GR1006645B - Συστημα και μεθοδος αυτοματου ηλεκτρικου χαρακτηρισμου διαταξεων ημιαγωγων σε ευρος θερμοκρασιων - Google Patents
Συστημα και μεθοδος αυτοματου ηλεκτρικου χαρακτηρισμου διαταξεων ημιαγωγων σε ευρος θερμοκρασιωνInfo
- Publication number
- GR1006645B GR1006645B GR20080100683A GR20080100683A GR1006645B GR 1006645 B GR1006645 B GR 1006645B GR 20080100683 A GR20080100683 A GR 20080100683A GR 20080100683 A GR20080100683 A GR 20080100683A GR 1006645 B GR1006645 B GR 1006645B
- Authority
- GR
- Greece
- Prior art keywords
- condensates
- carbonaceous
- hydrated
- thermal decomposition
- same time
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2862—Chambers or ovens; Tanks
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Environmental & Geological Engineering (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
Η εφεύρεση αυτή αναφέρεται σε μια εφαρμογή αυτοματοποίησης ηλεκτρικών μετρήσεων χαρακτηρισμού σε διατάξεις ημιαγωγών, σε ένα εύρος θερμοκρασιών. Χρησιμοποιεί έναν απλό ηλεκτρονικό υπολογιστή εφοδιασμένο με το κατάλληλο λογισμικό ηλεκτρονικού υπολογιστή το οποίο ελέγχει μέσω ειδικής κάρτας επικοινωνίας τύπου IEEE 488. 2 τα αντίστοιχα όργανα μετρήσεων και παράλληλα μια διάταξη θερμοηλεκτρικών στοιχείων για την τροποποίηση της θερμοκρασίας, τόσο άνω όσο και κάτω από αυτή του περιβάλλοντος. Με την αυτοματοποιημένη αυτή διάταξη είναι δυνατό να ληφθούν σειρά ηλεκτρικών μετρήσεων με διαφορετικά χαρακτηριστικά, στον ελάχιστο δυνατό χρόνο απομακρύνοντας τον παράγοντα του ανθρώπινου λάθους. Παράλληλα είναι δυνατή η αποθήκευση τόσο των αποτελεσμάτων όσο και της παραμετροποίησης ώστε η επανάληψη τηςμέτρησης να μπορεί να γίνει άμεσα με αλλαγή απλώς του εκάστοτε δείγματος.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GR20080100683A GR1006645B (el) | 2008-10-20 | 2008-10-20 | Συστημα και μεθοδος αυτοματου ηλεκτρικου χαρακτηρισμου διαταξεων ημιαγωγων σε ευρος θερμοκρασιων |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GR20080100683A GR1006645B (el) | 2008-10-20 | 2008-10-20 | Συστημα και μεθοδος αυτοματου ηλεκτρικου χαρακτηρισμου διαταξεων ημιαγωγων σε ευρος θερμοκρασιων |
Publications (1)
Publication Number | Publication Date |
---|---|
GR1006645B true GR1006645B (el) | 2009-12-29 |
Family
ID=40937593
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GR20080100683A GR1006645B (el) | 2008-10-20 | 2008-10-20 | Συστημα και μεθοδος αυτοματου ηλεκτρικου χαρακτηρισμου διαταξεων ημιαγωγων σε ευρος θερμοκρασιων |
Country Status (1)
Country | Link |
---|---|
GR (1) | GR1006645B (el) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4848090A (en) * | 1988-01-27 | 1989-07-18 | Texas Instruments Incorporated | Apparatus for controlling the temperature of an integrated circuit package |
US20050253575A1 (en) * | 2001-11-30 | 2005-11-17 | Kiyoshi Takekoshi | Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method |
US20050287685A1 (en) * | 2004-06-14 | 2005-12-29 | Mcfadden Bruce | Localizing a temperature of a device for testing |
US20070030021A1 (en) * | 1999-06-30 | 2007-02-08 | Cascade Microtech Inc. | Probe station thermal chuck with shielding for capacitive current |
US20080043435A1 (en) * | 2006-08-16 | 2008-02-21 | Rambus, Inc. | System for controlling the temperature of electronic devices |
-
2008
- 2008-10-20 GR GR20080100683A patent/GR1006645B/el not_active IP Right Cessation
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4848090A (en) * | 1988-01-27 | 1989-07-18 | Texas Instruments Incorporated | Apparatus for controlling the temperature of an integrated circuit package |
US20070030021A1 (en) * | 1999-06-30 | 2007-02-08 | Cascade Microtech Inc. | Probe station thermal chuck with shielding for capacitive current |
US20050253575A1 (en) * | 2001-11-30 | 2005-11-17 | Kiyoshi Takekoshi | Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method |
US20050287685A1 (en) * | 2004-06-14 | 2005-12-29 | Mcfadden Bruce | Localizing a temperature of a device for testing |
US20080043435A1 (en) * | 2006-08-16 | 2008-02-21 | Rambus, Inc. | System for controlling the temperature of electronic devices |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PG | Patent granted | ||
ML | Lapse due to non-payment of fees |
Effective date: 20150505 |