HK1202152A1 - 用於對發光器件進行特徵分析的方法和系統 - Google Patents

用於對發光器件進行特徵分析的方法和系統

Info

Publication number
HK1202152A1
HK1202152A1 HK15102565.4A HK15102565A HK1202152A1 HK 1202152 A1 HK1202152 A1 HK 1202152A1 HK 15102565 A HK15102565 A HK 15102565A HK 1202152 A1 HK1202152 A1 HK 1202152A1
Authority
HK
Hong Kong
Prior art keywords
light emitting
emitting devices
characterizing light
characterizing
devices
Prior art date
Application number
HK15102565.4A
Other languages
English (en)
Inventor
Daniel C Morrow
Dummer Jonathan
Dodds Stanley Curtis
Original Assignee
Sof Tek Integrators Inc Dba Op Test
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sof Tek Integrators Inc Dba Op Test filed Critical Sof Tek Integrators Inc Dba Op Test
Publication of HK1202152A1 publication Critical patent/HK1202152A1/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9501—Semiconductor wafers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4247—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
    • G01J2001/4252—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources for testing LED's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J3/501—Colorimeters using spectrally-selective light sources, e.g. LEDs
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J3/505—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors measuring the colour produced by lighting fixtures other than screens, monitors, displays or CRTs
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Mathematical Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Led Devices (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Led Device Packages (AREA)
HK15102565.4A 2013-03-13 2015-03-13 用於對發光器件進行特徵分析的方法和系統 HK1202152A1 (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201361780294P 2013-03-13 2013-03-13
US14/204,113 US9551669B2 (en) 2013-03-13 2014-03-11 Method and system for characterizing light emitting devices

Publications (1)

Publication Number Publication Date
HK1202152A1 true HK1202152A1 (zh) 2015-09-18

Family

ID=51525922

Family Applications (1)

Application Number Title Priority Date Filing Date
HK15102565.4A HK1202152A1 (zh) 2013-03-13 2015-03-13 用於對發光器件進行特徵分析的方法和系統

Country Status (3)

Country Link
US (1) US9551669B2 (zh)
HK (1) HK1202152A1 (zh)
TW (1) TWI626431B (zh)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9915775B2 (en) * 2013-08-29 2018-03-13 Soraa, Inc. Circadian-friendly LED light sources
US9410664B2 (en) * 2013-08-29 2016-08-09 Soraa, Inc. Circadian friendly LED light source
US9347824B2 (en) * 2013-11-01 2016-05-24 Kla-Tencor Corporation Light collection optics for measuring flux and spectrum from light-emitting devices
JP6499856B2 (ja) * 2014-12-18 2019-04-10 株式会社Ｓｃｒｅｅｎホールディングス 画像処理装置、画像出力装置及び検査装置
KR20160074861A (ko) * 2014-12-18 2016-06-29 삼성전자주식회사 광 측정 시스템
JP7245721B2 (ja) * 2019-05-31 2023-03-24 株式会社アドバンテスト 試験装置、試験方法およびプログラム
JP7401543B2 (ja) * 2019-07-10 2023-12-19 浜松ホトニクス株式会社 半導体デバイス検査方法及び半導体デバイス検査装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5729343A (en) 1995-11-16 1998-03-17 Nikon Precision Inc. Film thickness measurement apparatus with tilting stage and method of operation
JP3700872B2 (ja) * 1995-12-28 2005-09-28 シャープ株式会社 窒化物系ｉｉｉ−ｖ族化合物半導体装置およびその製造方法
US6303397B1 (en) 1999-04-13 2001-10-16 Agere Systems Guardian Corp. Method for benchmarking thin film measurement tools
US20090236506A1 (en) * 2007-11-20 2009-09-24 Luminus Devices, Inc. Light-emitting device on-wafer test systems and methods
WO2011017182A1 (en) 2009-08-03 2011-02-10 Sof-Tek Integrators, Inc., Dba Op-Test, Inc. System and method of testing high brightness led (hbled)
US9128144B2 (en) * 2010-08-10 2015-09-08 Sof-Tek Integrators, Inc. System and method of quantifying color and intensity of light sources
US8927944B2 (en) 2011-11-14 2015-01-06 Kla-Tencor Corporation High throughput hot testing method and system for high-brightness light-emitting diodes

Also Published As

Publication number Publication date
US20140268152A1 (en) 2014-09-18
US9551669B2 (en) 2017-01-24
TW201447246A (zh) 2014-12-16
TWI626431B (zh) 2018-06-11

Similar Documents

Publication Publication Date Title
GB201709707D0 (en) Lighting apparatus
EP2988158A4 (en) LIGHT EMITTING DEVICE AND LIGHT SOURCE SYSTEM THEREFOR
PL3011608T3 (pl) Urządzenie emitujące światło
EP2954836A4 (en) LIGHT SOURCE DEVICE
HK1204388A1 (zh) 半導體發光裝置及其製造方法
EP2988170A4 (en) LIGHT-EMITTING DEVICE AND ASSOCIATED PROJECTION SYSTEM
EP2961633A4 (en) BLEND REACTIVE LIGHTING DEVICE
HK1216113A1 (zh) 照明器具
EP2952132A4 (en) LIGHT SOURCE DEVICE, PERSON OBSERVATION DEVICE AND LIGHT SOURCE CONTROL METHOD
EP3091585A4 (en) Light-emitting device and method for designing light emitting device
HK1218681A1 (zh) 照明設備及用於管理照明系統的方法
EP2996164A4 (en) LIGHT EMITTING DEVICE
HK1202152A1 (zh) 用於對發光器件進行特徵分析的方法和系統
HK1200638A1 (zh) 控制燈具的方法及其系統
IL244786A0 (en) light source device
EP2953173A4 (en) METHOD AND DEVICE FOR PRODUCING A LIGHT-EMITTING DEVICE
IL259267A (en) Method and system for transmitting light
HK1209948A1 (zh) 光源控制系統及其光源控制的方法
HK1213417A1 (zh) 照明控制系統以及照明控制方法
GB2534698B (en) Illumination system
EP2875278A4 (en) LIGHTING DEVICE AND LIGHT GENERATION METHOD
TWI562428B (en) Organic light emitting device and method for preparing the same
EP2998641A4 (en) LIGHT-EMITTING DEVICE AND STAGE LAMP SYSTEM
SG10201403901SA (en) Systems And Methods For Measuring High-Intensity Light Beams
EP2998640A4 (en) ILLUMINATION DEVICE

Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20230312