HK194696A - Device and method for charging an adapter for a printed circuit board testing device - Google Patents

Device and method for charging an adapter for a printed circuit board testing device

Info

Publication number
HK194696A
HK194696A HK194696A HK194696A HK194696A HK 194696 A HK194696 A HK 194696A HK 194696 A HK194696 A HK 194696A HK 194696 A HK194696 A HK 194696A HK 194696 A HK194696 A HK 194696A
Authority
HK
Hong Kong
Prior art keywords
adapter
charging
circuit board
printed circuit
board testing
Prior art date
Application number
HK194696A
Other languages
English (en)
Inventor
Martin Maelzer
Hans-Hermann Higgen
Ruediger Dehmel
Heimo Gladik
Original Assignee
Luther & Maelzer Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Luther & Maelzer Gmbh filed Critical Luther & Maelzer Gmbh
Publication of HK194696A publication Critical patent/HK194696A/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00Metal working
    • Y10T29/49Method of mechanical manufacture
    • Y10T29/49002Electrical device making
    • Y10T29/49117Conductor or circuit manufacturing
    • Y10T29/49124On flat or curved insulated base, e.g., printed circuit, etc.
    • Y10T29/49147Assembling terminal to base
    • Y10T29/49151Assembling terminal to base by deforming or shaping
    • Y10T29/49153Assembling terminal to base by deforming or shaping with shaping or forcing terminal into base aperture
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00Metal working
    • Y10T29/53Means to assemble or disassemble
    • Y10T29/5313Means to assemble electrical device
    • Y10T29/53174Means to fasten electrical component to wiring board, base, or substrate
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00Metal working
    • Y10T29/53Means to assemble or disassemble
    • Y10T29/5313Means to assemble electrical device
    • Y10T29/53261Means to align and advance work part

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Specific Conveyance Elements (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Branching, Merging, And Special Transfer Between Conveyors (AREA)
HK194696A 1990-02-16 1996-10-24 Device and method for charging an adapter for a printed circuit board testing device HK194696A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE4004933 1990-02-16
DE4035978A DE4035978A1 (de) 1990-02-16 1990-11-12 Verfahren und vorrichtung zum laden eines adapters fuer ein leiterplattenpruefgeraet

Publications (1)

Publication Number Publication Date
HK194696A true HK194696A (en) 1996-11-01

Family

ID=25890228

Family Applications (1)

Application Number Title Priority Date Filing Date
HK194696A HK194696A (en) 1990-02-16 1996-10-24 Device and method for charging an adapter for a printed circuit board testing device

Country Status (6)

Country Link
US (2) US5285149A (fr)
EP (1) EP0442149B1 (fr)
JP (1) JP3185107B2 (fr)
DE (2) DE4035978A1 (fr)
HK (1) HK194696A (fr)
WO (1) WO1991012532A2 (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5307560A (en) * 1992-07-30 1994-05-03 Allen Aksu Automated test pin loading method
US5744948A (en) * 1995-08-15 1998-04-28 Everett Charles Technologies, Inc. Printed circuit board handling device
US5823737A (en) * 1995-10-31 1998-10-20 Lucent Technologies Probemat handler
US7100273B2 (en) * 2003-03-03 2006-09-05 Hewlett-Packard Development Company, L.P. Interconnect validation instruments
DE102009016181A1 (de) * 2009-04-03 2010-10-14 Atg Luther & Maelzer Gmbh Kontaktierungseinheit für eine Testvorrichtung zum Testen von Leiterplatten
US9062968B2 (en) * 2013-07-23 2015-06-23 Avago Technologies General Ip (Singapore) Pte. Ltd. PCB loading apparatus for measuring thickness of printed circuit board stack
CN116534582B (zh) * 2023-05-09 2024-04-02 惠州市泰升电子有限公司 一种线路板自动化生产移载设备

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5537879B2 (fr) * 1973-10-15 1980-09-30
US4423376A (en) * 1981-03-20 1983-12-27 International Business Machines Corporation Contact probe assembly having rotatable contacting probe elements
US4788496A (en) * 1982-11-05 1988-11-29 Martin Maelzer Adapter for a printed circuit board testing device
US4535536A (en) * 1983-11-03 1985-08-20 Augat Inc. Method of assembling adaptor for automatic testing equipment
ATE45427T1 (de) * 1983-11-07 1989-08-15 Martin Maelzer Adapter fuer ein leiterplattenpruefgeraet.
US4749943A (en) * 1984-06-11 1988-06-07 Thomas Black Automatic test system
US4774462A (en) * 1984-06-11 1988-09-27 Black Thomas J Automatic test system
DE3606877A1 (de) * 1986-03-03 1987-09-10 Siemens Ag Vorrichtung zum bestuecken eines adapters mit kontaktnadeln fuer eine leiterplatten-pruefeinrichtung
EP0315707B1 (fr) * 1987-11-09 1992-04-22 MANIA GmbH & Co. Adaptateur pour un dispositif pour l'essai électronique de cartes de circuits imprimés

Also Published As

Publication number Publication date
US5285149A (en) 1994-02-08
DE4035978A1 (de) 1991-08-22
DE59008596D1 (de) 1995-04-06
JPH06504611A (ja) 1994-05-26
WO1991012532A2 (fr) 1991-08-22
WO1991012532A3 (fr) 1992-08-20
US5357671A (en) 1994-10-25
EP0442149B1 (fr) 1995-03-01
JP3185107B2 (ja) 2001-07-09
EP0442149A1 (fr) 1991-08-21

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)