IL180133A0 - Method for inspecting electrical circuits and a system for inspecting electrical circuits - Google Patents

Method for inspecting electrical circuits and a system for inspecting electrical circuits

Info

Publication number
IL180133A0
IL180133A0 IL180133A IL18013306A IL180133A0 IL 180133 A0 IL180133 A0 IL 180133A0 IL 180133 A IL180133 A IL 180133A IL 18013306 A IL18013306 A IL 18013306A IL 180133 A0 IL180133 A0 IL 180133A0
Authority
IL
Israel
Prior art keywords
electrical circuits
inspecting electrical
inspecting
circuits
electrical
Prior art date
Application number
IL180133A
Original Assignee
Camtek Ltd
Abraham Levi
Rafi Amit
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Camtek Ltd, Abraham Levi, Rafi Amit filed Critical Camtek Ltd
Publication of IL180133A0 publication Critical patent/IL180133A0/en

Links

IL180133A 2005-12-17 2006-12-17 Method for inspecting electrical circuits and a system for inspecting electrical circuits IL180133A0 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US74905205P 2005-12-17 2005-12-17

Publications (1)

Publication Number Publication Date
IL180133A0 true IL180133A0 (en) 2007-06-03

Family

ID=40645874

Family Applications (1)

Application Number Title Priority Date Filing Date
IL180133A IL180133A0 (en) 2005-12-17 2006-12-17 Method for inspecting electrical circuits and a system for inspecting electrical circuits

Country Status (2)

Country Link
CN (1) CN101430362B (en)
IL (1) IL180133A0 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9885671B2 (en) 2014-06-09 2018-02-06 Kla-Tencor Corporation Miniaturized imaging apparatus for wafer edge
US9645097B2 (en) 2014-06-20 2017-05-09 Kla-Tencor Corporation In-line wafer edge inspection, wafer pre-alignment, and wafer cleaning
TWI615342B (en) * 2017-03-21 2018-02-21 德律科技股份有限公司 Circuit board test system, circuit board test method, and circuit board clamping apparatus

Also Published As

Publication number Publication date
CN101430362B (en) 2012-05-16
CN101430362A (en) 2009-05-13

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