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Priority claimed from EP01101778.7Aexternal-prioritypatent/EP1191310B1/en
Application filed by Techem Service AgfiledCriticalTechem Service Ag
Publication of HU0103477D0publicationCriticalpatent/HU0103477D0/en
Publication of HUP0103477A2publicationCriticalpatent/HUP0103477A2/en
Publication of HUP0103477A3publicationCriticalpatent/HUP0103477A3/en
Method and apparatus for generating part programs for use in image-measuring instruments, and image-measuring instrument and method of displaying measured