GB8421096D0 - Mult-stage fixturing system - Google Patents

Mult-stage fixturing system

Info

Publication number
GB8421096D0
GB8421096D0 GB848421096A GB8421096A GB8421096D0 GB 8421096 D0 GB8421096 D0 GB 8421096D0 GB 848421096 A GB848421096 A GB 848421096A GB 8421096 A GB8421096 A GB 8421096A GB 8421096 D0 GB8421096 D0 GB 8421096D0
Authority
GB
United Kingdom
Prior art keywords
mult
stage
fixturing system
fixturing
stage fixturing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB848421096A
Other versions
GB2145582A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fairchild Semiconductor Corp
Original Assignee
Fairchild Camera and Instrument Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fairchild Camera and Instrument Corp filed Critical Fairchild Camera and Instrument Corp
Publication of GB8421096D0 publication Critical patent/GB8421096D0/en
Publication of GB2145582A publication Critical patent/GB2145582A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
GB08421096A 1983-08-23 1984-08-20 Electrical test probe assembly Withdrawn GB2145582A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US52568683A 1983-08-23 1983-08-23

Publications (2)

Publication Number Publication Date
GB8421096D0 true GB8421096D0 (en) 1984-09-26
GB2145582A GB2145582A (en) 1985-03-27

Family

ID=24094232

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08421096A Withdrawn GB2145582A (en) 1983-08-23 1984-08-20 Electrical test probe assembly

Country Status (2)

Country Link
DE (1) DE3430834A1 (en)
GB (1) GB2145582A (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH669270A5 (en) * 1984-07-10 1989-02-28 Ingun Pruefmittelbau Electronic assembly and printed circuit board tester
US4783624A (en) * 1986-04-14 1988-11-08 Interconnect Devices, Inc. Contact probe devices and method
US4801876A (en) * 1986-04-18 1989-01-31 Sagami Tsushin Kogyo Kabushiki Kaisha Printed wiring board tester
KR100449204B1 (en) * 2002-11-25 2004-09-18 리노공업주식회사 Air Interface Apparatus for Use in High Frequency Probe
US10908181B2 (en) 2018-09-21 2021-02-02 HKC Corporation Limited Test device
CN208737861U (en) * 2018-09-21 2019-04-12 惠科股份有限公司 Test device

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB259275A (en) * 1925-06-20 1926-09-20 Harry Alfred Gaydon Improvements in or relating to testing devices for use in connection with wireless and other electrical apparatus
GB495485A (en) * 1937-05-29 1938-11-15 Evershed Vignoles Ltd Improvements relating to electrical indicating instruments
GB1106241A (en) * 1965-03-18 1968-03-13 Marconi Instruments Ltd Improvements in or relating to oscilloscope and like probes

Also Published As

Publication number Publication date
DE3430834A1 (en) 1985-03-07
GB2145582A (en) 1985-03-27

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)