GB8333965D0 - Multiple coating systems - Google Patents

Multiple coating systems

Info

Publication number
GB8333965D0
GB8333965D0 GB838333965A GB8333965A GB8333965D0 GB 8333965 D0 GB8333965 D0 GB 8333965D0 GB 838333965 A GB838333965 A GB 838333965A GB 8333965 A GB8333965 A GB 8333965A GB 8333965 D0 GB8333965 D0 GB 8333965D0
Authority
GB
United Kingdom
Prior art keywords
coating systems
multiple coating
systems
coating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB838333965A
Other versions
GB2133539A (en
GB2133539B (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Balzers und Leybold Deutschland Holding AG
Original Assignee
Leybold Heraeus GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Leybold Heraeus GmbH filed Critical Leybold Heraeus GmbH
Publication of GB8333965D0 publication Critical patent/GB8333965D0/en
Publication of GB2133539A publication Critical patent/GB2133539A/en
Application granted granted Critical
Publication of GB2133539B publication Critical patent/GB2133539B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0683—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating measurement during deposition or removal of the layer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Surface Treatment Of Optical Elements (AREA)
GB08333965A 1982-12-24 1983-12-21 The production of multiple coating systems Expired GB2133539B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19823248091 DE3248091A1 (en) 1982-12-24 1982-12-24 MEASURING METHOD AND PHOTOMETER ARRANGEMENT FOR THE MANUFACTURE OF MULTIPLE-LAYER SYSTEMS

Publications (3)

Publication Number Publication Date
GB8333965D0 true GB8333965D0 (en) 1984-02-01
GB2133539A GB2133539A (en) 1984-07-25
GB2133539B GB2133539B (en) 1986-02-19

Family

ID=6181818

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08333965A Expired GB2133539B (en) 1982-12-24 1983-12-21 The production of multiple coating systems

Country Status (3)

Country Link
JP (1) JPS59133413A (en)
DE (1) DE3248091A1 (en)
GB (1) GB2133539B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3518774A1 (en) * 1985-05-24 1986-11-27 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Method for determining and optimising the optical path length of a continuous transparent layer or of a structured layer
DE19522188C2 (en) * 1995-06-19 1999-12-02 Optisense Ges Fuer Optische Pr Method and device for determining the thickness and / or the complex refractive index of thin layers and use for controlling coating processes

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3631526A (en) * 1969-11-05 1971-12-28 Brun Sensor Systems Inc Apparatus and methods for eliminating interference effect errors in dual-beam infrared measurements
US3824017A (en) * 1973-03-26 1974-07-16 Ibm Method of determining the thickness of contiguous thin films on a substrate
US3892490A (en) * 1974-03-06 1975-07-01 Minolta Camera Kk Monitoring system for coating a substrate
GB2016678B (en) * 1978-03-10 1982-09-15 Asahi Dow Ltd Infrared multilayer film thickness measuring method and apparatus

Also Published As

Publication number Publication date
JPS59133413A (en) 1984-07-31
GB2133539A (en) 1984-07-25
DE3248091A1 (en) 1984-06-28
GB2133539B (en) 1986-02-19

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee