GB8407677D0 - Integrated circuit testing arrangements - Google Patents

Integrated circuit testing arrangements

Info

Publication number
GB8407677D0
GB8407677D0 GB848407677A GB8407677A GB8407677D0 GB 8407677 D0 GB8407677 D0 GB 8407677D0 GB 848407677 A GB848407677 A GB 848407677A GB 8407677 A GB8407677 A GB 8407677A GB 8407677 D0 GB8407677 D0 GB 8407677D0
Authority
GB
United Kingdom
Prior art keywords
integrated circuit
circuit testing
testing arrangements
arrangements
integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB848407677A
Other versions
GB2136972A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Research Development Corp UK
Original Assignee
National Research Development Corp UK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB838308329A external-priority patent/GB8308329D0/en
Application filed by National Research Development Corp UK filed Critical National Research Development Corp UK
Priority to GB08407677A priority Critical patent/GB2136972A/en
Publication of GB8407677D0 publication Critical patent/GB8407677D0/en
Publication of GB2136972A publication Critical patent/GB2136972A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
GB08407677A 1983-03-25 1984-03-23 Integrated circuit testing arrangements Withdrawn GB2136972A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB08407677A GB2136972A (en) 1983-03-25 1984-03-23 Integrated circuit testing arrangements

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB838308329A GB8308329D0 (en) 1983-03-25 1983-03-25 Integrated circuit testing arrangements
GB08407677A GB2136972A (en) 1983-03-25 1984-03-23 Integrated circuit testing arrangements

Publications (2)

Publication Number Publication Date
GB8407677D0 true GB8407677D0 (en) 1984-05-02
GB2136972A GB2136972A (en) 1984-09-26

Family

ID=26285624

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08407677A Withdrawn GB2136972A (en) 1983-03-25 1984-03-23 Integrated circuit testing arrangements

Country Status (1)

Country Link
GB (1) GB2136972A (en)

Also Published As

Publication number Publication date
GB2136972A (en) 1984-09-26

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)