GB9028145D0 - A test control apparatus - Google Patents

A test control apparatus

Info

Publication number
GB9028145D0
GB9028145D0 GB9028145A GB9028145A GB9028145D0 GB 9028145 D0 GB9028145 D0 GB 9028145D0 GB 9028145 A GB9028145 A GB 9028145A GB 9028145 A GB9028145 A GB 9028145A GB 9028145 D0 GB9028145 D0 GB 9028145D0
Authority
GB
United Kingdom
Prior art keywords
data
test
controller
processing
carried out
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB9028145A
Other versions
GB2251321B (en
GB2251321A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
VAPOURWARE Ltd
Original Assignee
VAPOURWARE Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by VAPOURWARE Ltd filed Critical VAPOURWARE Ltd
Publication of GB9028145D0 publication Critical patent/GB9028145D0/en
Publication of GB2251321A publication Critical patent/GB2251321A/en
Application granted granted Critical
Publication of GB2251321B publication Critical patent/GB2251321B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/34—Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31912—Tester/user interface
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/34—Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment
    • G06F11/3466—Performance evaluation by tracing or monitoring
    • G06F11/3476—Data logging
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/74—Masking faults in memories by using spares or by reconfiguring using duplex memories, i.e. using dual copies

Abstract

A test control apparatus 1 is disclosed having a control unit 3 with a data controller 4 and a functionally separate processing controller 5. The data controller is connected to test instruments 2 and to a user interface 6 for creation of all data files including files for captured test data, test specifications, test instructions or sample identification codes. Such data files are created independently of the processing controller and of the format of instrument data file. The processing controller uses a program library 9 to assist in processing data retrieved in data files via the data controller to generate test reports at output interfaces 7. Because data and processing operations are carried out separately, modification of the apparatus for use with different types of test or test instruments may be easily carried out. Further, access to data is relatively quick because the data controller stores data in separate active and historical databases 15, 17. Data are stored in a relational manner which ensures that reports tying together information relating to a particular product may be easily carried out. <IMAGE>
GB9028145A 1990-12-27 1990-12-28 A test control apparatus Expired - Fee Related GB2251321B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
BE9001244A BE1002551A6 (en) 1990-12-27 1990-12-27 TEST CONTROL APPARATUS.

Publications (3)

Publication Number Publication Date
GB9028145D0 true GB9028145D0 (en) 1991-02-13
GB2251321A GB2251321A (en) 1992-07-01
GB2251321B GB2251321B (en) 1994-10-26

Family

ID=3885075

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9028145A Expired - Fee Related GB2251321B (en) 1990-12-27 1990-12-28 A test control apparatus

Country Status (2)

Country Link
BE (1) BE1002551A6 (en)
GB (1) GB2251321B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0667587A3 (en) * 1994-02-15 1996-01-31 Motorola Inc Method for generically describing measured results.
US5943485A (en) * 1996-10-15 1999-08-24 Motorola, Inc. Method for testing and for generating a mapping for an electronic device
US6366924B1 (en) * 1998-07-27 2002-04-02 Caliper Technologies Corp. Distributed database for analytical instruments

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4176031A (en) * 1978-03-17 1979-11-27 Fischer & Porter Co. Digital hypochlorous acid analyzer
US4835372A (en) * 1985-07-19 1989-05-30 Clincom Incorporated Patient care system
DK334787A (en) * 1986-07-01 1988-01-02 Terumo Corp DEVICE FOR MEASURING BIOLOGICAL INFORMATION

Also Published As

Publication number Publication date
GB2251321B (en) 1994-10-26
GB2251321A (en) 1992-07-01
BE1002551A6 (en) 1991-03-19

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20091228