GB2572771A - Methods for performing microstructure evaluation - Google Patents
Methods for performing microstructure evaluation Download PDFInfo
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- GB2572771A GB2572771A GB1805899.0A GB201805899A GB2572771A GB 2572771 A GB2572771 A GB 2572771A GB 201805899 A GB201805899 A GB 201805899A GB 2572771 A GB2572771 A GB 2572771A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/20—Metals
- G01N33/204—Structure thereof, e.g. crystal structure
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
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Abstract
A method for performing microstructure evaluation on a metallic specimen includes subjecting 102, 106 first and second test specimens having pre-defined amounts of austenite and martensite to microstructure evaluation using the non-destructive electromagnetic thickness gauge, obtaining 104, 108 first and second values from the thickness gauge, the first and second values indicative of the amounts of magnetic induction responses by the first and second test specimen during the microstructure evaluation, and determining 110 first and second correlations between the first and second values and the pre-defined amounts of retained austenite and martensite in the corresponding ones of the first and second test specimens. The method then includes subjecting the metallic specimen to a microstructure evaluation using the non-destructive electromagnetic thickness gauge and determining amounts of austenite and martensite in the metallic specimen based on the determined correlations from evaluation of the first and second test specimens. Another aspect relates to a method of subjecting the specimen to a microstructure evaluation using one of another non-destructive testing method and a destructive testing method (fig.2).
Description
METHODS FOR PERFORMING MICROSTRUCTURE EVALUATION
Technical Field [0001] The present disclosure relates to methods for performing microstructure evaluation. More particularly, the present disclosure relates to methods for performing microstructure evaluation on a metallic specimen using a non-destructive electromagnetic thickness gauge.
Background [0002] Components that are produced with use of Ferrous, or Ferrous based alloys such as steel typically exhibit a microstructure consisting of one or more phases of Iron. For example, cast iron or steel may exhibit a microstructure containing austenite, martensite, and carbides. Depending on specific requirements of an application in which a manufactured component is to be used, it would be desirable to have the manufactured component exhibit a certain microstructure composition. For example, a tensile, ductile, or a shear strength requirement may dictate that the manufactured component exhibit a certain specified percentage composition by volume of martensite.
[0003] Process controls employed during manufacture, for example, in the use of casting, rolling, and/or heat treatment processes may also largely affect microstructure composition of produced components. For example, time and temperature transitions may affect the amounts of martensite and austenite retained in a component that has been produced from casting. It is, therefore, desired to have a microstructure evaluation technique for produced components so that component manufacturers can have greater control on the quality of a produced component as well as the manufacturing processes that may need to be optimized in order to produce components exhibiting a desired microstructure.
[0004] In earlier cases, destructive testing procedures were employed for evaluating microstructure composition of produced components. However, these destructive testing procedures not only required the produced component to be, at least partially, destroyed in order to facilitate an evaluation of its microstructure
-2composition, rather, the process of carrying a destructing testing procedure is often tedious, time consuming, and cost intensive as well.
[0005] Further, a skilled or trained technician may also be required to carry out the destructive testing procedure on the produced component, typically, in a laboratory or another suitable environment. This tedious, time consuming, and cost intensive process of destructively testing produced components that typically also requires a skilled or trained technician may, in turn, cause delay in scenarios where decisions may have to be taken for optimizing production quality control, for example, for making adjustments in one or more parameters of a manufacturing process, or for determining a type of rework that could be required on the produced and now tested component in order for such produced and tested component to be rendered suitable for use in operation. In fact, it is envisioned that in some cases, it may not always be possible to perform one or more types of rework on the produced and tested component as the produced component, once tested under the destructive testing procedure, may, partly, or wholly be subject to some form of destruction i.e., in order to be evaluated for its microstructure composition and would hence, be rendered unfit for rework.
