HK1110655A1 - Diagnostic signal processor - Google Patents

Diagnostic signal processor

Info

Publication number
HK1110655A1
HK1110655A1 HK08101206.0A HK08101206A HK1110655A1 HK 1110655 A1 HK1110655 A1 HK 1110655A1 HK 08101206 A HK08101206 A HK 08101206A HK 1110655 A1 HK1110655 A1 HK 1110655A1
Authority
HK
Hong Kong
Prior art keywords
signal processor
diagnostic signal
diagnostic
processor
signal
Prior art date
Application number
HK08101206.0A
Inventor
Mitsuhito Kamei
Chieko Nishida
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of HK1110655A1 publication Critical patent/HK1110655A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
    • G01R31/1254—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of gas-insulated power appliances or vacuum gaps
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
HK08101206.0A 2006-04-21 2008-01-31 Diagnostic signal processor HK1110655A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006118189A JP5078276B2 (en) 2006-04-21 2006-04-21 Diagnostic signal processor

Publications (1)

Publication Number Publication Date
HK1110655A1 true HK1110655A1 (en) 2008-07-18

Family

ID=37801782

Family Applications (1)

Application Number Title Priority Date Filing Date
HK08101206.0A HK1110655A1 (en) 2006-04-21 2008-01-31 Diagnostic signal processor

Country Status (5)

Country Link
JP (1) JP5078276B2 (en)
CN (1) CN101059547B (en)
DE (1) DE102007001143B4 (en)
GB (1) GB2437315B (en)
HK (1) HK1110655A1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2175536B1 (en) 2008-10-08 2017-06-07 ABB Schweiz AG An Arc Monitor
JP2013077921A (en) * 2011-09-29 2013-04-25 Toshiba Corp Clock diagnosis circuit
JP6878057B2 (en) * 2017-03-14 2021-05-26 株式会社東芝 Insulation diagnostic equipment and insulation diagnostic method
CA3033769A1 (en) * 2019-02-14 2020-08-14 Daniel Pineau Partial discharge detector and associated method
DE102020119012B4 (en) * 2020-07-17 2022-05-19 Hochschule Für Technik Und Wirtschaft Berlin Device and method for determining the charge strength of a partial discharge

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0750147B2 (en) * 1989-06-14 1995-05-31 株式会社日立製作所 Abnormal position locating method and apparatus for gas insulated electrical equipment
JPH04204270A (en) * 1990-11-30 1992-07-24 Toshiba Corp Partial-discharge detecting device for gas insulation switching device
JP2997571B2 (en) * 1991-07-10 2000-01-11 三菱電機株式会社 Monitoring and diagnostic equipment
JP3100757B2 (en) * 1992-06-02 2000-10-23 三菱電機株式会社 Monitoring and diagnostic equipment
DE4435442A1 (en) * 1994-10-04 1996-04-11 Abb Management Ag Sensor for decoupling partial discharge pulses from a high-voltage electrical system
DE19507032A1 (en) * 1995-03-01 1996-09-05 Abb Management Ag Partial discharge measuring device
JPH10170596A (en) * 1996-12-09 1998-06-26 Hitachi Ltd System for diagnosing insulated apparatus and method for detecting partial discharge
JPH11248783A (en) * 1998-03-06 1999-09-17 Mitsubishi Electric Corp Partial discharge detection apparatus
JP2993931B2 (en) * 1998-05-12 1999-12-27 北陸電力株式会社 Partial discharge detection method
JP2001183411A (en) * 1999-12-27 2001-07-06 Mitsubishi Electric Corp Partial discharge measuring system, partial discharge measuring device, voltage phase measuring device, and partial discharge measuring method
JP2001242212A (en) * 2000-03-02 2001-09-07 Mitsubishi Electric Corp Kind determination method and device of partial discharge of gas insulated electrical machinery and apparatus
JP4094469B2 (en) * 2003-04-07 2008-06-04 株式会社東芝 Partial discharge measuring device and signal processing circuit used in the device

Also Published As

Publication number Publication date
DE102007001143A1 (en) 2007-10-25
CN101059547A (en) 2007-10-24
JP5078276B2 (en) 2012-11-21
GB2437315A (en) 2007-10-24
JP2007292501A (en) 2007-11-08
CN101059547B (en) 2010-11-17
DE102007001143B4 (en) 2014-07-31
GB0700198D0 (en) 2007-02-14
GB2437315B (en) 2008-06-04

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