GB9027349D0 - Automatic analysis apparatus - Google Patents

Automatic analysis apparatus

Info

Publication number
GB9027349D0
GB9027349D0 GB909027349A GB9027349A GB9027349D0 GB 9027349 D0 GB9027349 D0 GB 9027349D0 GB 909027349 A GB909027349 A GB 909027349A GB 9027349 A GB9027349 A GB 9027349A GB 9027349 D0 GB9027349 D0 GB 9027349D0
Authority
GB
United Kingdom
Prior art keywords
analysis apparatus
automatic analysis
automatic
analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB909027349A
Other versions
GB2251081A (en
GB2251081B (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Motorola Solutions UK Ltd
Original Assignee
Motorola Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Motorola Ltd filed Critical Motorola Ltd
Priority to GB9027349A priority Critical patent/GB2251081B/en
Publication of GB9027349D0 publication Critical patent/GB9027349D0/en
Publication of GB2251081A publication Critical patent/GB2251081A/en
Application granted granted Critical
Publication of GB2251081B publication Critical patent/GB2251081B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
GB9027349A 1990-12-18 1990-12-18 Automatic analysis apparatus Expired - Fee Related GB2251081B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB9027349A GB2251081B (en) 1990-12-18 1990-12-18 Automatic analysis apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB9027349A GB2251081B (en) 1990-12-18 1990-12-18 Automatic analysis apparatus

Publications (3)

Publication Number Publication Date
GB9027349D0 true GB9027349D0 (en) 1991-02-06
GB2251081A GB2251081A (en) 1992-06-24
GB2251081B GB2251081B (en) 1995-08-23

Family

ID=10687138

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9027349A Expired - Fee Related GB2251081B (en) 1990-12-18 1990-12-18 Automatic analysis apparatus

Country Status (1)

Country Link
GB (1) GB2251081B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111823167A (en) * 2020-08-10 2020-10-27 天津七一二通信广播股份有限公司 New generation CIR automatic test fixture and implementation method thereof

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2274716A (en) * 1992-09-22 1994-08-03 Mistrock Microsystems Limited Circuit tester
WO2017156780A1 (en) * 2016-03-18 2017-09-21 深圳市艾励美特科技有限公司 Radio-frequency detection apparatus

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4168796A (en) * 1978-04-13 1979-09-25 Ncr Corporation Tester with driver/sensor circuit having programmable termination devices
US4216539A (en) * 1978-05-05 1980-08-05 Zehntel, Inc. In-circuit digital tester
GB2105050B (en) * 1978-08-25 1983-08-03 Racal Automation Ltd Improvements in and relating to circuit testing apparatus
US4354268A (en) * 1980-04-03 1982-10-12 Santek, Inc. Intelligent test head for automatic test system
GB2149129B (en) * 1983-11-04 1987-10-21 Membrain Ltd Automatic test equipment
GB2214319B (en) * 1987-01-16 1991-09-25 Teradyne Inc Automatic test equipment
US4862070A (en) * 1987-10-30 1989-08-29 Teradyne, Inc. Apparatus for testing input pin leakage current of a device under test

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111823167A (en) * 2020-08-10 2020-10-27 天津七一二通信广播股份有限公司 New generation CIR automatic test fixture and implementation method thereof

Also Published As

Publication number Publication date
GB2251081A (en) 1992-06-24
GB2251081B (en) 1995-08-23

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19971218