HK1109832A2 - Non contact-making probes - Google Patents

Non contact-making probes

Info

Publication number
HK1109832A2
HK1109832A2 HK08101267A HK08101267A HK1109832A2 HK 1109832 A2 HK1109832 A2 HK 1109832A2 HK 08101267 A HK08101267 A HK 08101267A HK 08101267 A HK08101267 A HK 08101267A HK 1109832 A2 HK1109832 A2 HK 1109832A2
Authority
HK
Hong Kong
Prior art keywords
non contact
making probes
probes
making
contact
Prior art date
Application number
HK08101267A
Inventor
Chou Kai Sheng
Original Assignee
Meet Internat Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Meet Internat Ltd filed Critical Meet Internat Ltd
Priority to HK08101267A priority Critical patent/HK1109832A2/en
Publication of HK1109832A2 publication Critical patent/HK1109832A2/en
Priority to CNU2008201262707U priority patent/CN201289497Y/en

Links

HK08101267A 2008-02-01 2008-02-01 Non contact-making probes HK1109832A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
HK08101267A HK1109832A2 (en) 2008-02-01 2008-02-01 Non contact-making probes
CNU2008201262707U CN201289497Y (en) 2008-02-01 2008-07-29 Non-contact probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
HK08101267A HK1109832A2 (en) 2008-02-01 2008-02-01 Non contact-making probes

Publications (1)

Publication Number Publication Date
HK1109832A2 true HK1109832A2 (en) 2008-06-20

Family

ID=39711992

Family Applications (1)

Application Number Title Priority Date Filing Date
HK08101267A HK1109832A2 (en) 2008-02-01 2008-02-01 Non contact-making probes

Country Status (2)

Country Link
CN (1) CN201289497Y (en)
HK (1) HK1109832A2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2659278B1 (en) * 2010-12-30 2018-11-21 Prysmian S.p.A. Locating of partial-discharge-generating faults
CN107367630A (en) * 2017-08-29 2017-11-21 漳州市玉山电子制造有限公司 A kind of digital multimeter adds non-contact alternating current test circuit and method
US10539643B2 (en) * 2017-09-01 2020-01-21 Fluke Corporation Proving unit for use with electrical test tools

Also Published As

Publication number Publication date
CN201289497Y (en) 2009-08-12

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Legal Events

Date Code Title Description
PEU Short-term patents expired

Effective date: 20160131