IL156634A0 - Method to evaluate and improve the testability of electronic products - Google Patents

Method to evaluate and improve the testability of electronic products

Info

Publication number
IL156634A0
IL156634A0 IL15663403A IL15663403A IL156634A0 IL 156634 A0 IL156634 A0 IL 156634A0 IL 15663403 A IL15663403 A IL 15663403A IL 15663403 A IL15663403 A IL 15663403A IL 156634 A0 IL156634 A0 IL 156634A0
Authority
IL
Israel
Prior art keywords
testability
evaluate
improve
electronic products
products
Prior art date
Application number
IL15663403A
Original Assignee
Shmuel Livne
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shmuel Livne filed Critical Shmuel Livne
Priority to IL15663403A priority Critical patent/IL156634A0/en
Publication of IL156634A0 publication Critical patent/IL156634A0/en
Priority to PCT/IL2004/000560 priority patent/WO2004114050A2/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31707—Test strategies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G06F30/32—Circuit design at the digital level
    • G06F30/333—Design for testability [DFT], e.g. scan chain or built-in self-test [BIST]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Evolutionary Computation (AREA)
  • Geometry (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
IL15663403A 2003-06-25 2003-06-25 Method to evaluate and improve the testability of electronic products IL156634A0 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
IL15663403A IL156634A0 (en) 2003-06-25 2003-06-25 Method to evaluate and improve the testability of electronic products
PCT/IL2004/000560 WO2004114050A2 (en) 2003-06-25 2004-06-23 Method to evaluate and improve the testability of electronic products

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IL15663403A IL156634A0 (en) 2003-06-25 2003-06-25 Method to evaluate and improve the testability of electronic products

Publications (1)

Publication Number Publication Date
IL156634A0 true IL156634A0 (en) 2004-01-04

Family

ID=32587672

Family Applications (1)

Application Number Title Priority Date Filing Date
IL15663403A IL156634A0 (en) 2003-06-25 2003-06-25 Method to evaluate and improve the testability of electronic products

Country Status (2)

Country Link
IL (1) IL156634A0 (en)
WO (1) WO2004114050A2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104504386B (en) * 2014-12-08 2017-12-01 深圳市浦洛电子科技有限公司 A kind of modularization AOI localization methods, system and burning IC equipment

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US544391A (en) * 1895-08-13 Electric-railway conduit system
US4779273A (en) * 1984-06-14 1988-10-18 Data General Corporation Apparatus for self-testing a digital logic circuit
US5027355A (en) * 1989-04-14 1991-06-25 Control Data Corporation Logic circuit and design method for improved testability
BR9914200A (en) * 1998-09-30 2002-01-22 Cadence Design Systems Inc Methods for designing a circuit system, for expanding an existing methodology for assessing the feasibility of a circuit design, for performing a feasibility assessment for a circuit design, for refining a first decision rule for a circuit design, to form a second decision rule for a circuit design, for organizing a designer's experience data for a plurality of pre-designed circuit blocks, for increasing glue logic distribution efficiency and for distributing a plurality of logic elements of glue between design blocks and distribute glue logic for execution in an integrated circuit device design scheme, to convert a circuit block-specific interface, to select a circuit collector, to design a device that incorporates the enable a device test to verify the correct operation of a and to develop a behavioral test bench, collar interface and interface system
US6532571B1 (en) * 2000-01-21 2003-03-11 International Business Machines Corporation Method to improve a testability analysis of a hierarchical design

Also Published As

Publication number Publication date
WO2004114050A3 (en) 2005-11-03
WO2004114050A2 (en) 2004-12-29

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