[0006] Furthermore, despite the use of destructive testing procedures, it has been noted that due to the tedious, time consuming, and intensive costs for performing microstructure evaluation of produced components, technicians and manufacturers may tend to employ the destructive testing procedures as sparingly as possible. In fact, owing to the intrinsically destructive nature of any known destructive testing procedure, the destructive testing procedure may, in some cases, be carried out only once per produced component, or in other cases, only on one location for each produced component. In doing so, limited data may be available to technicians and manufacturers of produced components for taking accurate decisions in optimizing one or more aspects relating to production quality control. [0007] Hence, there is a need for a method to perform microstructure evaluation of produced components easily, quickly, and at many locations of the produced component in a non-destructive manner.
-3Summary of the Disclosure [0008] In an aspect of the present disclosure, a method for performing microstructure evaluation on a metallic specimen using a non-destructive electromagnetic thickness gauge is provided. This method includes subjecting a first test specimen, having pre-defined amounts of austenite and martensite, to a microstructure evaluation using the non-destructive electromagnetic thickness gauge. The method includes obtaining, from the non-destructive electromagnetic thickness gauge, a first value indicative of an amount of magnetic induction response by the first test specimen during the microstructure evaluation. The method then includes subjecting a second test specimen, having pre-defined amounts of retained austenite and martensite, to a microstructure evaluation using the non-destructive electromagnetic thickness gauge, and obtaining, from the nondestructive electromagnetic thickness gauge, a second value that is indicative of an amount of magnetic induction response by the second test specimen during the microstructure evaluation. The method then includes determining a correlation between the first and second values with the pre-defined amounts of retained austenite and martensite in corresponding ones of the first and second test specimens respectively. The method includes subjecting the metallic specimen to a microstructure evaluation using the non-destructive electromagnetic thickness gauge and determining amounts of austenite and martensite in the metallic specimen based on the determined correlation between the first and second values with the pre-defined amounts of austenite and martensite in corresponding ones of the first and second test specimens respectively.
[0009] In another aspect of the present disclosure, a method for performing microstructure evaluation on a metallic specimen using a non-destructive electromagnetic thickness gauge is provided. This method includes subjecting the metallic specimen to a microstructure evaluation using a destructive testing method or another non-destructive testing method. The method includes determining amounts of austenite and martensite in the metallic specimen using the destructive testing method or the other non-destructive testing method. The method then includes subjecting the metallic specimen to a microstructure evaluation using the
-4non-destructive electromagnetic thickness gauge. The method further includes obtaining, from the non-destructive electromagnetic thickness gauge, a value that is indicative of an amount of magnetic induction response by the metallic specimen during the microstructure evaluation, and determining a correlation between the value that is indicative of the amount of magnetic induction response by the metallic specimen during the microstructure evaluation with the amounts of austenite and martensite respectively that are determined using one of: the other non-destructive testing method and the destructive testing method. The method then includes subjecting the metallic specimen to a subsequent microstructure evaluation using the non-destructive electromagnetic thickness gauge and determining amounts of austenite and martensite in the metallic specimen based on the determined correlation between the value that is indicative of the amount of magnetic induction response by the metallic specimen during the microstructure evaluation and the amounts of austenite and martensite respectively that have been determined using the destructive testing method or the other non-destructive testing method.
[0010] Other features and aspects of this disclosure will be apparent from the following description and the accompanying drawings.
