HK1178968A1 - 種光掃描散射儀 - Google Patents
種光掃描散射儀Info
- Publication number
- HK1178968A1 HK1178968A1 HK13105587.3A HK13105587A HK1178968A1 HK 1178968 A1 HK1178968 A1 HK 1178968A1 HK 13105587 A HK13105587 A HK 13105587A HK 1178968 A1 HK1178968 A1 HK 1178968A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- light scanning
- scattering instrument
- scanning scattering
- instrument
- light
- Prior art date
Links
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201210524802.3A CN103018208B (zh) | 2012-12-07 | 2012-12-07 | 一种光扫描散射仪 |
Publications (1)
Publication Number | Publication Date |
---|---|
HK1178968A1 true HK1178968A1 (zh) | 2013-09-19 |
Family
ID=47967059
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK13105587.3A HK1178968A1 (zh) | 2012-12-07 | 2013-05-09 | 種光掃描散射儀 |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN103018208B (zh) |
HK (1) | HK1178968A1 (zh) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102015121358A1 (de) * | 2015-12-08 | 2017-06-08 | Endress+Hauser Conducta Gmbh+Co. Kg | Sensoranordnung zur Bestimmung der Trübung |
CN111366073A (zh) * | 2020-03-09 | 2020-07-03 | 天津市捷威动力工业有限公司 | 一种基于三维激光扫描评估软包电芯预充电过程产气量的装置及方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5313542A (en) * | 1992-11-30 | 1994-05-17 | Breault Research Organization, Inc. | Apparatus and method of rapidly measuring hemispherical scattered or radiated light |
CN1097761C (zh) * | 1995-01-09 | 2003-01-01 | 怀特技术公司 | 用于光散射仪的照明系统及其控制该系统激光源的方法 |
US5578818A (en) * | 1995-05-10 | 1996-11-26 | Molecular Dynamics | LED point scanning system |
US20060288756A1 (en) * | 2003-02-21 | 2006-12-28 | De Meurechy Guido D K | Method and apparatus for scanning corrosion and surface defects |
US20070002336A1 (en) * | 2005-06-30 | 2007-01-04 | Asml Netherlands B.V. | Metrology apparatus, lithographic apparatus, process apparatus, metrology method and device manufacturing method |
-
2012
- 2012-12-07 CN CN201210524802.3A patent/CN103018208B/zh active Active
-
2013
- 2013-05-09 HK HK13105587.3A patent/HK1178968A1/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
CN103018208A (zh) | 2013-04-03 |
CN103018208B (zh) | 2016-04-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PC | Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee) |
Effective date: 20211207 |