IL192163A0 - Method and system for monitoring an operator - Google Patents

Method and system for monitoring an operator

Info

Publication number
IL192163A0
IL192163A0 IL192163A IL19216308A IL192163A0 IL 192163 A0 IL192163 A0 IL 192163A0 IL 192163 A IL192163 A IL 192163A IL 19216308 A IL19216308 A IL 19216308A IL 192163 A0 IL192163 A0 IL 192163A0
Authority
IL
Israel
Prior art keywords
operator
monitoring
Prior art date
Application number
IL192163A
Other versions
IL192163A (en
Original Assignee
Camtek Ltd
Dolev Lior
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Camtek Ltd, Dolev Lior filed Critical Camtek Ltd
Publication of IL192163A0 publication Critical patent/IL192163A0/en
Publication of IL192163A publication Critical patent/IL192163A/en

Links

IL192163A 2007-06-19 2008-06-15 Method and system for monitoring an operator IL192163A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US94482607P 2007-06-19 2007-06-19

Publications (2)

Publication Number Publication Date
IL192163A0 true IL192163A0 (en) 2009-02-11
IL192163A IL192163A (en) 2015-09-24

Family

ID=40308237

Family Applications (1)

Application Number Title Priority Date Filing Date
IL192163A IL192163A (en) 2007-06-19 2008-06-15 Method and system for monitoring an operator

Country Status (2)

Country Link
CN (1) CN101355694A (en)
IL (1) IL192163A (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2656155B1 (en) * 2010-12-22 2015-07-29 ABB Research Ltd. Method and system for monitoring an industrial system involving an eye tracking system
US9885671B2 (en) 2014-06-09 2018-02-06 Kla-Tencor Corporation Miniaturized imaging apparatus for wafer edge
US9645097B2 (en) 2014-06-20 2017-05-09 Kla-Tencor Corporation In-line wafer edge inspection, wafer pre-alignment, and wafer cleaning
CN112633854A (en) * 2020-12-31 2021-04-09 重庆电子工程职业学院 Student archive management system based on block chain
CN112632622B (en) * 2020-12-31 2022-08-26 重庆电子工程职业学院 Electronic file safety management system

Also Published As

Publication number Publication date
CN101355694A (en) 2009-01-28
IL192163A (en) 2015-09-24

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Legal Events

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