GB8521223D0 - Controlling distribution of carrier - Google Patents
Controlling distribution of carrierInfo
- Publication number
- GB8521223D0 GB8521223D0 GB858521223A GB8521223A GB8521223D0 GB 8521223 D0 GB8521223 D0 GB 8521223D0 GB 858521223 A GB858521223 A GB 858521223A GB 8521223 A GB8521223 A GB 8521223A GB 8521223 D0 GB8521223 D0 GB 8521223D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- carrier
- controlling distribution
- distribution
- controlling
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/324—Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
- H01L21/263—Bombardment with radiation with high-energy radiation
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- High Energy & Nuclear Physics (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Thyristors (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB8521223A GB2179496B (en) | 1985-08-23 | 1985-08-23 | A method of controlling a distribution of carrier lifetimes within a semiconductor material |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB8521223A GB2179496B (en) | 1985-08-23 | 1985-08-23 | A method of controlling a distribution of carrier lifetimes within a semiconductor material |
Publications (3)
Publication Number | Publication Date |
---|---|
GB8521223D0 true GB8521223D0 (en) | 1985-10-02 |
GB2179496A GB2179496A (en) | 1987-03-04 |
GB2179496B GB2179496B (en) | 1989-08-09 |
Family
ID=10584265
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB8521223A Expired GB2179496B (en) | 1985-08-23 | 1985-08-23 | A method of controlling a distribution of carrier lifetimes within a semiconductor material |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB2179496B (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3940723A1 (en) * | 1989-12-09 | 1991-06-20 | Eupec Gmbh & Co Kg | METHOD FOR GENERATING CARGO LIFETIME PROFILES IN A SEMICONDUCTOR |
US5883403A (en) * | 1995-10-03 | 1999-03-16 | Hitachi, Ltd. | Power semiconductor device |
JP2008091705A (en) * | 2006-10-03 | 2008-04-17 | Mitsubishi Electric Corp | Semiconductor device and manufacturing method thereof |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5669837A (en) * | 1979-11-12 | 1981-06-11 | Fujitsu Ltd | Manufacture of semiconductor device |
US4303455A (en) * | 1980-03-14 | 1981-12-01 | Rockwell International Corporation | Low temperature microwave annealing of semiconductor devices |
-
1985
- 1985-08-23 GB GB8521223A patent/GB2179496B/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
GB2179496B (en) | 1989-08-09 |
GB2179496A (en) | 1987-03-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
732 | Registration of transactions, instruments or events in the register (sect. 32/1977) | ||
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 19920823 |