IL62751A - Exb mass separator for separating and focusing ion beams - Google Patents
Exb mass separator for separating and focusing ion beamsInfo
- Publication number
- IL62751A IL62751A IL62751A IL6275181A IL62751A IL 62751 A IL62751 A IL 62751A IL 62751 A IL62751 A IL 62751A IL 6275181 A IL6275181 A IL 6275181A IL 62751 A IL62751 A IL 62751A
- Authority
- IL
- Israel
- Prior art keywords
- separating
- ion beams
- mass separator
- focusing ion
- exb mass
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Tubes For Measurement (AREA)
- Physical Vapour Deposition (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/151,009 US4315153A (en) | 1980-05-19 | 1980-05-19 | Focusing ExB mass separator for space-charge dominated ion beams |
Publications (1)
Publication Number | Publication Date |
---|---|
IL62751A true IL62751A (en) | 1984-03-30 |
Family
ID=22536942
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IL62751A IL62751A (en) | 1980-05-19 | 1981-04-29 | Exb mass separator for separating and focusing ion beams |
Country Status (5)
Country | Link |
---|---|
US (1) | US4315153A (xx) |
JP (1) | JPS5723458A (xx) |
FR (1) | FR2482768A1 (xx) |
GB (1) | GB2076588B (xx) |
IL (1) | IL62751A (xx) |
Families Citing this family (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1982004351A1 (en) * | 1981-05-26 | 1982-12-09 | Aircraft Co Hughes | Focused ion beam microfabrication column |
US4563587A (en) * | 1981-05-26 | 1986-01-07 | Hughes Aircraft Company | Focused ion beam microfabrication column |
JPS6062045A (ja) * | 1983-09-14 | 1985-04-10 | Hitachi Ltd | イオンマイクロビ−ム打込み装置 |
JPH0724209B2 (ja) * | 1985-03-08 | 1995-03-15 | 日新電機株式会社 | イオン注入装置 |
US4835399A (en) * | 1986-08-22 | 1989-05-30 | Hitachi, Ltd. | Charged particle beam apparatus |
JP2706471B2 (ja) * | 1987-09-30 | 1998-01-28 | 日本真空技術株式会社 | 静電掃引型イオン注入機用平行掃引装置 |
US5313061A (en) * | 1989-06-06 | 1994-05-17 | Viking Instrument | Miniaturized mass spectrometer system |
US5019712A (en) * | 1989-06-08 | 1991-05-28 | Hughes Aircraft Company | Production of focused ion cluster beams |
EP0462554B1 (en) * | 1990-06-20 | 2000-10-11 | Hitachi, Ltd. | Charged particle beam apparatus |
JP2671657B2 (ja) * | 1991-04-22 | 1997-10-29 | 富士電機株式会社 | 高分子センサ |
US6495823B1 (en) | 1999-07-21 | 2002-12-17 | The Charles Stark Draper Laboratory, Inc. | Micromachined field asymmetric ion mobility filter and detection system |
US7129482B2 (en) * | 1999-07-21 | 2006-10-31 | Sionex Corporation | Explosives detection using differential ion mobility spectrometry |
US7005632B2 (en) * | 2002-04-12 | 2006-02-28 | Sionex Corporation | Method and apparatus for control of mobility-based ion species identification |
US6690004B2 (en) * | 1999-07-21 | 2004-02-10 | The Charles Stark Draper Laboratory, Inc. | Method and apparatus for electrospray-augmented high field asymmetric ion mobility spectrometry |
US6815669B1 (en) | 1999-07-21 | 2004-11-09 | The Charles Stark Draper Laboratory, Inc. | Longitudinal field driven ion mobility filter and detection system |
US6815668B2 (en) * | 1999-07-21 | 2004-11-09 | The Charles Stark Draper Laboratory, Inc. | Method and apparatus for chromatography-high field asymmetric waveform ion mobility spectrometry |
US7098449B1 (en) | 1999-07-21 | 2006-08-29 | The Charles Stark Draper Laboratory, Inc. | Spectrometer chip assembly |
