IE20020709U1 - Method for optimising non-linear laser control effects - Google Patents
Method for optimising non-linear laser control effectsInfo
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- IE20020709U1 IE20020709U1 IE2002/0709A IE20020709A IE20020709U1 IE 20020709 U1 IE20020709 U1 IE 20020709U1 IE 2002/0709 A IE2002/0709 A IE 2002/0709A IE 20020709 A IE20020709 A IE 20020709A IE 20020709 U1 IE20020709 U1 IE 20020709U1
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Abstract
ABSTRACT The invention provides a method and system for compensating variations in tuning efficiency and power of a mu1ti—section tunable laser diode. The invention comprises a means to obtain a set of values for a specific section of the laser diode and a means to normalise the values to compensate the non—linearities in the set of values, hence compensating for variations in the tuning efficiency for that particular section of the laser diode. The invention is advantageous in that it is generic and can be applied to several different types of lasers. A further advantage of the invention is that the mode width can be determined as well as determining the mode modulation of the tunable laser.
Description
Title
Method for optimising nonélinear laser control effects.
Field of the Invention
The invention relates to tuneable lasers, particularly to a
multi section laser diode that can be switched between
different wavelengths or frequencies and more particularly
to a method adapted to compensate for variations in tuning
efficiency and power of a laser.
Background to the Invention
Multi section laser diodes are well known in the art and
can be switched between different wavelengths. Typically
the diode is calibrated at manufacture to determine the
correct control currents that should be applied to the
laser so as to effect the desired output frequencies from
the laser.
One of the first known multi—section laser diodes is a
three—section tuneable distributed Bragg reflector (DBR)
laser. Other types of multi-section diode lasers are the
sampled grating DBR (SG—DBR),
DBR (SSG-DBR)
the superstructure sampled
and the grating assisted coupler with rear
sampled or superstructure grating reflector (GCSR). A
review of such lasers is given in Jens Buus, Markus
“Tuneable Laser Diodes” Artect House, 1998
and “Widely Tuneable Semiconductor Lasers” ECOC’00. Beck
Mason.
Figure 1 is a schematic drawing of a DBR 10. The laser
comprises of a Bragg reflector sections 2 with a gain or
active section 6 and phase section 4. An anti—reflection
coating 9 is sometimes provided on the front and/or rear
facets of the chip to avoid facet modes. The Bragg
reflector take the form of Bragg gratings 5. The pitch of
the gratings of the Bragg reflector vary slightly to
provide a Bragg mode which moves in frequency through
varying the current supplied to these sections. The optical
path length of the cavity can also be tuned with the phase
section, for example by refractive index changes induced by
varying the carrier density in this section. A more
detailed description of the DBR and other tuneable multi-
section diode lasers can be found elsewhere Jens Buus,
Markus Christian Amann, “Tuneable Laser Diodes” Artect
House, 1998.
As detailed above such tunable semiconductor lasers contain
sections where current is injected to control the output
of the
frequency, mode purity and power characteristics
device. Various applications in telecommunications/sensor
fields require that the laser can operate at points in a
predetermined frequency/wavelength grid; moreover many
applications require the power output of the device to be
within a defined tolerance for each operating point, and in
general, the operating points must be distanced from mode
jumps and have high side—mode suppression. In order to
provide lasers for such applications, each individual
device must be characterised to the desired specification,
so there is a corresponding need for a system or algorithm
to map the output of the laser over a range of operating
currents. For characterisation of lasers in production
environments, such a system must also be fast, reliable and
automated.
The rate of change of the output frequency of the tunable
laser for a given change in current is called the tuning
efficiency of the laser. This parameter has the
characteristic that it is not constant and tends to
saturate at higher input currents. This variation can be
|Ell20709
quite considerable (greater than an order of magnitude)
across the tuning" range of the device. A consequence of
this variation in tuning efficiency is that mode jumps in
the tuning of the
space laser may not be distributed
linearly with drive current, which can cause problems for a
find the
operating points of the laser with high mode purity.
calibration algorithm that is attempting to
A direct and accurate approach to measuring the tuning
efficiency of a device (or to map the frequency output of
the device) is to increment the section current(s) with
which frequency changes and to accurately measure the
frequency at each point. A drawback of this approach, as
described in “Fast Accurate Characterisation of a GCSR
laser over the complete EDFA Band” Tom Farrell et al.
