IL105737A0 - Process for the comparison of data flows and apparatus for performing the same - Google Patents

Process for the comparison of data flows and apparatus for performing the same

Info

Publication number
IL105737A0
IL105737A0 IL105737A IL10573793A IL105737A0 IL 105737 A0 IL105737 A0 IL 105737A0 IL 105737 A IL105737 A IL 105737A IL 10573793 A IL10573793 A IL 10573793A IL 105737 A0 IL105737 A0 IL 105737A0
Authority
IL
Israel
Prior art keywords
comparison
same
data flows
flows
data
Prior art date
Application number
IL105737A
Original Assignee
Commissariat Energie Atomique
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat Energie Atomique filed Critical Commissariat Energie Atomique
Publication of IL105737A0 publication Critical patent/IL105737A0/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/30—Determination of transform parameters for the alignment of images, i.e. image registration
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30148—Semiconductor; IC; Wafer
IL105737A 1992-06-03 1993-05-18 Process for the comparison of data flows and apparatus for performing the same IL105737A0 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9206711A FR2692059A1 (en) 1992-06-03 1992-06-03 Method for comparing data streams and implementation device

Publications (1)

Publication Number Publication Date
IL105737A0 true IL105737A0 (en) 1993-12-28

Family

ID=9430390

Family Applications (1)

Application Number Title Priority Date Filing Date
IL105737A IL105737A0 (en) 1992-06-03 1993-05-18 Process for the comparison of data flows and apparatus for performing the same

Country Status (3)

Country Link
EP (1) EP0573345A1 (en)
FR (1) FR2692059A1 (en)
IL (1) IL105737A0 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19705600A1 (en) * 1997-02-14 1998-08-20 Philips Patentverwaltung Spatial transformation determination method for X-ray imaging
WO2001055697A1 (en) * 2000-01-26 2001-08-02 Inspace Limited Algorithms for use in a hand-held spectrophotometric apparatus
CN112561849B (en) * 2019-09-26 2023-07-21 长鑫存储技术有限公司 Wafer defect detection method

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4579455A (en) * 1983-05-09 1986-04-01 Kla Instruments Corporation Photomask inspection apparatus and method with improved defect detection
JPH0623999B2 (en) * 1986-07-28 1994-03-30 株式会社日立製作所 Pattern defect detection method

Also Published As

Publication number Publication date
EP0573345A1 (en) 1993-12-08
FR2692059A1 (en) 1993-12-10

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