Brief Description of the Drawings [0011] FIG. 1 is a flowchart depicting a method for performing microstructure evaluation on the metallic specimen using a non-destructive electromagnetic thickness gauge, in accordance with an embodiment of the present disclosure;
[0012] FIG. 2 is a flowchart depicting a method for performing microstructure evaluation on the metallic specimen using the non-destructive electromagnetic thickness gauge, in accordance with yet another embodiment of the present disclosure;
[0013] FIG. 3 is a graphical representation of exemplary microstructure compositions associated with differently produced components shown correlated to corresponding values from the electromagnetic thickness gauge;
-5[0014] FIG. 4 is a graphical representation of average readings from the non-destructive electromagnetic thickness gauge plotted against percentage of austenite that was retained in exemplary microstructure compositions associated with differently produced components;
[0015] FIG. 5 is an exemplary microstructure composition for one of the produced exemplary components;
[0016] FIG. 6 is an exemplary microstructure composition for another of the produced exemplary components;
[0017] FIG. 7 is an exemplary microstructure composition for yet another exemplarily produced component;
[0018] FIG. 8 is a data plot of exemplary readings from the non-destructive electromagnetic thickness gauge for differently produced components, the exemplary readings being taken at 22.5-degree intervals along a generally circular shape of each produced component, and wherein a magnitude of the exemplary readings increases in intensity from a center of the data plot;
[0019] FIG. 9 illustrates a graphical representation showing exemplary maximum readings obtained from the non-destructive electromagnetic thickness gauge for each differently produced component plotted against exemplary averages of the readings obtained from the non-destructive electromagnetic thickness gauge for each differently produced component; and [0020] FIG. 10 is another data plot of exemplary readings obtained from microstructure evaluation of differently produced components using the nondestructive electromagnetic thickness gauge in accordance with yet another embodiment of the present disclosure, the exemplary readings being taken at 22.5degree intervals along a generally circular shape of each differently produced component, and wherein a magnitude of the exemplary readings increases in intensity from a center of the data plot.
Detailed Description [0021] It is hereby expressly noted that references to the use of specific hardware and/or software for accomplishing one or more steps of the methods 100/200 disclosed herein is merely exemplary in nature and hence, would be non
-6limiting of this disclosure. Rather, any suitable hardware and/or software known to persons skilled in the art may be implemented for accomplishing one or more steps of the methods 100/200 disclosed herein.
[0022] Where the terms “non-destructive electromagnetic thickness gauge”, “electromagnetic thickness gauge”, or “thickness gauge” are used, such terms exemplarily refer to hardware and/or software that is embodied as a thickness gauge operating under the principles of magnetic induction, and in one possible configuration, sold under the trademark Elcometer®. Other suitable hardware and/or software may be implemented for use in addition, or as an option to the thickness gauge sold by Elcometer® for performing functions that are consistent with the present disclosure.
[0023] Referring to FIG. 1, a method 100 for performing microstructure evaluation on a metallic specimen using a non-destructive electromagnetic thickness gauge is depicted, in accordance with an embodiment of the present disclosure. As shown, at step 102, the method 100 includes subjecting a first test specimen, having pre-defined amounts of austenite and martensite, to a microstructure evaluation using the non-destructive electromagnetic thickness gauge.
[0024] At step 104, the method 100 further includes obtaining, from the non-destructive electromagnetic thickness gauge, a first value that is indicative of an amount of magnetic induction response by the first test specimen during the microstructure evaluation.
[0025] At step 106, the method 100 further includes subjecting a second test specimen, having pre-defined amounts of retained austenite and martensite, to a microstructure evaluation using the non-destructive electromagnetic thickness gauge [0026] At step 108, the method 100 further includes obtaining, from the non-destructive electromagnetic thickness gauge, a second value that is indicative of an amount of magnetic induction response by the second test specimen during the microstructure evaluation.
-7[0027] At step 110, the method 100 then includes determining a correlation between the first and second values with the pre-defined amounts of retained austenite and martensite in corresponding ones of the first and second test specimens respectively.
[0028] At step 112, the method 100 further includes subjecting the metallic specimen to a microstructure evaluation using the non-destructive electromagnetic thickness gauge.
[0029] At step 114, the method 100 further includes determining amounts of austenite and martensite in the metallic specimen based on the determined correlation between the first and second values with the pre-defined amounts of austenite and martensite in corresponding ones of the first and second test specimens respectively.
[0030] In the method 100, a first correlation may be determined between the first value and the pre-defined amount of retained austenite and martensite in the first test specimen and a second correlation may be determined between the second value and the pre-defined amount of retained austenite and martensite in the second test specimen. This may be done to determine a function that would fit the first and second determined correlations. The function determined from the first and second correlations can be linear, or non-linear in nature and which can be used to improve an accuracy in determining the amounts of austenite and martensite respectively when subsequent microstructure evaluation is being performed on metallic specimens using the non-destructive electromagnetic thickness gauge.