US6806463B2 (en) * | 1999-07-21 | 2004-10-19 | The Charles Stark Draper Laboratory, Inc. | Micromachined field asymmetric ion mobility filter and detection system |
US7064491B2 (en) * | 2000-11-30 | 2006-06-20 | Semequip, Inc. | Ion implantation system and control method |
EP1347804A4 (en) * | 2000-11-30 | 2009-04-22 | Semequip Inc | ION IMPLANTATION SYSTEM AND CONTROL METHOD |
ATE553372T1 (de) * | 2001-06-30 | 2012-04-15 | Dh Technologies Dev Pte Ltd | System zum sammeln von daten und zur identifizierung unbekannter substanzen in einem elektrischen feld |
US7274015B2 (en) * | 2001-08-08 | 2007-09-25 | Sionex Corporation | Capacitive discharge plasma ion source |
US7091481B2 (en) | 2001-08-08 | 2006-08-15 | Sionex Corporation | Method and apparatus for plasma generation |
US6727496B2 (en) * | 2001-08-14 | 2004-04-27 | Sionex Corporation | Pancake spectrometer |
US7122794B1 (en) | 2002-02-21 | 2006-10-17 | Sionex Corporation | Systems and methods for ion mobility control |
US20050061997A1 (en) * | 2003-09-24 | 2005-03-24 | Benveniste Victor M. | Ion beam slit extraction with mass separation |
EP1733219A2 (en) * | 2004-01-13 | 2006-12-20 | Sionex Corporation | Methods and apparatus for enhanced sample identification based on combined analytical techniques |
GB0408235D0 (en) * | 2004-04-13 | 2004-05-19 | Kratos Analytical Ltd | Ion selector |
US7399959B2 (en) * | 2004-12-03 | 2008-07-15 | Sionex Corporation | Method and apparatus for enhanced ion based sample filtering and detection |
EP1913379A2 (en) | 2005-07-26 | 2008-04-23 | Sionex Corporation | Ultra compact ion mobility based analyzer apparatus, method, and system |
GB2434845B (en) | 2006-02-01 | 2010-10-13 | Intelligent Energy Ltd | Variable compressibility gaskets |
US8217344B2 (en) | 2007-02-01 | 2012-07-10 | Dh Technologies Development Pte. Ltd. | Differential mobility spectrometer pre-filter assembly for a mass spectrometer |
GB2622401A (en) * | 2022-09-14 | 2024-03-20 | Thermo Fisher Scient Bremen Gmbh | Tuning a mass spectrometer filter |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2243362A (en) * | 1938-08-20 | 1941-05-27 | Thomas W Sukumlyn | Electron microscope system |
US2947868A (en) * | 1959-07-27 | 1960-08-02 | Geophysics Corp Of America | Mass spectrometer |
FR2043973A5 (xx) * | 1969-05-05 | 1971-02-19 | Thomson Csf | |
US3816748A (en) * | 1972-04-28 | 1974-06-11 | Alpha Ind Inc | Ion accelerator employing crossed-field selector |
NL7415318A (nl) * | 1974-11-25 | 1976-05-28 | Philips Nv | Wienfilter. |
DE2556291C3 (de) * | 1975-12-13 | 1980-11-27 | Gesellschaft Fuer Strahlen- Und Umweltforschung Mbh, 8000 Muenchen | Raster-Ionenmikroskop |
US4163151A (en) * | 1977-12-28 | 1979-07-31 | Hughes Aircraft Company | Separated ion source |
-
1980
- 1980-05-19 US US06/151,009 patent/US4315153A/en not_active Expired - Lifetime
-
1981
- 1981-04-29 IL IL62751A patent/IL62751A/xx unknown
- 1981-05-06 GB GB8113860A patent/GB2076588B/en not_active Expired
- 1981-05-18 FR FR8109837A patent/FR2482768A1/fr active Granted
- 1981-05-19 JP JP7558981A patent/JPS5723458A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
JPS5723458A (en) | 1982-02-06 |
US4315153A (en) | 1982-02-09 |
GB2076588B (en) | 1984-01-11 |
GB2076588A (en) | 1981-12-02 |
FR2482768A1 (fr) | 1981-11-20 |
FR2482768B1 (xx) | 1984-11-16 |
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