GB8817338D0 - Improvements in & relating to method of testing integrated circuits - Google Patents

Improvements in & relating to method of testing integrated circuits

Info

Publication number
GB8817338D0
GB8817338D0 GB8817338A GB8817338A GB8817338D0 GB 8817338 D0 GB8817338 D0 GB 8817338D0 GB 8817338 A GB8817338 A GB 8817338A GB 8817338 A GB8817338 A GB 8817338A GB 8817338 D0 GB8817338 D0 GB 8817338D0
Authority
GB
United Kingdom
Prior art keywords
test
registers
delays
test patterns
different
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB8817338A
Other versions
GB2221044B (en
GB2221044A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Plessey Co Ltd
Original Assignee
Plessey Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Plessey Co Ltd filed Critical Plessey Co Ltd
Priority to GB8817338A priority Critical patent/GB2221044B/en
Publication of GB8817338D0 publication Critical patent/GB8817338D0/en
Publication of GB2221044A publication Critical patent/GB2221044A/en
Application granted granted Critical
Publication of GB2221044B publication Critical patent/GB2221044B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318577—AC testing, e.g. current testing, burn-in
    • G01R31/31858—Delay testing

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

To test an integrated circuit such as in Fig 1 wherein there are different paths with different delays between input test registers R1, R2 and output test registers R3, the different delays preventing exhaustive test patterns from being applied to internal embedded combinational blocks Ca, Cb, the serial path of shift registers has additional registers Ds(Fig 2) to resynchronise the test patterns for the logic blocks. Alternatively, the serial path is considered to have imaginary delays present and non-contiguous inputs to the logic blocks are stimulated by exhaustive test patterns provided by a special algorithm viz a polynomial functionally dependent on the difference in the delays along the signal paths. The technique may be used with interleaved test registers. <IMAGE>
GB8817338A 1988-07-21 1988-07-21 Improvements in and relating to methods of testing integrated circuits Expired - Fee Related GB2221044B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB8817338A GB2221044B (en) 1988-07-21 1988-07-21 Improvements in and relating to methods of testing integrated circuits

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB8817338A GB2221044B (en) 1988-07-21 1988-07-21 Improvements in and relating to methods of testing integrated circuits

Publications (3)

Publication Number Publication Date
GB8817338D0 true GB8817338D0 (en) 1988-08-24
GB2221044A GB2221044A (en) 1990-01-24
GB2221044B GB2221044B (en) 1992-09-30

Family

ID=10640833

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8817338A Expired - Fee Related GB2221044B (en) 1988-07-21 1988-07-21 Improvements in and relating to methods of testing integrated circuits

Country Status (1)

Country Link
GB (1) GB2221044B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5596585A (en) * 1995-06-07 1997-01-21 Advanced Micro Devices, Inc. Performance driven BIST technique
US8155907B1 (en) * 2009-06-08 2012-04-10 Xilinx, Inc. Methods of enabling functions of a design to be implemented in an integrated circuit device and a computer program product

Also Published As

Publication number Publication date
GB2221044B (en) 1992-09-30
GB2221044A (en) 1990-01-24

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Legal Events

Date Code Title Description
732 Registration of transactions, instruments or events in the register (sect. 32/1977)
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19950721