[0031] Although the first and second test specimens are disclosed herein, it may be noted that the method 100 of the present disclosure is not limited to the use of merely two test specimens i.e., the first and second test specimens for determining the correlations and subsequently, the function that would fit the determined correlations. Rather, in actual practice, many more than just two test specimens, for example, 20, 50, 100 or more test specimens would be used for determining the respective correlations such that from the multiple correlations being determined, the function that would fit the determined correlations, if non
-8linear in nature, could be as accurate as possible. It will be appreciated that with the use of a large number of test specimens, the function is subsequently derived from the determined co-relations using the large number of test specimens could have an improved accuracy that could, in turn, help improve an accuracy in determining the amounts of austenite and martensite respectively when subsequent microstructure evaluation is being performed on metallic specimens using the nondestructive electromagnetic thickness gauge.
[0032] Referring to FIG. 2, a method 200 for performing microstructure evaluation on a metallic specimen using a non-destructive electromagnetic thickness gauge is depicted in accordance with another embodiment of the present disclosure.
[0033] As shown, at step 202, the method 200 includes subjecting the metallic specimen to a microstructure evaluation using a destructive testing method or another non-destructive testing method. In one embodiment, the non-destructive testing method disclosed herein may include an X-ray diffraction method. However, it may be noted that the X-ray diffraction method is non-limiting of this disclosure. Other conventional non-destructive testing methods known to persons skilled in the art may be used in lieu of the X-ray diffraction method. The other non-destructive electromagnetic testing techniques may include, but is not limited to, Eddy current, Direct Current Potential Drop (DCPD), Alternating Current Potential Drop (ACPD), and Barkhausen noises explanation to which will be made later herein.
[0034] At step 204, the method 200 further includes determining amounts of austenite and martensite in the metallic specimen using the destructive testing method or the other non-destructive testing method.
[0035] At step 206, the method 200 further includes subjecting the metallic specimen to a microstructure evaluation using the non-destructive electromagnetic thickness gauge.
[0036] At step 208, the method 200 further includes obtaining, from the non-destructive electromagnetic thickness gauge, a value indicative of an amount
-9of magnetic induction response by the metallic specimen during the microstructure evaluation.
[0037] At step 210, the method 200 further includes determining a correlation between the value indicative of the amount of magnetic induction response by the metallic specimen during the microstructure evaluation with the amounts of austenite and martensite respectively that are determined using one of: the other non-destructive testing method and the destructive testing method.
[0038] At step 212, the method 200 further includes subjecting the metallic specimen to a subsequent microstructure evaluation using the non-destructive electromagnetic thickness gauge.
[0039] At step 214, the method 200 further includes determining amounts of austenite and martensite in the metallic specimen based on the determined correlation between the value that is indicative of the amount of magnetic induction response by the metallic specimen during the microstructure evaluation and the amounts of austenite and martensite respectively that have been determined using the destructive testing method or the other non-destructive testing method.
[0040] FIG. 3 is an exemplary graphical representation 300 of microstructure compositions 302-308 of differently produced components shown correlated to corresponding values from the electromagnetic thickness gauge. In the exemplary graphical representation 300, the differently produced components disclosed herein refer to components that are produced using the same alloy composition, for example, White Iron Class-II, however, these components have different microstructure compositions 302-308 owing to differences in the type, extent, or manner of heat treatment processes that have been meted out to each of them.
[0041] As shown, X-axis denotes a percentage of austenite (by volume composition) in each of the produced components and Y-axis denote values that are obtained from the electromagnetic thickness gauge as readings for microstructure compositions 302-308 of the given differently produced components. Referring to FIG. 4, a function between the amount of austenite retained in microstructure specimens and the readings on the electromagnetic
-10thickness gauge, although non-linear in nature as disclosed earlier in one of the foregoing embodiments herein, is proportional as shown by way of the graphical representation 400. FIG. 5 is an enlarged view of the microstructure composition 302 taken from FIG. 3. FIG. 6 is an enlarged view of the microstructure composition 304 taken from FIG. 3. FIG. 7 is an enlarged view of the microstructure composition 306 taken from FIG. 3.
