GB9721577D0 - High voltage test probe - Google Patents

High voltage test probe

Info

Publication number
GB9721577D0
GB9721577D0 GBGB9721577.6A GB9721577A GB9721577D0 GB 9721577 D0 GB9721577 D0 GB 9721577D0 GB 9721577 A GB9721577 A GB 9721577A GB 9721577 D0 GB9721577 D0 GB 9721577D0
Authority
GB
United Kingdom
Prior art keywords
high voltage
test probe
voltage test
probe
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GBGB9721577.6A
Other versions
GB2318460B (en
GB2318460A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Whitaker LLC
Original Assignee
Whitaker LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Whitaker LLC filed Critical Whitaker LLC
Publication of GB9721577D0 publication Critical patent/GB9721577D0/en
Publication of GB2318460A publication Critical patent/GB2318460A/en
Application granted granted Critical
Publication of GB2318460B publication Critical patent/GB2318460B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06777High voltage probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06788Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
GB9721577A 1996-10-11 1997-10-10 High voltage test probe Expired - Fee Related GB2318460B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB9621246.9A GB9621246D0 (en) 1996-10-11 1996-10-11 High voltage test probe

Publications (3)

Publication Number Publication Date
GB9721577D0 true GB9721577D0 (en) 1997-12-10
GB2318460A GB2318460A (en) 1998-04-22
GB2318460B GB2318460B (en) 2000-09-13

Family

ID=10801284

Family Applications (2)

Application Number Title Priority Date Filing Date
GBGB9621246.9A Pending GB9621246D0 (en) 1996-10-11 1996-10-11 High voltage test probe
GB9721577A Expired - Fee Related GB2318460B (en) 1996-10-11 1997-10-10 High voltage test probe

Family Applications Before (1)

Application Number Title Priority Date Filing Date
GBGB9621246.9A Pending GB9621246D0 (en) 1996-10-11 1996-10-11 High voltage test probe

Country Status (1)

Country Link
GB (2) GB9621246D0 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109521232A (en) * 2018-11-20 2019-03-26 闻泰通讯股份有限公司 Oscilloprobe auxiliary test unit
CN114814553A (en) * 2022-05-13 2022-07-29 昆山兢美电子科技有限公司 Flying probe testing device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5414346A (en) * 1993-11-24 1995-05-09 Chrysler Corporation Adjustable piercing probe tip

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109521232A (en) * 2018-11-20 2019-03-26 闻泰通讯股份有限公司 Oscilloprobe auxiliary test unit
CN109521232B (en) * 2018-11-20 2023-09-19 闻泰通讯股份有限公司 Auxiliary test device for oscilloscope probe
CN114814553A (en) * 2022-05-13 2022-07-29 昆山兢美电子科技有限公司 Flying probe testing device
CN114814553B (en) * 2022-05-13 2023-11-03 昆山兢美电子科技有限公司 Flying probe testing device

Also Published As

Publication number Publication date
GB2318460B (en) 2000-09-13
GB9621246D0 (en) 1996-11-27
GB2318460A (en) 1998-04-22

Similar Documents

Publication Publication Date Title
GB2297624B (en) Multiple lead voltage probe
AU3073797A (en) Wafer-level burn-in and test
EP0701136A3 (en) Electrical probe apparatus
GB9518089D0 (en) Test head circuit tester
GB9417589D0 (en) Scan test
GB9313602D0 (en) Electrical test instrument
EP0697599A3 (en) Voltage measuring apparatus
GB2318460B (en) High voltage test probe
GB9200273D0 (en) Electrical test instrument
SG97766A1 (en) Burn-in testing device
PL332672A1 (en) Testing probe
GB2319121B (en) Electrical meter testing
EP0495380A3 (en) Probe tip for electric test fixture
GB2331588B (en) Electrical test device
GB2352053B (en) Fiber-optic test probes
TW318557U (en) Improved probe structure for multimeter
TW302026U (en) Inspecting probe
GB9425651D0 (en) Insulator tester
TW299834U (en) Improved probe structure
GB9600705D0 (en) Continuity tester
GB9618844D0 (en) Electrical continuity tester
PL323766A1 (en) Voltage presence testing device
PL104823U1 (en) High voltage indicator
GB9415068D0 (en) Electrical tester
GB2314416B (en) Remote-field eddy current testing

Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20051010