GB8728373D0 - Arrangement for testing integrated circuits - Google Patents

Arrangement for testing integrated circuits

Info

Publication number
GB8728373D0
GB8728373D0 GB878728373A GB8728373A GB8728373D0 GB 8728373 D0 GB8728373 D0 GB 8728373D0 GB 878728373 A GB878728373 A GB 878728373A GB 8728373 A GB8728373 A GB 8728373A GB 8728373 D0 GB8728373 D0 GB 8728373D0
Authority
GB
United Kingdom
Prior art keywords
arrangement
integrated circuits
testing integrated
testing
circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
GB878728373A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Marconi Electronic Devices Ltd
Original Assignee
Marconi Electronic Devices Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Marconi Electronic Devices Ltd filed Critical Marconi Electronic Devices Ltd
Priority to GB878728373A priority Critical patent/GB8728373D0/en
Publication of GB8728373D0 publication Critical patent/GB8728373D0/en
Pending legal-status Critical Current

Links

GB878728373A 1987-12-04 1987-12-04 Arrangement for testing integrated circuits Pending GB8728373D0 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB878728373A GB8728373D0 (en) 1987-12-04 1987-12-04 Arrangement for testing integrated circuits

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB878728373A GB8728373D0 (en) 1987-12-04 1987-12-04 Arrangement for testing integrated circuits

Publications (1)

Publication Number Publication Date
GB8728373D0 true GB8728373D0 (en) 1988-01-13

Family

ID=10627986

Family Applications (1)

Application Number Title Priority Date Filing Date
GB878728373A Pending GB8728373D0 (en) 1987-12-04 1987-12-04 Arrangement for testing integrated circuits

Country Status (1)

Country Link
GB (1) GB8728373D0 (en)

Similar Documents

Publication Publication Date Title
GB8724087D0 (en) Testing circuit arrangement
EP0315385A3 (en) Delay circuits for integrated circuits
GB2177254B (en) Testing integrated circuits
EP0430128A3 (en) Circuit for testability
GB2210171B (en) Test circuit
EP0295800A3 (en) Circuit testing
IL85682A0 (en) Tri-state circuit tester
GB8723539D0 (en) Integrated circuits
GB8824272D0 (en) Testing electrical circuits
GB2207301B (en) Probe for testing electronic components
GB2159287B (en) Integrated circuit testing arrangements
GB8507613D0 (en) Testing digital integrated circuits
GB8721781D0 (en) Integrated circuits
GB8728373D0 (en) Arrangement for testing integrated circuits
GB8728374D0 (en) Arrangement for testing integrated circuits
GB8605707D0 (en) Testing digital integrated circuits
EP0428251A3 (en) Integrated circuits
GB8617805D0 (en) Circuit tester
GB8605708D0 (en) Testing digital integrated circuits
GB8725688D0 (en) Integrated circuits
GB8620761D0 (en) Test circuits
GB8709742D0 (en) Sockets for integrated circuits
GB8615508D0 (en) Circuit tester
GB8725686D0 (en) Integrated circuits
CS482487A1 (en) Connexion for user integrated circuits testing