IL121889A0 - Optical inspection method and system - Google Patents
Optical inspection method and systemInfo
- Publication number
- IL121889A0 IL121889A0 IL12188997A IL12188997A IL121889A0 IL 121889 A0 IL121889 A0 IL 121889A0 IL 12188997 A IL12188997 A IL 12188997A IL 12188997 A IL12188997 A IL 12188997A IL 121889 A0 IL121889 A0 IL 121889A0
- Authority
- IL
- Israel
- Prior art keywords
- inspection method
- optical inspection
- optical
- inspection
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Liquid Crystal (AREA)
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IL12188997A IL121889A0 (en) | 1997-10-06 | 1997-10-06 | Optical inspection method and system |
AU94564/98A AU9456498A (en) | 1997-10-06 | 1998-10-01 | Optical inspection method and system |
PCT/IL1998/000479 WO1999018472A1 (en) | 1997-10-06 | 1998-10-01 | Optical inspection method and system |
KR1020007003633A KR20010030932A (en) | 1997-10-06 | 1998-10-01 | Optical inspection method and system |
JP2000515203A JP2001519545A (en) | 1997-10-06 | 1998-10-01 | Optical inspection methods and systems |
TW087116409A TW366475B (en) | 1997-10-06 | 1998-10-02 | Optical inspection method and system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IL12188997A IL121889A0 (en) | 1997-10-06 | 1997-10-06 | Optical inspection method and system |
Publications (1)
Publication Number | Publication Date |
---|---|
IL121889A0 true IL121889A0 (en) | 1998-03-10 |
Family
ID=11070707
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IL12188997A IL121889A0 (en) | 1997-10-06 | 1997-10-06 | Optical inspection method and system |
Country Status (6)
Country | Link |
---|---|
JP (1) | JP2001519545A (en) |
KR (1) | KR20010030932A (en) |
AU (1) | AU9456498A (en) |
IL (1) | IL121889A0 (en) |
TW (1) | TW366475B (en) |
WO (1) | WO1999018472A1 (en) |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61178648A (en) * | 1985-02-04 | 1986-08-11 | Seiko Epson Corp | Apparatus for inspecting liquid crystal display element |
JPH01138476A (en) * | 1987-11-25 | 1989-05-31 | Rohm Co Ltd | Analyzing device for detective of semiconductor device |
JPH03217817A (en) * | 1990-01-24 | 1991-09-25 | Nippon Maikuronikusu:Kk | Method and device for inspecting liquid crystal dpsplay panel |
JPH08292406A (en) * | 1995-04-24 | 1996-11-05 | Advantest Corp | Lcd panel inspecting device |
JPH09257641A (en) * | 1996-03-26 | 1997-10-03 | Seiko Epson Corp | Method and device for inspecting display surface of liquid crystal panel |
-
1997
- 1997-10-06 IL IL12188997A patent/IL121889A0/en unknown
-
1998
- 1998-10-01 AU AU94564/98A patent/AU9456498A/en not_active Abandoned
- 1998-10-01 KR KR1020007003633A patent/KR20010030932A/en not_active Application Discontinuation
- 1998-10-01 WO PCT/IL1998/000479 patent/WO1999018472A1/en not_active Application Discontinuation
- 1998-10-01 JP JP2000515203A patent/JP2001519545A/en active Pending
- 1998-10-02 TW TW087116409A patent/TW366475B/en active
Also Published As
Publication number | Publication date |
---|---|
AU9456498A (en) | 1999-04-27 |
KR20010030932A (en) | 2001-04-16 |
JP2001519545A (en) | 2001-10-23 |
TW366475B (en) | 1999-08-11 |
WO1999018472A1 (en) | 1999-04-15 |
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