GB921227A - The high temperature furnace for x-ray diffractometer - Google Patents

The high temperature furnace for x-ray diffractometer

Info

Publication number
GB921227A
GB921227A GB3519159A GB3519159A GB921227A GB 921227 A GB921227 A GB 921227A GB 3519159 A GB3519159 A GB 3519159A GB 3519159 A GB3519159 A GB 3519159A GB 921227 A GB921227 A GB 921227A
Authority
GB
United Kingdom
Prior art keywords
specimen
heating
heating wires
base member
semicircular
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB3519159A
Inventor
Yoshihiro Shimula
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Denki Co Ltd
Original Assignee
Rigaku Denki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Denki Co Ltd filed Critical Rigaku Denki Co Ltd
Priority to GB3519159A priority Critical patent/GB921227A/en
Publication of GB921227A publication Critical patent/GB921227A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G01N23/20033—Sample holders or supports therefor provided with temperature control or heating means

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

921,227. Heating X-ray specimens by electric resistances. RIGAKU DENKI CO. Ltd. Oct. 16, 1959, No. 35191/59. Class 39 (3). [Also in Group XX] An arrangement for heating the specimen in an X-ray diffractometer comprises a base member 11, Fig. 4, as shown, a rectangular block with semicircular end portions 1b, 1c, for supporting the specimen holder 13, and electric heating wires 17, 18 disposed respectively behind and in front of the specimen. The base member is mounted on a rotatable shaft 12 and may be enclosed in a cylindrical shield case 2 which is provided with a metal, e.g. nickel, foil window 3 for the entry and exit of the X-ray beams. The rear heating wires 17 are mounted in grooves 16 and the forward heating wires 18 are disposed in grooves in the semicircular portions 1b, 1c and both sets of wires may consist of platinumrhodium. In another embodiment, Figs. 7 and 8, the base member 21 is C-shaped with heating wires 27 arranged in grooves 26 behind the specimen S and heating wires 28 wound around the outside of the base part. In a further embodiment, Fig. 13, the base member 31 consists of a semicircular cylindrical portion 31a with upper and lower circular portions 31c, and a double set of parallel heating wires 35, 36 for heating the front of the specimen are wound around the semicircular part and a support 32.
GB3519159A 1959-10-16 1959-10-16 The high temperature furnace for x-ray diffractometer Expired GB921227A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB3519159A GB921227A (en) 1959-10-16 1959-10-16 The high temperature furnace for x-ray diffractometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB3519159A GB921227A (en) 1959-10-16 1959-10-16 The high temperature furnace for x-ray diffractometer

Publications (1)

Publication Number Publication Date
GB921227A true GB921227A (en) 1963-03-20

Family

ID=10374899

Family Applications (1)

Application Number Title Priority Date Filing Date
GB3519159A Expired GB921227A (en) 1959-10-16 1959-10-16 The high temperature furnace for x-ray diffractometer

Country Status (1)

Country Link
GB (1) GB921227A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2441986A1 (en) * 1978-11-14 1980-06-13 Eichenauer Fritz ELECTRIC HEATER BODY FOR FLUIDS
CN106645237A (en) * 2016-11-09 2017-05-10 丹东浩元仪器有限公司 High-temperature measurement device for X-ray diffractometer

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2441986A1 (en) * 1978-11-14 1980-06-13 Eichenauer Fritz ELECTRIC HEATER BODY FOR FLUIDS
CN106645237A (en) * 2016-11-09 2017-05-10 丹东浩元仪器有限公司 High-temperature measurement device for X-ray diffractometer
CN106645237B (en) * 2016-11-09 2023-08-25 丹东浩元仪器有限公司 High-temperature measuring device for X-ray diffractometer

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