LEOS’99 November, San Francisco, is that for certain device
types, the tuning efficiency at low coarse tuning section
current is very high, forcing a particularly low step size
for this section. For example in the DBR (Distributed Bragg
Reflector) laser, the tuning efficiency will be very high
at low DBR passive section current. To apply this low step
size over the entire operational range of the DBR section
is time consuming. In production environments this approach
is generally too inefficient to be commercially viable.
Another drawback of using a single step size over the
operational range of the section current is that, since the
data measured is varying non-linearly, a characterisation
algorithm searching for features in the data (such as the
mode boundaries) must find a means of coping with this non-
linear variation.
It is known that the output power of a device will fall off
as the current in the passive sections is increased. Thus
lE020?09
for measurements taken at fixed gain section current, the
operating points may not fall within the required range of
specified power outputs. Thus combining a series of
measurements at different fixed gain currents, where the
passive section currents are ramped as before, may be
needed to produce the final set of operating points
satisfying all the power, frequency and mode purity (SMSR)
requirements. This of course adds extra time and analysis
to the process, again an important issue in assessing the
viability of a method for use in production environments.
There is therefore a need to provide a method that enables
a compensation in the variation in tuning efficiency and
power of the laser diode to be effected.
Object of the Invention
It is an object of the present invention to provide a
method for efficiently compensating for variation in tuning
efficiency and power of a laser diode.
Summary of the Invention
Accordingly the present invention provides a method of
compensating for variation in tuning efficiency and power
of a multi—section tuneable laser diode. The methodology
and technique of the present invention is advantageous in
that it is generic and can be applied to several types of
tuneable lasers such as DBR, SG-DBR, SSG—DBR, GCSR etc..
In a preferred embodiment the invention provides a
method of normalising the output values of a laser diode,
the comprising the steps of varying the control currents
for a specific section of a laser diode device over a range
of values in a first sample index so as to obtain a set of
output values for that section of the laser diode,
|Efl20709
normalise the set of output values, such that the
normalisation of the output values compensates for non-
limearities in the output values by effecting a change in
rdlationship between the control currents and the sample
index.
The output values are desirably representative of power or
frequency.
The method may be further used to obtain sets of normalised
values for one or more further sections of the laser.
The normalisation is desirably effected by a transform
applied to the sample index, the application of the
transform changing the control currents and the output
values. The transform is typically a non-linear transform.
The generated transform may be subsequently used to effect
the generation of a further set of output values for
multiple combinations of control currents or sections for
the laser device, the generated set having being normalised
due to the utilisation of the transform.
In one embodiment, the normalisation of the output values
is effected using the current of the mode jumps.
The mode jumps are typically detected by a power
measurement, and are more typically detected by an
observation of discontinuities in a power measurement.
In an alternative embodiment the mode jumps are detected by
a frequency measurement, and in such an embodiment are
typically represented by a step in a frequency measurement.
lE0207.09
The application of the transform may be used to effect an
equalisation of mode width.
The method may be further used to determine deviations in
mode width, thereby providing indications of the integrity
of the laser device.
The normalisation may be effected using a relative loss of
that section as a function of control current. The gain
current of the laser device can be altered using said
normalisation.
The normalisation of output values may be used to provide
for a determination of location of modes.
The method may include the further step of determining
suitable operating points, the operating points being
selectable on the basis of a determination of a mid—point
in frequency values for a specific mode. The operating
point is typically at the mean frequency for that mode and
benefits from maximum side mode suppression.
The modes are desirably locatable by effecting a
differentiating of the normalised values.
The invention also provides for a method of determining a
mode width for a laser diode device, comprising the steps
of: determining the location of the modes, extracting from
the determined mode locations, the mode width in control
current as a function of a control current for all modes
and all currents so as to provide for a relationship
between the mode width of the laser and a control current
for that laser, and converting the control current to
frequency for the device so as to provide a relationship
between mode width and frequency.
|E020In9
The inventions also provides for a method of obtaining the
mode modulation of laser diode, the method comprising steps
ofobtaining tuning characteristics of a tunable laser and
measuring a set of samples where this data has been
normalised out, detecting mode jumps of the laser,
measuring the mode width of the laser and plotting this
value against a predetermined combination of the control
currents where this mode is present which can in turn be
converted to output frequency of the tunable laser,
andconverting the mode width to a percentage deviation of
average mode width of the laser
These and other features of the present invention will be
better understood with reference to the following drawings.
