HK1178968A1 - 種光掃描散射儀 - Google Patents

種光掃描散射儀

Info

Publication number
HK1178968A1
HK1178968A1 HK13105587.3A HK13105587A HK1178968A1 HK 1178968 A1 HK1178968 A1 HK 1178968A1 HK 13105587 A HK13105587 A HK 13105587A HK 1178968 A1 HK1178968 A1 HK 1178968A1
Authority
HK
Hong Kong
Prior art keywords
light scanning
scattering instrument
scanning scattering
instrument
light
Prior art date
Application number
HK13105587.3A
Other languages
English (en)
Inventor
郭繼華廖然曾楠馬輝何宏輝
Original Assignee
清華大學深圳研究生院 廣東省深圳市南山區
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 清華大學深圳研究生院 廣東省深圳市南山區 filed Critical 清華大學深圳研究生院 廣東省深圳市南山區
Publication of HK1178968A1 publication Critical patent/HK1178968A1/zh

Links

HK13105587.3A 2012-12-07 2013-05-09 種光掃描散射儀 HK1178968A1 (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201210524802.3A CN103018208B (zh) 2012-12-07 2012-12-07 一种光扫描散射仪

Publications (1)

Publication Number Publication Date
HK1178968A1 true HK1178968A1 (zh) 2013-09-19

Family

ID=47967059

Family Applications (1)

Application Number Title Priority Date Filing Date
HK13105587.3A HK1178968A1 (zh) 2012-12-07 2013-05-09 種光掃描散射儀

Country Status (2)

Country Link
CN (1) CN103018208B (zh)
HK (1) HK1178968A1 (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102015121358A1 (de) * 2015-12-08 2017-06-08 Endress+Hauser Conducta Gmbh+Co. Kg Sensoranordnung zur Bestimmung der Trübung
CN111366073A (zh) * 2020-03-09 2020-07-03 天津市捷威动力工业有限公司 一种基于三维激光扫描评估软包电芯预充电过程产气量的装置及方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5313542A (en) * 1992-11-30 1994-05-17 Breault Research Organization, Inc. Apparatus and method of rapidly measuring hemispherical scattered or radiated light
CN1097761C (zh) * 1995-01-09 2003-01-01 怀特技术公司 用于光散射仪的照明系统及其控制该系统激光源的方法
US5578818A (en) * 1995-05-10 1996-11-26 Molecular Dynamics LED point scanning system
US20060288756A1 (en) * 2003-02-21 2006-12-28 De Meurechy Guido D K Method and apparatus for scanning corrosion and surface defects
US20070002336A1 (en) * 2005-06-30 2007-01-04 Asml Netherlands B.V. Metrology apparatus, lithographic apparatus, process apparatus, metrology method and device manufacturing method

Also Published As

Publication number Publication date
CN103018208A (zh) 2013-04-03
CN103018208B (zh) 2016-04-20

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20211207