GB2560021B - Self-configuring electronic driver for remote instrumentation - Google Patents

Self-configuring electronic driver for remote instrumentation

Info

Publication number
GB2560021B
GB2560021B GB1703127.9A GB201703127A GB2560021B GB 2560021 B GB2560021 B GB 2560021B GB 201703127 A GB201703127 A GB 201703127A GB 2560021 B GB2560021 B GB 2560021B
Authority
GB
United Kingdom
Prior art keywords
self
electronic driver
configuring electronic
remote instrumentation
instrumentation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
GB1703127.9A
Other versions
GB2560021A (en
GB201703127D0 (en
Inventor
David Todman Andrew
Laming Graham
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
LONDON ELECTRONICS Ltd
Original Assignee
LONDON ELECTRONICS Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by LONDON ELECTRONICS Ltd filed Critical LONDON ELECTRONICS Ltd
Priority to GB1703127.9A priority Critical patent/GB2560021B/en
Publication of GB201703127D0 publication Critical patent/GB201703127D0/en
Publication of GB2560021A publication Critical patent/GB2560021A/en
Application granted granted Critical
Publication of GB2560021B publication Critical patent/GB2560021B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
    • G01D3/032—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure affecting incoming signal, e.g. by averaging; gating undesired signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
    • G01R17/10—AC or DC measuring bridges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K15/00—Testing or calibrating of thermometers
    • G01K15/005—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/02—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using thermoelectric elements, e.g. thermocouples
    • G01K7/10—Arrangements for compensating for auxiliary variables, e.g. length of lead
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
GB1703127.9A 2017-02-27 2017-02-27 Self-configuring electronic driver for remote instrumentation Active GB2560021B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB1703127.9A GB2560021B (en) 2017-02-27 2017-02-27 Self-configuring electronic driver for remote instrumentation

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB1703127.9A GB2560021B (en) 2017-02-27 2017-02-27 Self-configuring electronic driver for remote instrumentation

Publications (3)

Publication Number Publication Date
GB201703127D0 GB201703127D0 (en) 2017-04-12
GB2560021A GB2560021A (en) 2018-08-29
GB2560021B true GB2560021B (en) 2019-12-04

Family

ID=58544178

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1703127.9A Active GB2560021B (en) 2017-02-27 2017-02-27 Self-configuring electronic driver for remote instrumentation

Country Status (1)

Country Link
GB (1) GB2560021B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111721445B (en) * 2020-06-16 2022-03-11 西门子传感器与通讯有限公司 Method for identifying type of sensor connected with transmitter and transmitter
DE102021130852B3 (en) * 2021-11-24 2023-02-16 Elmos Semiconductor Se Identification of the wetting of NTC temperature measurement resistors in safety-related devices

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110248699A1 (en) * 2010-04-13 2011-10-13 Ching-Tsan Lee Calibration apparatus and method thereof, multi-channel driving circuit and current balancing method
US20140266315A1 (en) * 2013-03-14 2014-09-18 Taiwan Semiconductor Manufacturing Co., Ltd. Voltage threshold calibration techniques for level detectors

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110248699A1 (en) * 2010-04-13 2011-10-13 Ching-Tsan Lee Calibration apparatus and method thereof, multi-channel driving circuit and current balancing method
US20140266315A1 (en) * 2013-03-14 2014-09-18 Taiwan Semiconductor Manufacturing Co., Ltd. Voltage threshold calibration techniques for level detectors

Also Published As

Publication number Publication date
GB2560021A (en) 2018-08-29
GB201703127D0 (en) 2017-04-12

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