IL142782A0 - Objective-type dark field scattering microscope - Google Patents

Objective-type dark field scattering microscope

Info

Publication number
IL142782A0
IL142782A0 IL14278201A IL14278201A IL142782A0 IL 142782 A0 IL142782 A0 IL 142782A0 IL 14278201 A IL14278201 A IL 14278201A IL 14278201 A IL14278201 A IL 14278201A IL 142782 A0 IL142782 A0 IL 142782A0
Authority
IL
Israel
Prior art keywords
objective
dark field
field scattering
type dark
scattering microscope
Prior art date
Application number
IL14278201A
Original Assignee
Yeda Res & Dev
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yeda Res & Dev filed Critical Yeda Res & Dev
Priority to IL14278201A priority Critical patent/IL142782A0/en
Publication of IL142782A0 publication Critical patent/IL142782A0/en
Priority to PCT/IL2002/000323 priority patent/WO2002086578A2/en
Priority to AU2002307784A priority patent/AU2002307784A1/en

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/06Means for illuminating specimens
    • G02B21/08Condensers
    • G02B21/10Condensers affording dark-field illumination

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
IL14278201A 2001-04-24 2001-04-24 Objective-type dark field scattering microscope IL142782A0 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
IL14278201A IL142782A0 (en) 2001-04-24 2001-04-24 Objective-type dark field scattering microscope
PCT/IL2002/000323 WO2002086578A2 (en) 2001-04-24 2002-04-24 Objective-type dark field scattering microscope
AU2002307784A AU2002307784A1 (en) 2001-04-24 2002-04-24 Objective-type dark field scattering microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IL14278201A IL142782A0 (en) 2001-04-24 2001-04-24 Objective-type dark field scattering microscope

Publications (1)

Publication Number Publication Date
IL142782A0 true IL142782A0 (en) 2002-03-10

Family

ID=11075348

Family Applications (1)

Application Number Title Priority Date Filing Date
IL14278201A IL142782A0 (en) 2001-04-24 2001-04-24 Objective-type dark field scattering microscope

Country Status (3)

Country Link
AU (1) AU2002307784A1 (en)
IL (1) IL142782A0 (en)
WO (1) WO2002086578A2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107783267A (en) * 2016-08-30 2018-03-09 北京大学 Micro- amplification system

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5726490B2 (en) * 2010-11-26 2015-06-03 オリンパス株式会社 Light intensity measurement unit and microscope equipped with the same
WO2014184793A1 (en) * 2013-05-16 2014-11-20 Yeda Research And Development Co. Ltd. Method and system for use in inspection of samples by detection of optically excited emission from the sample
DE102013222562B4 (en) * 2013-11-06 2023-01-26 Leica Microsystems Cms Gmbh Microscope and method and use of a microscope for evanescent illumination and point grid illumination
JP6357317B2 (en) * 2014-01-30 2018-07-11 オリンパス株式会社 Microscope illumination device, microscope illumination method, and microscope
GB201819029D0 (en) * 2018-11-22 2019-01-09 Cambridge Entpr Ltd Optical microscopy
CN113406842A (en) * 2021-06-23 2021-09-17 湘潭大学 Ultramicro stacked dark field photography system and method

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS593791B2 (en) * 1975-04-07 1984-01-26 キヤノン株式会社 Object image recognition method
US4871257A (en) * 1982-12-01 1989-10-03 Canon Kabushiki Kaisha Optical apparatus for observing patterned article
US5220403A (en) * 1991-03-11 1993-06-15 International Business Machines Corporation Apparatus and a method for high numerical aperture microscopic examination of materials
DE19923295C2 (en) * 1999-05-21 2001-09-13 Leica Microsystems Optical system

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107783267A (en) * 2016-08-30 2018-03-09 北京大学 Micro- amplification system
CN107783267B (en) * 2016-08-30 2024-04-26 北京大学 Microscopic amplifying system

Also Published As

Publication number Publication date
WO2002086578A3 (en) 2004-03-18
AU2002307784A1 (en) 2002-11-05
WO2002086578A2 (en) 2002-10-31

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