IL215967A - Method and device for detecting infrared radiation - Google Patents

Method and device for detecting infrared radiation

Info

Publication number
IL215967A
IL215967A IL215967A IL21596711A IL215967A IL 215967 A IL215967 A IL 215967A IL 215967 A IL215967 A IL 215967A IL 21596711 A IL21596711 A IL 21596711A IL 215967 A IL215967 A IL 215967A
Authority
IL
Israel
Prior art keywords
infrared radiation
detecting infrared
detecting
radiation
infrared
Prior art date
Application number
IL215967A
Other languages
Hebrew (he)
Other versions
IL215967A0 (en
Original Assignee
Ulis
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ulis filed Critical Ulis
Publication of IL215967A0 publication Critical patent/IL215967A0/en
Publication of IL215967A publication Critical patent/IL215967A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
    • G01J5/22—Electrical features thereof
    • G01J5/24—Use of specially adapted circuits, e.g. bridge circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
    • G01J5/22—Electrical features thereof
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/20—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from infrared radiation only
    • H04N23/23—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from infrared radiation only from thermal infrared radiation
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/673—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction by using reference sources
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Radiation Pyrometers (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
IL215967A 2009-04-30 2011-10-26 Method and device for detecting infrared radiation IL215967A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0952919A FR2945120B1 (en) 2009-04-30 2009-04-30 SYSTEM AND METHOD FOR DETECTING INFRARED RADIATION
PCT/FR2010/050746 WO2010125281A1 (en) 2009-04-30 2010-04-19 System and method for detecting infrared radiation

Publications (2)

Publication Number Publication Date
IL215967A0 IL215967A0 (en) 2012-01-31
IL215967A true IL215967A (en) 2016-04-21

Family

ID=41317530

Family Applications (1)

Application Number Title Priority Date Filing Date
IL215967A IL215967A (en) 2009-04-30 2011-10-26 Method and device for detecting infrared radiation

Country Status (9)

Country Link
US (1) US8674307B2 (en)
EP (1) EP2425220B1 (en)
JP (1) JP5773986B2 (en)
KR (1) KR20120061039A (en)
CN (1) CN102460096B (en)
CA (1) CA2760468C (en)
FR (1) FR2945120B1 (en)
IL (1) IL215967A (en)
WO (1) WO2010125281A1 (en)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9243960B2 (en) * 2009-04-30 2016-01-26 Ulis System and method for detecting infrared radiation
EP2579009A1 (en) * 2011-10-06 2013-04-10 Ulis System and method for detecting infrared radiation
US9068882B2 (en) * 2013-06-11 2015-06-30 International Business Machines Corporation Low power thermal imager
KR101533404B1 (en) * 2013-12-17 2015-07-03 한국과학기술원 Signal acquisition circuit which compensate non-uniformity of bolometer
FR3016212B1 (en) * 2014-01-08 2017-05-05 Commissariat Energie Atomique INFRARED DETECTION DEVICE AND METHOD
US10179728B2 (en) * 2014-07-09 2019-01-15 Emx Advanced Technologies, Llc Micro-bolometer having an adjustable dynamic range
US10534386B2 (en) 2016-11-29 2020-01-14 Taiwan Semiconductor Manufacturing Co., Ltd. Low-dropout voltage regulator circuit
KR101947256B1 (en) * 2017-03-06 2019-02-12 동의대학교 산학협력단 Method for calculating calibration curve for measuring high temperature
CN107192464B (en) * 2017-07-12 2023-05-05 中国科学院上海技术物理研究所 Non-uniformity correction circuit of long-wave photoconductive infrared detector
CN108132101A (en) * 2017-12-15 2018-06-08 中国电子科技集团公司第四十四研究所 Flouride-resistani acid phesphatase high dynamic circuit of focal plane readout
US11555744B2 (en) * 2018-04-17 2023-01-17 Obsidian Sensors, Inc. Readout circuits and methods
JP6807348B2 (en) * 2018-05-16 2021-01-06 シャープ株式会社 Radiation detector and radiation transmission image acquisition system
JP7119122B2 (en) * 2018-05-17 2022-08-16 アムス インターナショナル エージー Sensor Placement and Sensor Measurement Methods
US20210389183A1 (en) * 2018-11-09 2021-12-16 Yale University High-speed ultrathin silicon-on-insulator infrared bolometers and imagers
FR3088512B1 (en) 2018-11-09 2020-10-30 Schneider Electric Ind Sas PROCESS FOR PROCESSING AN IMAGE
WO2020250327A1 (en) * 2019-06-12 2020-12-17 三菱電機株式会社 Infrared imaging device
FR3100612B1 (en) * 2019-09-05 2021-08-06 Lynred INSTANT CAPTURE INFRARED SENSOR
CN112556862B (en) * 2020-11-05 2022-07-01 天津大学 Large Dynamic Range, Small Area Readout Circuit Using Current Mirrors for Mode Switching
TWI866362B (en) * 2023-07-28 2024-12-11 高爾科技股份有限公司 Method for dynamic correction for pixels of thermal image array

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6274869B1 (en) 1996-06-28 2001-08-14 Lockheed-Martin Ir Imaging Systems, Inc. Digital offset corrector
US5756999A (en) * 1997-02-11 1998-05-26 Indigo Systems Corporation Methods and circuitry for correcting temperature-induced errors in microbolometer focal plane array
US5903659A (en) 1997-04-17 1999-05-11 Raytheon Company Adaptive non-uniformity compensation algorithm
JP2002310783A (en) * 2001-04-19 2002-10-23 Mitsubishi Electric Corp Bolometer type infrared sensor array
KR100586308B1 (en) * 2005-04-15 2006-06-08 한국과학기술원 Compensation circuit that can compensate for non-uniformity according to the change of operating temperature of bolometer.

Also Published As

Publication number Publication date
WO2010125281A1 (en) 2010-11-04
EP2425220A1 (en) 2012-03-07
CN102460096A (en) 2012-05-16
FR2945120A1 (en) 2010-11-05
IL215967A0 (en) 2012-01-31
CA2760468A1 (en) 2010-11-04
FR2945120B1 (en) 2015-11-27
US8674307B2 (en) 2014-03-18
CN102460096B (en) 2014-05-14
US20120037805A1 (en) 2012-02-16
EP2425220B1 (en) 2014-09-10
CA2760468C (en) 2017-02-07
KR20120061039A (en) 2012-06-12
JP5773986B2 (en) 2015-09-02
JP2012525573A (en) 2012-10-22

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