GB8411087D0 - Electrical probe assembly - Google Patents
Electrical probe assemblyInfo
- Publication number
- GB8411087D0 GB8411087D0 GB848411087A GB8411087A GB8411087D0 GB 8411087 D0 GB8411087 D0 GB 8411087D0 GB 848411087 A GB848411087 A GB 848411087A GB 8411087 A GB8411087 A GB 8411087A GB 8411087 D0 GB8411087 D0 GB 8411087D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- probe assembly
- electrical probe
- electrical
- assembly
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/16—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using capacitive devices
- G01R15/165—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using capacitive devices measuring electrostatic potential, e.g. with electrostatic voltmeters or electrometers, when the design of the sensor is essential
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0023—Measuring currents or voltages from sources with high internal resistance by means of measuring circuits with high input impedance, e.g. OP-amplifiers
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB08411087A GB2158592B (en) | 1984-05-01 | 1984-05-01 | Electrical probe assembly |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB08411087A GB2158592B (en) | 1984-05-01 | 1984-05-01 | Electrical probe assembly |
Publications (3)
Publication Number | Publication Date |
---|---|
GB8411087D0 true GB8411087D0 (en) | 1984-06-06 |
GB2158592A GB2158592A (en) | 1985-11-13 |
GB2158592B GB2158592B (en) | 1988-01-20 |
Family
ID=10560323
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB08411087A Expired GB2158592B (en) | 1984-05-01 | 1984-05-01 | Electrical probe assembly |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB2158592B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115541943A (en) * | 2021-06-30 | 2022-12-30 | 荣耀终端有限公司 | Radio frequency test probe structure, radio frequency test device and system |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3836712A1 (en) * | 1988-10-28 | 1990-05-03 | Volker Dipl Chem Genrich | Highly flexible large-area sensor mat |
US5274336A (en) * | 1992-01-14 | 1993-12-28 | Hewlett-Packard Company | Capacitively-coupled test probe |
US6970001B2 (en) | 2003-02-20 | 2005-11-29 | Hewlett-Packard Development Company, L.P. | Variable impedance test probe |
GB0605717D0 (en) | 2006-03-21 | 2006-05-03 | Univ Sussex | Electric potential sensor |
-
1984
- 1984-05-01 GB GB08411087A patent/GB2158592B/en not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115541943A (en) * | 2021-06-30 | 2022-12-30 | 荣耀终端有限公司 | Radio frequency test probe structure, radio frequency test device and system |
Also Published As
Publication number | Publication date |
---|---|
GB2158592B (en) | 1988-01-20 |
GB2158592A (en) | 1985-11-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 19980501 |