Brief Description of the Drawings
Figure l is a schematic drawing of a known laser diode,
Figure 2 is a schematic showing a conventional wavelength
measuring apparatus,
Figure 2a shows the output power of a device at uniform
current intervals in the direction that the tuning
efficient variations are to be suppressed,
Figure 2b shows the output power range of Figure 2a, but
with the effects of the tuning efficiency variation
suppressed,
Figure 3 shows a high-resolution power line as taken along
a full range of DBR passive current sections and at a
constant phase current and also indicates the position of
mode jumps,
Figure 4 is a graphical representation of a polynomial
correction tuning efficiency approximation, according to
the present invention
Figure 5 is a graphical representation of polynomial scaled
to a desired sample and current range according to the
present invention
|E0207fl9
Figure 6 is an example of a linear power plane,
Figure 7 is an example of a non—linear power plane over the
same range of values as Figure 6, as provided by the
methodology of the present invention,
Figure 8 is a plot of mode width verses bragg current for a
laser diode device with mode modulation,
Figure 9 is a plot of mode width variation verses frequency
for a laser with mode modulation,
Figure 10 is a normalised version of the plot of Figure 9
with the % mode width variation converted to frequency
modulation,
Figure 11 is an intensity map of power vs two control
currents of a tunable laser mapped onto a Power vs. Total
control current map,Figure 12 shows a plurality of curves
representing the loss of the front and back gain currents
for a plurality of different gain currents, and
Figure 13 is a plot of gain current verses front and back
current showing the required ratio between the parameters
required to effect a desired power level for the device
Detailed Description of the Drawings
The present invention provides a method of compensating for
inefficiencies in tuning and power of a laser diode,
specifically a multi—section tuneable laser diode. The
technique is generic and can be applied to several types of
tuneable lasers such as DBR, SG—DBR, SSG—DBR, GCSR etc.,
although for ease of explanation it will now be described
with reference to application to a DBR tuneable laser. It
will be appreciated by those skilled in the art that this
illustration is exemplary of the methodology of the present
invention and it is not intended to limit the application
to any one specific laser diode type.
|E02U709
The techniques used by the method of the present invention
enable the formation of a set of output values, typically a
power or frequency plane, which will be understood to be a
series of power or frequency measurements at section
current combinations within a specified range.
Using the technique of the present invention it is possible
to provide for a more evenly spaced distribution of modes
in the resultant data set which is advantageous in that it
enables simpler and more effective analysis techniques. The
method of the present invention also provides for a
reduction in the size of the data set that requires
analysis, thereby providing a more time and processing
efficient system.
The methodology of the present invention will now be
described with reference to a three section DBR type laser
device.
Firstly, a method to obtain the characteristics,
preferably the tuning efficiency as provided by the
frequency or power output, of the laser according to the
present invention will be described. Using the resultant
data set,
use this data and measure the characteristics of the laser
while cancelling out the tuning efficiency variation and
the power loss due to increasing currents in the passive
sections. An exemplary application of the technique will
then be described with reference to a specific device
l. Automated Approximation of Laser Tuning Efficiency;
As detailed above. the present invention provides a
methodology to determine a function to approximately map
the tuning efficiency of the laser. It should be noted that
according to the present invention, the tuning efficiency
function is only required to determine a suitable set of
sample to section current mappings; consequently the tuning
the invention then provides for a technique to.
|E020'7efficiency itself is not required to any great accuracy,
but it will be appreciated can be obtained accurately from
measurements described in this patent, and moreover
measurements over a subset of the current space of the
tunable laser are sufficient. This it will be appreciated
provides for a time—efficient technique. For example,
within a DBR laser, this subset would span the range of the
DBR passive section current only, with the phase section
current set at a constant value.
Although the present invention is not intended to be
limited to any one specific theory or methodology it will
for purpose of discussion be assumed that all that is
needed to form a reasonably accurate approximation to the
tuning efficiency of any device is the location of each
mode jump of interest and the further assumption that
frequency change across each jump is approximately uniform.
To obtain each mode jump, a straight line is defined across
passive section current space, which may be a function of
one or more section currents. A series of power
measurements is obtained along this function over small
increments in current. The data is then discretely linearly
filtered and thresholded to extract each mode jump.
