GB956996A - Improvements relating to gas sample introduction apparatus - Google Patents

Improvements relating to gas sample introduction apparatus

Info

Publication number
GB956996A
GB956996A GB4564161A GB4564161A GB956996A GB 956996 A GB956996 A GB 956996A GB 4564161 A GB4564161 A GB 4564161A GB 4564161 A GB4564161 A GB 4564161A GB 956996 A GB956996 A GB 956996A
Authority
GB
United Kingdom
Prior art keywords
tube
gas
sample
plunger
ion source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB4564161A
Inventor
Edward Willdig
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Associated Electrical Industries Ltd
Original Assignee
Associated Electrical Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Associated Electrical Industries Ltd filed Critical Associated Electrical Industries Ltd
Priority to GB4564161A priority Critical patent/GB956996A/en
Priority to DE19621498517 priority patent/DE1498517A1/en
Priority to FR919342A priority patent/FR1341917A/en
Publication of GB956996A publication Critical patent/GB956996A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0404—Capillaries used for transferring samples or ions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/22—Devices for withdrawing samples in the gaseous state
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/22—Devices for withdrawing samples in the gaseous state
    • G01N1/24—Suction devices

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

956,996. Mass spectrometers. ASSOCIATED ELECTRICAL INDUSTRIES Ltd. Dec. 5, 1962 [Dec. 20, 1961], No. 45641/61. Heading H1D. [Also in Division G1] Gas sampling apparatus e.g. for introducing a gas sample into the ion source 3 of a mass spectrometer 4 comprises a capillary supply tube 1 adapted to be connected to a source of gas 2 from which the sample is taken, a vacuum pump 8 for passing the sample through the tube 1, a valve unit 7 to allow the sample to escape at a controlled rate into the ion source 3, and a valve unit 5 for passing a cleaning fluid e.g. oxygen under pressure from a reservoir 6 through the tube 1 when required. The tube 1 is in two parts, 1a, 1b meeting at the valve unit 5. The part 1a has a suitable end allowing the gas sample to be collected, e.g. gas from small volumes of blood or from a patient's lungs, and in operation the gas through the tube 1 to the valve unit 7. This unit has a plunger 22 (Fig. 2) adapted to be moved vertically within a bore 20 by angular rotation of a plate 36 having a suitably shaped slot 35. The lower ends of the plunger 22 and bore 20 engage closely and the vacuum pump 8 is connected to the bore 20 through a duct 29. The tube 1 leads through the plunger 20 to a small chamber 27 closed by a porous disc 28, e.g. of sintered silicon carbide, leading to the ion source 3. By altering the position of the plunger 22 the rate of flow of gas through the tube 1 and the pressure in the chamber 27 may be adjusted thus controlling the escape of gas through the disc 28. The disc 28 may be replaced by a short capillary tube leading to the ion source 3 if desired. In the event of a blockage of the tube 1 by condensation or solid particles, the part 1b of the tube may be sealed off by closing a valve 9. Then by opening a screw-down valve 11 oxygen under pressure may be passed through the part 1a of the capillary tube to clean it. If desired, both parts 1a, 1b of the capillary tube may be cleaned. The tube 1 may be electrically heated to reduce condensation by passing an electric current through the tube and a copper braiding surrounding the tube and insulated from it by a layer of woven glass or nylon sleeving.
GB4564161A 1961-12-20 1961-12-20 Improvements relating to gas sample introduction apparatus Expired GB956996A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
GB4564161A GB956996A (en) 1961-12-20 1961-12-20 Improvements relating to gas sample introduction apparatus
DE19621498517 DE1498517A1 (en) 1961-12-20 1962-12-19 Gas inlet system for mass spectrometer
FR919342A FR1341917A (en) 1961-12-20 1962-12-20 Device for introducing a gas sample into an analysis apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB4564161A GB956996A (en) 1961-12-20 1961-12-20 Improvements relating to gas sample introduction apparatus

Publications (1)

Publication Number Publication Date
GB956996A true GB956996A (en) 1964-04-29

Family

ID=10438005

Family Applications (1)

Application Number Title Priority Date Filing Date
GB4564161A Expired GB956996A (en) 1961-12-20 1961-12-20 Improvements relating to gas sample introduction apparatus

Country Status (2)

Country Link
DE (1) DE1498517A1 (en)
GB (1) GB956996A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107818909A (en) * 2017-09-28 2018-03-20 清华大学 Ion mobility spectrometry sampling system

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8378293B1 (en) 2011-09-09 2013-02-19 Agilent Technologies, Inc. In-situ conditioning in mass spectrometer systems
EP4231009A1 (en) * 2022-02-21 2023-08-23 Siemens Aktiengesellschaft Pneumatic module for gas analysis device, and manufacturing method and computer program product therefor

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107818909A (en) * 2017-09-28 2018-03-20 清华大学 Ion mobility spectrometry sampling system

Also Published As

Publication number Publication date
DE1498517A1 (en) 1969-05-22

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