IL265725B - Self-recovering digital latch - Google Patents

Self-recovering digital latch

Info

Publication number
IL265725B
IL265725B IL265725A IL26572519A IL265725B IL 265725 B IL265725 B IL 265725B IL 265725 A IL265725 A IL 265725A IL 26572519 A IL26572519 A IL 26572519A IL 265725 B IL265725 B IL 265725B
Authority
IL
Israel
Prior art keywords
self
digital latch
recovering digital
recovering
latch
Prior art date
Application number
IL265725A
Other languages
Hebrew (he)
Other versions
IL265725A (en
Original Assignee
Raytheon Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Raytheon Co filed Critical Raytheon Co
Publication of IL265725A publication Critical patent/IL265725A/en
Publication of IL265725B publication Critical patent/IL265725B/en

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/767—Horizontal readout lines, multiplexers or registers
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • H03K3/037—Bistable circuits
    • H03K3/0375—Bistable circuits provided with means for increasing reliability; for protection; for ensuring a predetermined initial state when the supply voltage has been applied; for storing the actual state when the supply voltage fails
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/20—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from infrared radiation only

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Dram (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Logic Circuits (AREA)
IL265725A 2016-10-19 2019-03-31 Self-recovering digital latch IL265725B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15/297,225 US10425604B2 (en) 2016-10-19 2016-10-19 Self-recovering digital latch
PCT/US2017/056876 WO2018075445A1 (en) 2016-10-19 2017-10-17 Self-recovering digital latch

Publications (2)

Publication Number Publication Date
IL265725A IL265725A (en) 2019-05-30
IL265725B true IL265725B (en) 2021-04-29

Family

ID=60201680

Family Applications (1)

Application Number Title Priority Date Filing Date
IL265725A IL265725B (en) 2016-10-19 2019-03-31 Self-recovering digital latch

Country Status (7)

Country Link
US (1) US10425604B2 (en)
EP (1) EP3529806A1 (en)
JP (1) JP6707193B2 (en)
KR (1) KR102158436B1 (en)
IL (1) IL265725B (en)
TW (1) TWI743230B (en)
WO (1) WO2018075445A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11069683B2 (en) 2018-10-05 2021-07-20 Ics Llc Self restoring logic structures

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5192395A (en) * 1990-10-12 1993-03-09 Texas Instruments Incorporated Method of making a digital flexure beam accelerometer
US5784631A (en) * 1992-06-30 1998-07-21 Discovision Associates Huffman decoder
DE4232401A1 (en) * 1992-09-26 1994-03-31 Philips Patentverwaltung Arrangement for reading out images
US6573774B1 (en) * 2002-03-25 2003-06-03 Aeroflex Utmc Microelectronic Systems, Inc. Error correcting latch
JP3986393B2 (en) * 2002-08-27 2007-10-03 富士通株式会社 Integrated circuit device having nonvolatile data storage circuit
US6930527B1 (en) * 2004-01-30 2005-08-16 Hewlett-Packard Development Company, L.P. Triple redundant latch design with storage node recovery
US7054203B2 (en) * 2004-04-28 2006-05-30 Hewlett-Packard Development Company, L.P. High reliability memory element with improved delay time
US6937527B1 (en) 2004-05-27 2005-08-30 Hewlett-Packard Development Company, L.P. High reliability triple redundant latch with voting logic on each storage node
US7095262B2 (en) * 2004-07-19 2006-08-22 Hewlett-Packard Development Company, Lp. High reliability triple redundant latch with integrated testability
US7027333B2 (en) * 2004-09-03 2006-04-11 Hewlett-Packard Development Company, L.P. High reliability triple redundant memory element with integrated testability and voting structures on each latch
US20070229132A1 (en) * 2006-03-28 2007-10-04 Chu Sam G Scannable domino latch redundancy for soft error rate protection with collision avoidance
US8081010B1 (en) * 2009-11-24 2011-12-20 Ics, Llc Self restoring logic
US8654555B2 (en) * 2012-06-04 2014-02-18 Raytheon Company ROIC control signal generator
US9871520B1 (en) * 2016-08-15 2018-01-16 Xilinx, Inc. Voting circuit and self-correcting latches

Also Published As

Publication number Publication date
EP3529806A1 (en) 2019-08-28
US20180109749A1 (en) 2018-04-19
JP6707193B2 (en) 2020-06-10
TW201822470A (en) 2018-06-16
KR102158436B1 (en) 2020-09-21
US10425604B2 (en) 2019-09-24
TWI743230B (en) 2021-10-21
WO2018075445A1 (en) 2018-04-26
IL265725A (en) 2019-05-30
JP2019533941A (en) 2019-11-21
KR20190058607A (en) 2019-05-29

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