This information, combined with the assumption that the
frequency change across each mode jump is uniform, enables
the mapping of approximately uniform steps in frequency to
non—uniform steps in section current. If one has access to
frequency data, however, or to a measure that varies in
proportion with the frequency across the subset of section
currents of interest, this may be utilised to form an
equivalent mapping. As a result, it will be appreciated
that the extraction of mode jump locations may not always
be required.
|ED207fl9
Each set of discrete mappings or transforms is plotted for
each contributing passive section. Since each plot consists
of discrete value mappings, one may choose to either
define a
fits
interpolate between defined mappings or to
continuous function, which, in a least squares sense,
the defined mappings optimally. The user may then specify
the subsection of currents which are of interest and the
amount of power plane samples which are desired within that
region. Each passive section function can then be scaled
accordingly, and the resulting mappings used to define
locations in section current which correspond to each power
plane sample. The resulting power plane is then
predominantly free of the effects due to tuning efficiency
variation.
. Use of Non—Linear Power Planes:
This method has been developed as the first step in a
tunable laser calibration system, and is specifically
adapted to compensate for the variations on output power of
the device due to increasing losses in the passive sections
which is cause by increasing the control currents of the
laser so as to provide for the modes jumps to be
represented by similar jumps in output power of the device,
and thus more easily determined. The system calibrates each
device based upon power/frequency measurements obtained at
section current combinations within a pre-defined range of
currents. It will be appreciated that the system and
methodology is not device specific, although, as stated
above, the straight line over which mode frequency changes
occur will vary in terms of the section currents from
device to device It will be understood therefore that for
some devices, for example a SG—DBR type laser, non—linear
power sampling may be required across more than one section
current. In figure 14 a power plane for an SG—DBR laser is
shown. A supermode is selected and the centre of regions
'E02u7o9
where the output power has no mode jumps is selected and
these points are denoted by dots. If as for a DBR laser the
current at which these points occur is plotted against the
mode index the graphs Figure 15 and Figure 16 are obtained
for the Front and the Back sections of the laser. These
represent the tuning rates of these sections and can be
used in a similar way to that shown for the DBR laser.
It should be noted that a similar method can be used for a
phase section of a laser also by plotting the position of a
mode as a function of phase current and using a non—linear
sampling rate to cancel any non—linear tuning of the phase
section when measuring multiple planes.
Benefits of Removing the Effects of Tuning Efficiency
Variations: The main benefit of removing the effects of
tuning efficiency variations across the device, is to
maximise the efficiency of a subsequent calibration
algorithm with regard to the fact that each mode is
represented by a uniform amount of points in the power
plane, and that number is set as low as possible without
compromising accuracy, i.e. that no mode is represented by
too many or too few points. The advantage of the technique
of the present invention is evident from a comparison of
Figures 2a and 2b.
Fig. 2a displays the output power of a device at uniform
current intervals in the direction that tuning efficiency
variations are to be suppressed (linear power line). Fig.
2b displays the output power across the same range, but
with the effects of tuning efficiency variation suppressed
(i.e. a non-linear power line as provided by the technique
of the present invention). It will be appreciated that a
lEn7n7a9
mode jump should be distinguishable by a discontinuity in
power or frequency. It will be apparent from an inspection
of the two Figures, that there is a large variation in the
distance between mode jumps in the linear line relative to
the non—linear line (Figure 2b). Although both lines
contain the same amount of power samples, it is clear that
there are not enough samples in the linear line to easily
extract important signal characteristics at low currents.
However, the equivalent data in the non—linear power line
is easily extractable.
Another benefit of removing the effects of tuning
efficiency variations across the device is that each point
midway between two mode jumps (an instance of which is
marked as the vertical line X—X in Fig. 2b) will also be
the centre of its tuning range. This means that the point
will be at the mean frequency for that mode, and will
benefit from maximum side mode suppression. This makes it
an ideal choice as the operating point for that mode.
Measuring Frequency Modulation of a Laser using Mode Widths
As described previously the mode width (in current) at
relative tuning currents in the laser describes the
relationship between tuning rate and current(GHz/mA). It
will be appreciated that the Mode Width is proportional to
tuning rate vs. tuning current, which can be understood in
terms of the Bragg current as meaning that the width of the
mode in Bragg current is the relative size of the
reflection peak that is causing the laser to operate at
this frequency relative to the adjacent modes of lasing of
the laser.
