IL192650A0 - A method for defects enhancement - Google Patents

A method for defects enhancement

Info

Publication number
IL192650A0
IL192650A0 IL192650A IL19265008A IL192650A0 IL 192650 A0 IL192650 A0 IL 192650A0 IL 192650 A IL192650 A IL 192650A IL 19265008 A IL19265008 A IL 19265008A IL 192650 A0 IL192650 A0 IL 192650A0
Authority
IL
Israel
Prior art keywords
enhancement
defects
defects enhancement
Prior art date
Application number
IL192650A
Original Assignee
Camtek Ltd
Avi Levy
Lev Reznik
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Camtek Ltd, Avi Levy, Lev Reznik filed Critical Camtek Ltd
Publication of IL192650A0 publication Critical patent/IL192650A0/en

Links

IL192650A 2007-07-06 2008-07-06 A method for defects enhancement IL192650A0 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US94819307P 2007-07-06 2007-07-06

Publications (1)

Publication Number Publication Date
IL192650A0 true IL192650A0 (en) 2009-02-11

Family

ID=40571621

Family Applications (1)

Application Number Title Priority Date Filing Date
IL192650A IL192650A0 (en) 2007-07-06 2008-07-06 A method for defects enhancement

Country Status (3)

Country Link
CN (1) CN101408521A (en)
IL (1) IL192650A0 (en)
TW (1) TW200912292A (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5371099B2 (en) * 2009-05-19 2013-12-18 株式会社日本マイクロニクス Visual inspection device and visual inspection method
US20140010952A1 (en) * 2012-01-02 2014-01-09 Noam ROSENSTEIN Pcb repair of defective interconnects by deposition of conductive ink
US9885671B2 (en) 2014-06-09 2018-02-06 Kla-Tencor Corporation Miniaturized imaging apparatus for wafer edge
US9645097B2 (en) 2014-06-20 2017-05-09 Kla-Tencor Corporation In-line wafer edge inspection, wafer pre-alignment, and wafer cleaning
CN113252682B (en) * 2021-04-15 2022-12-16 首钢集团有限公司 Method for improving accuracy of surface quality detection system for identifying strip steel surface defects

Also Published As

Publication number Publication date
CN101408521A (en) 2009-04-15
TW200912292A (en) 2009-03-16

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