IL68745A0 - Method for analyzing complex signals - Google Patents

Method for analyzing complex signals

Info

Publication number
IL68745A0
IL68745A0 IL68745A IL6874583A IL68745A0 IL 68745 A0 IL68745 A0 IL 68745A0 IL 68745 A IL68745 A IL 68745A IL 6874583 A IL6874583 A IL 6874583A IL 68745 A0 IL68745 A0 IL 68745A0
Authority
IL
Israel
Prior art keywords
complex signals
analyzing complex
analyzing
signals
complex
Prior art date
Application number
IL68745A
Other languages
English (en)
Original Assignee
Westinghouse Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Westinghouse Electric Corp filed Critical Westinghouse Electric Corp
Publication of IL68745A0 publication Critical patent/IL68745A0/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/312—Contactless testing by capacitive methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/16—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using capacitive devices

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Emergency Protection Circuit Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
IL68745A 1982-06-01 1983-05-20 Method for analyzing complex signals IL68745A0 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/383,447 US4488301A (en) 1982-06-01 1982-06-01 System for analyzing complex signals

Publications (1)

Publication Number Publication Date
IL68745A0 true IL68745A0 (en) 1983-09-30

Family

ID=23513193

Family Applications (1)

Application Number Title Priority Date Filing Date
IL68745A IL68745A0 (en) 1982-06-01 1983-05-20 Method for analyzing complex signals

Country Status (10)

Country Link
US (1) US4488301A (xx)
EP (1) EP0095881B1 (xx)
JP (1) JPS58218669A (xx)
AU (1) AU558027B2 (xx)
CA (1) CA1186054A (xx)
DE (1) DE3367814D1 (xx)
ES (1) ES522874A0 (xx)
IE (1) IE54340B1 (xx)
IL (1) IL68745A0 (xx)
NO (1) NO161526C (xx)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0828934B2 (ja) * 1984-07-31 1996-03-21 株式会社東芝 保護制御装置
US4815077A (en) * 1987-01-28 1989-03-21 Westinghouse Electric Corp. Test system for electronic devices with radio frequency signature extraction means
US5121394A (en) * 1989-12-20 1992-06-09 Bull Hn Information Systems Inc. Method of organizing programmable logic array devices for board testability
US6998849B2 (en) * 2003-09-27 2006-02-14 Agilent Technologies, Inc. Capacitive sensor measurement method for discrete time sampled system for in-circuit test
US8032330B2 (en) * 2008-03-07 2011-10-04 Nokia Corporation Electromagnetic interference sensor device and method and computer program

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3573751A (en) * 1969-04-22 1971-04-06 Sylvania Electric Prod Fault isolation system for modularized electronic equipment
US3976940A (en) * 1975-02-25 1976-08-24 Fairchild Camera And Instrument Corporation Testing circuit
US4001818A (en) * 1975-10-22 1977-01-04 Storage Technology Corporation Digital circuit failure detector
JPS52100173A (en) * 1976-02-18 1977-08-22 Meidensha Electric Mfg Co Ltd Method of inspecting logic board
US4084136A (en) * 1976-10-21 1978-04-11 Battelle Memorial Institute Eddy current nondestructive testing device for measuring variable characteristics of a sample utilizing Walsh functions
US4161276A (en) * 1978-03-01 1979-07-17 Ncr Corporation Complex logical fault detection apparatus and method
US4313200A (en) * 1978-08-28 1982-01-26 Takeda Riken Kogyo Kabushikikaisha Logic test system permitting test pattern changes without dummy cycles
JPS57700A (en) * 1980-06-03 1982-01-05 Matsushita Electric Ind Co Ltd Voice recognizing device

Also Published As

Publication number Publication date
IE54340B1 (en) 1989-08-30
NO831944L (no) 1983-12-02
CA1186054A (en) 1985-04-23
ES8405160A1 (es) 1984-05-16
DE3367814D1 (en) 1987-01-08
NO161526B (no) 1989-05-16
JPS58218669A (ja) 1983-12-19
AU1465583A (en) 1983-12-08
IE831146L (en) 1983-12-01
AU558027B2 (en) 1987-01-15
US4488301A (en) 1984-12-11
EP0095881B1 (en) 1986-11-20
ES522874A0 (es) 1984-05-16
NO161526C (no) 1989-08-23
EP0095881A1 (en) 1983-12-07
JPH0367232B2 (xx) 1991-10-22

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