Using this relationship it is possible to obtain a plot of
mode modulation of the laser. Mode modulation is caused by
IE02n7u9
extra Fabry Perot cavities existing in the laser and is
normally due to an undesirable reflection at the interface
between the individual sections of the laser. These
reflections when added to the desired reflections from the
Bragg etc.. cause a modulation in the mode width of the
laser.
The example below is shown for a DBR laser but the same
method can be equally applied to any type of tunable laser.
From a plot of DBR power (where the tuning currents have
been normalised out, such as that shown in Figure 7) a plot
of the mode jumps of the laser can be obtained by using
differentiation and a threshold to obtain where steps in
power occur. These steps in power represent the mode jumps
of the laser and are shown in Figure 17
From this plot (Figure l7),
if the mode jump width (in
Bragg Current) is extracted as a function of Bragg current
(where Bragg Current is the current in the middle of the
mode where each mode width is measured) for all modes and
all phase currents and a plot,
such as that shown in Figure
is obtainable which provides for a graphical
representation of the mode width of the laser vs.
Bragg
Current. As can be seen from the graph of Figure 8, this is
a very uniform result and shows that the mode modulation is
dependent directly on the Bragg current of the laser. This
can be related directly to Frequency by converting Bragg
current to Frequency with the aid of a plot of the tuning
rate of the Bragg Section. Such a plot is shown in Figure 9
and can be obtained by some wavelength measurements such as
a wavelength meter or equivalent or, as previously
described by obtaining a plot of mode position vs Bragg
current and sampling some frequencies either using a
wavelength meter or using the setup as in Figure 2.
lE0207n9
The plot of Frequency vs. Bragg is true for any points on
all lines in—between each adjacent mode jump. As the laser
has mode jumps the tuning away from each of these lines
will be slightly different and a factor is required which
is the relative frequency tuning range of a single mode of
the laser for a fixed phase current. These values change
from device to device but an exemplary DBR laser device may
have values of the order of l2GHz and the cavity mode jump
is 7OGHz. Therefore, the factor we require is 12/70. If we
multiply the frequency variation plot from above by this
factor the frequency modulation of the device is obtained
versus the absolute frequency of the laser. This is a
relative value and shows deviations from the ideal uniform
performance of the laser.
In Figure 10 the mode modulation is caused by a reflection
between the gain section and the phase section of the laser
and the period of modulation is approximately l25GHz. This
corresponds to a cavity length in the device of approx 340
pm which is as expected.
This measurement is a very good detector of internal
reflection in the tunable laser and can be obtained from a
simple power plane of a tunable laser. This measurement is
fast and can be used in the characterisation of tunable
lasers in a production environment. As the result obtained
can be easily thresholded to detect when the internal
reflections are too large the device will not meet the
required specification it is ideal for Pass/ Fail criterion
required in an automated production system.
Measuring Power Loss Due to Increasing Currents in the
Passive Sections:
lEn2n7n9
All tunable devices suffer power loss due to increasing
currents in the passive sections. An objective of device
calibration is to not only obtain operating points at pre-
defined frequencies within the device band, but to ensure
those points are of a certain output power level. Based
upon an assumed relationship between power loss and passive
section currents, the input gain current may be increased
in such a way as to counter the loss.
The example below is for an SG—DBR laser but applies
equally for a DBR laser, GCSR, SSG—DBR and other multi-
section tunable lasers.
If a coarse measurement of output power is measured on an
SG—DBR laser and the output power is plotted against front
current plus back current then a graph such as that in
figure 11 is obtained.
This shows how the output power of the device varies as a
function of the passive current (excluding the phase
current). If this plot is curve fitted to obtain the median
output power (or some such other method is used such as
averaging as shown in the figure 12) a curve which
represents the loss of the front and back sections is
obtained. If this is repeated for different gain currents a
set of these curves can be obtained as in figure 12.
It is possible then, using this information, to select the
output power required to operate the laser. This selected
power will cut or bisect several of the curves obtained at
each gain current in Figure 12. By plotting the gain
current value from each curve against the front and back
current value, Front and back
a plot of gain current vs.
current is obtained for the required output power value as
IEu2n7n9
shown in Figure 13. This plot enables determination of the
ratio between front and back current verses the gain
current required to obtain the required power level. This
can be fitted with a linear or higher order polynomial or
such method to get the relationship and a power plane can
be re—measured where the gain current at each point on the
plane is adjusted according to this relationship. This
results in a power plane which will typically have 2dB of
power variation as opposed to the 6dB for the case where
the gain current is kept constant.