[0042] As shown by way of an example in FIGS. 3 and 5, a microstructure composition 302 is shown against a specific reading on the electromagnetic thickness gauge and that specific reading, upon correlation by any of the methods 100/200 herein, could indicate that the microstructure composition 302 has for example, 19.9% of austenite retained in the microstructure composition 302. It is also possible to interpret and hence, express the reading on the electromagnetic thickness gauge in terms of an amount of martensite contained in each microstructure composition. For example, the specific reading on the electromagnetic thickness gauge, upon correlation by any of the methods 100/200 herein, would indicate that the microstructure composition 302 has 58% of martensite taking into consideration that the evaluation of the microstructure composition 302 would also accounts for a carbide volume fraction therein, for example, approximately to about 22.1%, and also for a remainder of the volume that could contain other trace elements and that which may have been included in the alloy composition for forming the produced component.
[0043] Similarly, as shown by way of an example in FIGS. 3 and 6, a microstructure composition 304 is shown against another specific reading on the electromagnetic thickness gauge and that other specific reading, upon correlation by any of the methods 100/200 herein, could indicate that the microstructure composition 304 has, for example, 34.8% of austenite retained in the microstructure composition 304, 43.9% of martensite, and 21.3% of carbides respectively.
[0044] Similarly, as shown by way of an example in FIGS. 3 and 7, a microstructure composition 306 is shown against yet another specific reading on the electromagnetic thickness gauge and that yet another specific reading, upon
-11correlation by any of the methods 100/200 herein, could indicate that the microstructure composition 306 has, for example, 49.7% of austenite retained in the microstructure composition 306, 27.6% of martensite, and 22.7% of carbides respectively.
[0045] In reference to the microstructure compositions of differently produced components, such as the microstructure compositions 302-308 shown in FIG. 3 and through FIGS. 5 to 7 in which some of the microstructure compositions
i.e., 302-306 are enlarged and hence, best shown in FIGS. 5 to 7, it should be noted that the amount of retained austenite is essentially the untransformed phase of austenite originally present in the alloy composition of the component. During heat treatment processes, if one or more parameters, for example, time, temperature, cooling rate, or other parameters known to persons skilled in the art were insufficient to destabilize the originally present austenite, then such austenite is not likely to transform into martensite and therefore, such untransformed austenite has been referred to by the terms “retained austenite” herein.
[0046] FIG. 8 is a data plot 800 of exemplary readings from the nondestructive electromagnetic thickness gauge for differently produced components. These differently produced components may include, for example, components that have been subject to variations in the heat-treatment processes being meted to out to each of them. As shown, the exemplary readings have been taken at 22.5degree intervals on a generally circular shape of each differently produced component.
[0047] It may be noted that in this data plot 800, a magnitude of the exemplary readings increases in intensity from a center of the data plot 800. This implies that, one of the produced components, for example, the produced component that has been subject to the heat treatment process 1 has values of a maximum thickness gauge reading and an average thickness gauge reading that are lower than those associated with another of the produced components, for example, the produced component that is being subject to heat treatment process 3. It is hereby envisioned that various requirements of an application in which a produced component is likely to be used would dictate how within how much limits should
-12the maximum and average thickness gauge readings be for a produced component so that the produced component may function, as intended, when implemented for use in operation.
[0048] Such limits of the maximum and average thickness gauge readings many manifest themselves as thresholds, and referring to FIG. 9, a graphical representation 900 showing exemplary maximum readings obtained from the nondestructive electromagnetic thickness gauge for differently produced components plotted against exemplary averages of the readings obtained from the nondestructive electromagnetic thickness gauge for each differently produced component is depicted. In the graphical representation of FIG. 9, it may be noted that the threshold associated with the maximum reading of magnetic induction response from the non-destructive electromagnetic thickness gauge is denoted by Ti, while the threshold associated with the average of readings of magnetic induction response from the non-destructive electromagnetic thickness gauge is denoted by T2. Each individual solid circle in FIG. 10 represents a differently produced component that, upon evaluation by the non-destructive electromagnetic thickness gauge, has yielded different values of maximum magnetic induction responses and an average of the readings of magnetic induction response along the produced component. The components denoted by hollow circles have shown undesirable performance when used in a given application while the components denoted by solid circles have shown acceptable performance. Therefore, during quality inspection procedures, these thresholds Τι, T2, once established based on application requirements, can be used to implement a pass or fail condition so as to allow or reject a particular produced component for field use.
