |
US6915006B2 (en) | 1998-01-16 | 2005-07-05 | Elwin M. Beaty | Method and apparatus for three dimensional inspection of electronic components |
US6072898A (en) | 1998-01-16 | 2000-06-06 | Beaty; Elwin M. | Method and apparatus for three dimensional inspection of electronic components |
DE10026301A1 (en) * | 2000-05-26 | 2001-11-29 | Sick Ag | Image processing method and apparatus |
DE10128476C2 (en) * | 2001-06-12 | 2003-06-12 | Siemens Dematic Ag | Optical sensor device for the visual detection of substrates |
DE10208978B4 (en) * | 2002-02-28 | 2005-06-23 | Robert Bosch Gmbh | Method and device for determining a height profile of a wire connection |
DE10250705A1 (en) * | 2002-10-31 | 2004-05-13 | Bayerische Motoren Werke Ag | Method and device for shadow compensation in digital images |
US7604174B2 (en) | 2003-10-24 | 2009-10-20 | Cognex Technology And Investment Corporation | Method and apparatus for providing omnidirectional lighting in a scanning device |
US9070031B2 (en) | 2003-10-24 | 2015-06-30 | Cognex Technology And Investment Llc | Integrated illumination assembly for symbology reader |
US7874487B2 (en) | 2005-10-24 | 2011-01-25 | Cognex Technology And Investment Corporation | Integrated illumination assembly for symbology reader |
US9536124B1 (en) | 2003-10-24 | 2017-01-03 | Cognex Corporation | Integrated illumination assembly for symbology reader |
US7823789B2 (en) | 2004-12-21 | 2010-11-02 | Cognex Technology And Investment Corporation | Low profile illumination for direct part mark readers |
US7823783B2 (en) | 2003-10-24 | 2010-11-02 | Cognex Technology And Investment Corporation | Light pipe illumination system and method |
US7617984B2 (en) | 2004-12-16 | 2009-11-17 | Cognex Technology And Investment Corporation | Hand held symbology reader illumination diffuser |
US9292724B1 (en) | 2004-12-16 | 2016-03-22 | Cognex Corporation | Hand held symbology reader illumination diffuser with aimer optics |
EP1675453A3 (en) * | 2004-12-22 | 2007-07-11 | Siemens Aktiengesellschaft | Device for illuminating objects and sensor device |
US9234852B2 (en) | 2005-07-29 | 2016-01-12 | Mitutoyo Corporation | Systems and methods for controlling strobe illumination |
US8045002B2 (en) | 2005-07-29 | 2011-10-25 | Mitutoyo Corporation | Systems and methods for controlling strobe illumination |
JP4740826B2 (en) * | 2006-02-23 | 2011-08-03 | 株式会社神戸製鋼所 | Shape measuring device and shape measuring method |
DE102006015714B4 (en) * | 2006-04-04 | 2019-09-05 | Applied Materials Gmbh | Light-assisted testing of an opto-electronic module |
JP6050928B2 (en) * | 2011-05-02 | 2016-12-21 | ローム株式会社 | Manufacturing method of wire bonding structure |
DE102014205701A1 (en) * | 2014-03-27 | 2015-10-01 | Robert Bosch Gmbh | Method and device for determining the position and / or orientation of at least one plug-in contact |
DE102021211601A1 (en) * | 2020-10-14 | 2022-04-14 | Emage Equipment PTE, Ltd. | MEASURING THE LOOP HEIGHT OF OVERLAPPING BONDS |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3834819A (en) * | 1973-07-05 | 1974-09-10 | Western Electric Co | Thickness measuring |
DE2929846A1 (en) * | 1979-07-23 | 1981-03-12 | Siemens AG, 1000 Berlin und 8000 München | OPTO-ELECTRONIC TESTING SYSTEM FOR AUTOMATIC CHECKING OF CHARACTERISTICS, THEIR INTERMEDIATE PRODUCTS AND PRINTING TOOLS |
JPS58219441A (en) * | 1982-06-15 | 1983-12-20 | Hajime Sangyo Kk | Apparatus for detecting defect on surface of convex object |
DE3337251A1 (en) * | 1983-10-13 | 1985-04-25 | Gerd Dipl.-Phys. Dr. 8520 Erlangen Häusler | OPTICAL SCANING METHOD FOR THE THREE-DIMENSIONAL MEASUREMENT OF OBJECTS |
US4648053A (en) * | 1984-10-30 | 1987-03-03 | Kollmorgen Technologies, Corp. | High speed optical inspection system |
JPS6282314A (en) * | 1985-10-08 | 1987-04-15 | Hitachi Ltd | Stereo measurement system for difference in light intensity |
US4728195A (en) * | 1986-03-19 | 1988-03-01 | Cognex Corporation | Method for imaging printed circuit board component leads |
US4875778A (en) * | 1987-02-08 | 1989-10-24 | Luebbe Richard J | Lead inspection system for surface-mounted circuit packages |
JPH0682102B2 (en) * | 1987-02-27 | 1994-10-19 | 三菱電機株式会社 | Pattern defect inspection device and pattern defect inspection method |
-
1990
- 1990-02-09 DE DE4003983A patent/DE4003983C1/en not_active Expired - Fee Related
-
1991
- 1991-01-15 WO PCT/EP1991/000056 patent/WO1991012489A1/en not_active Application Discontinuation
- 1991-01-15 JP JP91502441A patent/JPH05508702A/en active Pending
- 1991-01-15 EP EP91902216A patent/EP0514393A1/en not_active Withdrawn
- 1991-02-07 IL IL97183A patent/IL97183A0/en unknown
Also Published As
Publication number | Publication date |
---|---|
DE4003983C1 (en) | 1991-08-29 |
JPH05508702A (en) | 1993-12-02 |
WO1991012489A1 (en) | 1991-08-22 |
EP0514393A1 (en) | 1992-11-25 |
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