Using this technique to reduce the output power variation
of a tunable laser measurement plane enable power
equalisation to be obtained in a much easier fashion as a
large part of the power variation has already been
compensated for. Also this allows easier detection of
changes in the power level which denote mode jumps of the
laser. As the power variation is reduced the variation in
these jumps of power will be similar in size and allow
easier detection.
. Example:
The techniques of the present invention described above
will now be described with reference to an example of
tuning efficiency approximation for a DBR tunable device.
As was shown in Figure 1, this is a three section device,
with two passive sections, phase and DBR, and an active
section, gain. In this particular type of device, mode
jumps tend to occur with increasing DBR passive section
current. Hence, a high—resolution power line was taken
along the full range of DBR current and at a constant phase
(Fig. 3),
identified.
current and the location of mode jumps
lE0207
As shown in Figure 4, this data may be used to plot a DBR
current versus frequency index relationship (each unit
increase in value represents a uniform jump in frequency).
A 2“ order polynomial function was then fitted to this
data, bound by its upper and lower limits. Both the
original data and the fitted polynomial function are shown
in Fig. 4. The fitted function for the specific data set
illustrated is defined below:
f(x)=(l1123x2-t0x+41O366, (1)
where x is the frequency index of the data. This it will be
appreciated is a standard quadratic polynomial which maps
uniform steps in frequency to non-uniform steps in section
current across the full range of the device. In order to
perform a full characterisation of the device, a subset of
this entire range, i.e. a region of specific interest in
both passive sections is then specified, along with a
desired power plane size: i.e. how many data points are
required for a specific range of currents. This range may
be specified in terms of the maximum and minimum currents (
Ihmh and Ikm). Using a specific example of utilising 300
power samples on the DBR passive section in the range
between 0.99 and 45.09 mA inclusive, it is possible to
transform the fitted function, defined by equation (1) into
a sample index to section current value mapping, based upon
this specified data. The function transformation is defined
below (equation (2)), and it will be appreciated that the
present invention is not intended to be limited to any
specific values or polynomial function. It will be further
noted that f '1(I1o,,) is x at f(x) = 110,, and that the
equivalent stands for f *(Ihnm) (see Fig. 3 for the mapping
between each x value and Imw & Immfi.
where: a - X2 coefficient in f(x).
b — x coefficient in f(x).
c offset in f(x).
Ihw = the lower threshold of the passive section
current region of interest.
Ihfim = the upper threshold of the passive section
current region of interest.
m = f _1(Ihigh) — f ‘1.
k = No. of sample periods across mapping range.
s is the sample index.
Substituting the values specific to this example for the
above, yields the polynomial defined in Equation (3)
below, and plotted in Fig. 5:
f(s) = 0.0003732 + 0.03741s + 0.9872 ( 3 )
The solving of this polynomial maps each of 300 sample
points to a section current within the specified range,
based upon the original mapping function, f(x) (equation
1). Since tuning efficiency does not vary significantly
with phase section current, the mapping between sample
index and section current remained linear, and hence a
uniform step size was used between power samples. It is now
possible to utilise the sample index to current mappings
for each passive section in the measurement of a power
plane.
Shown in Figs. 6 and 7 is a comparison between a 300 x 300
linear power plane over the range of DBR currents described
by the function of equation (3) and shown in Fig 5, and a
non~linear plane over the same range of currents. The plane
lE02u7a9
of Figure 6 is formed using conventional techniques such as
those described in “Fast Accurate Characterisation of a
GCSR laser over the complete EDFE Band” Tom Farrell et al.
LEOS’99 November, San Francisco, whereas that of Figure 7
is formed using the technique of the present invention. The
relative uniformity of the width of each mode in the non-
linear plane (Figure 7) is apparent especially when
compared to the linear plane (Figure 6).
It will be appreciated that the specific example utilising
a DBR type laser device enables the power plane
characterising the device to be effected on a single
measurement set. In application of the technique to other
laser types it will be appreciated that several
measurements may be required to fully characterise the
device. For example using a SG-DBR device it is necessary
to measure the output power vs. all of the coarse tuning
currents, and for a 4—section SG-DBR laser this results in
a plane. These measurements are repeated as a function of
any other tuning sections that the device may have. For
example with an SG-DBR laser several planes are measured of
Front grating vs. Back grating against phase current.
