GB9626326D0 - Apparatus for testing an electronic module - Google Patents

Apparatus for testing an electronic module

Info

Publication number
GB9626326D0
GB9626326D0 GBGB9626326.4A GB9626326A GB9626326D0 GB 9626326 D0 GB9626326 D0 GB 9626326D0 GB 9626326 A GB9626326 A GB 9626326A GB 9626326 D0 GB9626326 D0 GB 9626326D0
Authority
GB
United Kingdom
Prior art keywords
testing
electronic module
module
electronic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GBGB9626326.4A
Other versions
GB2308454A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Finland Oy
Original Assignee
Fujitsu Finland Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Finland Oy filed Critical Fujitsu Finland Oy
Publication of GB9626326D0 publication Critical patent/GB9626326D0/en
Publication of GB2308454A publication Critical patent/GB2308454A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/0061—Tools for holding the circuit boards during processing; handling transport of printed circuit boards
    • H05K13/0069—Holders for printed circuit boards

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
GB9626326A 1995-12-21 1996-12-19 Apparatus for testing an electronic module Withdrawn GB2308454A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI956194A FI956194A0 (en) 1995-12-21 1995-12-21 Anordning Foer is functionally tested in an electronic module

Publications (2)

Publication Number Publication Date
GB9626326D0 true GB9626326D0 (en) 1997-02-05
GB2308454A GB2308454A (en) 1997-06-25

Family

ID=8544587

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9626326A Withdrawn GB2308454A (en) 1995-12-21 1996-12-19 Apparatus for testing an electronic module

Country Status (2)

Country Link
FI (1) FI956194A0 (en)
GB (1) GB2308454A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108761251A (en) * 2018-07-27 2018-11-06 南斗六星系统集成有限公司 A kind of automatic aging detection device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10281487B2 (en) 2013-09-17 2019-05-07 The Micromanipulator Company, Llc Probe system designed for probing of electronic parts mounted into application or test boards

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2169153B (en) * 1984-12-28 1988-08-03 Sumitomo Wall Systems Ltd Connector terminal examination device
US4777434A (en) * 1985-10-03 1988-10-11 Amp Incorporated Microelectronic burn-in system
US4797610A (en) * 1986-05-08 1989-01-10 Miguel Fombellida Electronic test fixture
US4757254A (en) * 1987-05-27 1988-07-12 Augat Inc. High-speed side access edge connector testing assembly
JP2863352B2 (en) * 1991-08-29 1999-03-03 シャープ株式会社 Semiconductor integrated circuit test equipment

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108761251A (en) * 2018-07-27 2018-11-06 南斗六星系统集成有限公司 A kind of automatic aging detection device

Also Published As

Publication number Publication date
GB2308454A (en) 1997-06-25
FI956194A0 (en) 1995-12-21

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)