[0049] Although the data plot 800, and the graphical representation 900 have been disclosed herein for use in allowing or rejecting produced components during a quality control procedure, it may be noted that the implementation of the methods 100/200 are not limited thereto. Rather, it will be appreciated that the methods 100/200 can be implemented to help evaluate micro structure compositions of a produced component at any time of its lifecycle. In one example, a produced component may be tested immediately after being manufactured to
-13evaluate and/or optimize various aspects in the process of manufacture itself. For instance, upon evaluating a produced component for its microstructure composition, a heat-treatment process could be evaluated and optimized for its efficiency in transforming austenite into martensite. In another example, a produced component, already in use, may be temporarily withdrawn from its use in operation and subject to its microstructure evaluation using the non-destructive electromagnetic thickness gauge disclosed herein. This may be done to help technicians and manufacturers understand a manner of loading on the component when in use, and if the used component has failed to perform as intended, then also identify reasons that may have led to its failure.
[0050] FIG. 10 is another data plot 1000 of exemplary readings obtained from microstructure evaluation of differently produced components using the nondestructive electromagnetic thickness gauge in accordance with yet another embodiment of the present disclosure. The differently produced components disclosed in conjunction with the data plot 1000 of FIG. 10 may include, for example, components that have been subj ect to variations when cast. For example, a mold cavity in which one produced component was present in a group or stacked mold offering several cavities for casting several components at once may exhibit a different cast microstructure to that associated with another one of the produced components that was taken from a different mold cavity.
[0051] As shown by way of the data plot 1000 of FIG. 10, the thickness gauge reading is taken at 22.5-degree intervals individually along each produced component, i.e., along produced component 1, produced component 2, produced component 3, and produced component 4. It may be noted that a magnitude of the exemplary readings increases in intensity from a center of the data plot 1000. A variation in the thickness gauge readings exhibited along each produced component also denotes a variation in the microstructure composition of a corresponding produced component. The variations in the thickness gauge reading along each produced component may help manufacturers to evaluate microstructure composition at various locations of each produced component, and therefore, optimize process controls for improving component characteristics.
-14[0052] The data plot 1000 of FIG. 10 helps to identify various aspects of each differently produced component, and the conditions to which each differently produced component was subject to during manufacture, for example, when the different components were taken from different mold cavities but cast in the same stacked mold. For instance, upon contemplation of the data plot 1000, it is evident that a gate was located at a position of about 175 degrees from a reference point on the generally circular shape of each differently produced component. The evaluation of the data plot 1000 can also help manufacturers identify trends and patterns in the readings associated with the individual produced components, and optimize one or more aspects of the manufacturing process, for example, the casting process.
[0053] All numerical terms, such as, but not limited to, “first”, “second”, or any other ordinary and/or numerical terms, should also be taken only as identifiers, to assist the reader’s understanding of the various specimens of the present disclosure, and may not create any limitations, particularly as to the order, or preference, of any specimen relative to or over another specimen.
[0054] It is to be understood that individual steps shown or described for one method may be combined with individual steps shown or described for another method. The above described implementation does not in any way limit the scope of the present disclosure. It should be noted here that the steps 102 to 114, or 202 to 214 are only illustrative and other alternatives can also be provided where one or more steps are added, one or more steps are removed, or one or more steps are provided in a different sequence without departing from the scope of the claims herein.
Industrial Applicability [0055] Embodiments of the present disclosure have applicability for use in facilitating quality control personnel use an existing electromagnetic thickness gauge to perform microstructure evaluation on produced components. Therefore, embodiments of the present disclosure, when implemented, can help quality control personnel perform microstructure evaluation on produced components in an easy, quick, and non-destructive manner. Further, upon performing
-15microstructure evaluations using the embodiments disclosed herein, manufactures can also quickly optimize one or more process controls that may be required in obtaining a desired microstructure composition in subsequently produced components.