It will be appreciated by those skilled in the art that
although the example of the present invention has been
described with reference to specific mathematical equations
and techniques that many alternative techniques may be
utilised to obtain the same effect or implementation as
that provided by the specific example herein illustrated.
It will be understood that the present invention provides
for a method that compensates for tuning efficiency in a
laser diode device. By providing a technique that enables a
different sampling rate to be applied in different regions
of interest in the power plane of the device.
lEu207n9
It will be appreciated that the present invention provides
for the provision of a graph of the relative tuning rates
of a section of a multi-section tunable laser by finding
the relative positions of modes in the laser. According to
the present invention the mode widths can be used to get
mode modulation of a tunable laser. By effecting a change
in the gain current while measuring a power plane for a
laser is it possible, according to the present invention to
compensate for power variation due to absorption in the
passive sections of the laser. The present invention
additionally provides for the measurement of a plane which
is adapted takes all of the above into account and
compensates for the resulting in a measurement plane where
either the relative size of modes is constant or the power
jumps due to mode jumps are equalised.
The words “comprises/comprising” and the words
“having/including” when used herein with reference to the
present invention are used to specify the presence of
stated features, integers, steps or components but does not
preclude the presence or addition of one or more other
features, components or groups thereof.
integers, steps,
Claims (20)
1) A method of normalising the output values of a laser diode, the method comprising the steps of: a) varying the control currents for a specific section of a laser diode device over a range of values in a first sample index so as to obtain a set of output values for that section of the laser diode, b) normalise the set of output values, and wherein the normalisation of the output values compensates for non—linearities in the output values by effecting a change in relationship between the control currents and the sample index.
2) The method as claimed in claim 1 wherein the output values are representative of power or frequency.
3) The method as claimed in claim 1 or 2 further comprising the step of obtaining a set of normalised values for one or more further sections of the laser.
4) The method as claimed in claim 1 wherein the normalisation is effected by a transform applied to sample index, thereby changing the control currents and the output values.
5) The method as claimed in claim 4 wherein the transform is a non—linear transform.
6) The method as claimed in claim 4 or 5 wherein the generated transform is subsequently used to effect the further generation of a set of output values for multiple combinations of control currents or sections for the laser device, the generated set having being normalised due to the utilisation of the transform.
7) The method as claimed in claim 1 wherein the normalisation of the output values is effected using the current of the mode jumps.
8) The method as claimed in claim 7 wherein mode jumps are detected by a power measurement.
9) The method as claimed in claim 8 wherein the mode jumps are represented by discontinuities in a power measurement.
10) The method as claimed in claim 7 wherein mode jumps are detected by a frequency measurement.
11) The method as claimed in claim 8 wherein the mode jumps are represented by a step in a frequency measurement.
12) The method as claimed in claim 4 wherein the application of the transform effects an equalisation of mode width.
13) The method as claimed in claim 12 further comprising the step of determining deviations in mode width, thereby providing indications of the integrity of the laser device.
14) The method as claimed in claim 1 wherein the normalisation is effected using a relative loss of that section as a function of control current.
15) The method as claimed in claim 14 wherein the gain current of the laser device can be altered using said normalisation.
16) The method as claimed in claim 1 wherein the normalisation output values provides for a determination of location of modes.
17) The method as claimed in claim 16 further comprising the step of determining suitable operating points, the operating points being selectable on the basis of a determination of a mid—point in frequency values for a specific mode.
18) The method as claimed in claim 17 wherein the operating point is at the mean frequency for that mode and benefits from maximum side mode suppression.
19) The method as claimed in claim 16 wherein the mode are locatable by effecting a differentiating of the normalised values.
20) A method of determining a mode width for a laser diode device, the method comprising the steps of: a) determining the location of the modes, b) extracting from the determined mode locations, the mode width in control current as a function of a control current for all modes and all currents so as to provide for a relationship between the mode width of the laser and a control current for that laser, and c) converting the control current to frequency for the device so as to provide a relationship between mode width and frequency. TOMKINS & CO
Publications (2)
Publication Number | Publication Date |
---|---|
IE20020709U1 true IE20020709U1 (en) | 2004-03-10 |
IES83422Y1 IES83422Y1 (en) | 2004-05-05 |
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