[0056] While aspects of the present disclosure have been particularly shown and described with reference to the embodiments above, it will be understood by those skilled in the art that various additional embodiments may be contemplated by the modification of the disclosed methods and processes without departing from the spirit and scope of what is disclosed. Such embodiments should be understood to fall within the scope of the present disclosure as determined based upon the claims and any equivalents thereof.
Claims (3)
1. A method for performing microstructure evaluation on a metallic specimen using a non-destructive electromagnetic thickness gauge, the method comprising:
subjecting a first test specimen, having pre-defined amounts of austenite and martensite, to a microstructure evaluation using the nondestructive electromagnetic thickness gauge;
obtaining, from the non-destructive electromagnetic thickness gauge, a first value indicative of an amount of magnetic induction response by the first test specimen during the microstructure evaluation;
subjecting a second test specimen, having pre-defined amounts of retained austenite and martensite, to a microstructure evaluation using the non-destructive electromagnetic thickness gauge;
obtaining, from the non-destructive electromagnetic thickness gauge, a second value indicative of an amount of magnetic induction response by the second test specimen during the microstructure evaluation;
determining a correlation between the first and second values with the pre-defined amounts of retained austenite and martensite in corresponding ones of the first and second test specimens respectively;
subjecting the metallic specimen to a microstructure evaluation using the non-destructive electromagnetic thickness gauge; and determining amounts of austenite and martensite in the metallic specimen based on the determined correlation between the first and second values with the pre-defined amounts of austenite and martensite in corresponding ones of the first and second test specimens respectively.
2. A method for performing microstructure evaluation on a metallic specimen using a non-destructive electromagnetic thickness gauge, the method comprising:
subjecting the metallic specimen to a microstructure evaluation using one of: another non-destructive testing method and a destructive testing method;
determining amounts of austenite and martensite in the metallic specimen using one of: the other non-destructive testing method and the destructive testing method;
subjecting the metallic specimen to a microstructure evaluation using the non-destructive electromagnetic thickness gauge;
obtaining, from the non-destructive electromagnetic thickness gauge, a value indicative of an amount of magnetic induction response by the metallic specimen during the microstructure evaluation;
determining a correlation between the value indicative of the amount of magnetic induction response by the metallic specimen during the microstructure evaluation with the amounts of austenite and martensite respectively determined using one of: the other non-destructive testing method and the destructive testing method;
subjecting the metallic specimen to a subsequent microstructure evaluation using the non-destructive electromagnetic thickness gauge; and determining amounts of austenite and martensite in the metallic specimen based on the determined correlation between the value that is indicative of the amount of magnetic induction response by the metallic specimen during the microstructure evaluation and the amounts of austenite and martensite respectively in the metallic specimen that are determined using one of: the other non-destructive testing method and the destructive testing method.
3. The method of claim 2, wherein the other non-destructive testing method includes an X-ray diffraction method, Eddy current method, Direct Current
-18Potential Drop (DCPD) method, Alternating Current Potential Drop (ACPD) method, and Barkhausen noise method.
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JPH06313761A (en) * | 1991-01-09 | 1994-11-08 | Nisshin Steel Co Ltd | On-line measuring method of amount of martensite in cold rolling of quasi-stable austenite system stainless steel band |
DE19536162A1 (en) * | 1995-09-28 | 1997-04-03 | Rosen Engineering Gmbh H | Non-destructive testing for thickness of steel tubes |
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2018
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Patent Citations (2)
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JPH06313761A (en) * | 1991-01-09 | 1994-11-08 | Nisshin Steel Co Ltd | On-line measuring method of amount of martensite in cold rolling of quasi-stable austenite system stainless steel band |
DE19536162A1 (en) * | 1995-09-28 | 1997-04-03 | Rosen Engineering Gmbh H | Non-destructive testing for thickness of steel tubes |
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