GB2559272B - Electronic device and display device including the same - Google Patents

Electronic device and display device including the same Download PDF

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Publication number
GB2559272B
GB2559272B GB1721231.7A GB201721231A GB2559272B GB 2559272 B GB2559272 B GB 2559272B GB 201721231 A GB201721231 A GB 201721231A GB 2559272 B GB2559272 B GB 2559272B
Authority
GB
United Kingdom
Prior art keywords
same
display device
electronic device
device including
electronic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
GB1721231.7A
Other versions
GB2559272A (en
GB201721231D0 (en
Inventor
Ahn Younseok
Bae Sunghyun
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
LG Display Co Ltd
Original Assignee
LG Display Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by LG Display Co Ltd filed Critical LG Display Co Ltd
Publication of GB201721231D0 publication Critical patent/GB201721231D0/en
Publication of GB2559272A publication Critical patent/GB2559272A/en
Application granted granted Critical
Publication of GB2559272B publication Critical patent/GB2559272B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/34Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3418Disturbance prevention or evaluation; Refreshing of disturbed memory data
    • G11C16/3427Circuits or methods to prevent or reduce disturbance of the state of a memory cell when neighbouring cells are read or written
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/321Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/20Adhesives in the form of films or foils characterised by their carriers
    • C09J7/21Paper; Textile fabrics
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J9/00Adhesives characterised by their physical nature or the effects produced, e.g. glue sticks
    • C09J9/02Electrically-conducting adhesives
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/1345Conductors connecting electrodes to cell terminals
    • G02F1/13452Conductors connecting driver circuitry and terminals of panels
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5621Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
    • G11C11/5628Programming or writing circuits; Data input circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5621Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
    • G11C11/5642Sensing or reading circuits; Data output circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/10Programming or data input circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/26Sensing or reading circuits; Data output circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/34Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/349Arrangements for evaluating degradation, retention or wearout, e.g. by counting erase cycles
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50Marginal testing, e.g. race, voltage or current testing
    • G11C29/50004Marginal testing, e.g. race, voltage or current testing of threshold voltage
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50Marginal testing, e.g. race, voltage or current testing
    • G11C29/50016Marginal testing, e.g. race, voltage or current testing of retention
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L24/28Structure, shape, material or disposition of the layer connectors prior to the connecting process
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L24/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
GB1721231.7A 2016-02-16 2017-12-19 Electronic device and display device including the same Active GB2559272B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020160017818A KR101751407B1 (en) 2016-02-16 2016-02-16 Analog information based emulation method for investigating reliability of flash memory and apparatus of the same

Publications (3)

Publication Number Publication Date
GB201721231D0 GB201721231D0 (en) 2018-01-31
GB2559272A GB2559272A (en) 2018-08-01
GB2559272B true GB2559272B (en) 2020-04-29

Family

ID=59354638

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1721231.7A Active GB2559272B (en) 2016-02-16 2017-12-19 Electronic device and display device including the same

Country Status (3)

Country Link
KR (1) KR101751407B1 (en)
GB (1) GB2559272B (en)
WO (1) WO2017142185A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109684150B (en) * 2018-12-24 2022-04-26 北京得瑞领新科技有限公司 Performance test system, test method and simulation platform of storage particle controller

Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0147856A2 (en) * 1983-12-27 1985-07-10 Sony Corporation Electrically conductive adhesive sheet
JPS62115678A (en) * 1985-11-13 1987-05-27 信越ポリマ−株式会社 Connector
EP0256756A2 (en) * 1986-08-05 1988-02-24 Minnesota Mining And Manufacturing Company Electrically conductive tape
US6617521B1 (en) * 1998-12-21 2003-09-09 Seiko Epson Corporation Circuit board and display device using the same and electronic equipment
US20060163724A1 (en) * 2005-01-25 2006-07-27 Samsung Electronics Co., Ltd. Display apparatus
EP1895585A2 (en) * 2006-09-01 2008-03-05 Samsung Electronics Co., Ltd. Chip film package and display panel assembly having the same
US20080078574A1 (en) * 2006-10-02 2008-04-03 Ha-Yun Kang Gasket and display apparatus having the same
US20080089018A1 (en) * 2006-09-22 2008-04-17 Jae-Kook Kim Gasket and Display Apparatus Having the Same
US20110176074A1 (en) * 2010-01-20 2011-07-21 Zhang Ge Twisted nematic (tn) based 3d display system and method
US20150160467A1 (en) * 2013-12-11 2015-06-11 Lg Display Co., Ltd. Switchable lens device and 2- and 3-dimensional image display device using the same
KR20160039101A (en) * 2014-09-30 2016-04-08 엘지디스플레이 주식회사 Switchable polarization lens, the method of manufacturing the same, and 2-dimensional and 3-dimensional image display device using the same
KR20160059059A (en) * 2014-11-17 2016-05-26 (주)유니즌이엠씨 Environment-friendly double-sided adhesive tape preventing oxidation of adherend

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2907808B1 (en) * 1998-03-31 1999-06-21 三洋電機株式会社 Flash memory emulation device and debug system using the same
PL363945A1 (en) 2003-12-08 2005-06-13 Advanced Digital Broadcast Polska Spółka z o.o. Software method for eeprom memory emulation
JP4647446B2 (en) 2005-09-20 2011-03-09 富士通株式会社 Semiconductor memory device
US7515456B2 (en) * 2006-09-11 2009-04-07 Infineon Technologies Ag Memory circuit, a dynamic random access memory, a system comprising a memory and a floating point unit and a method for storing digital data
JP2008077176A (en) * 2006-09-19 2008-04-03 Seiko Epson Corp Emulation system and emulation method
US7719901B2 (en) * 2007-06-05 2010-05-18 Micron Technology, Inc. Solid state memory utilizing analog communication of data values

Patent Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0147856A2 (en) * 1983-12-27 1985-07-10 Sony Corporation Electrically conductive adhesive sheet
JPS62115678A (en) * 1985-11-13 1987-05-27 信越ポリマ−株式会社 Connector
EP0256756A2 (en) * 1986-08-05 1988-02-24 Minnesota Mining And Manufacturing Company Electrically conductive tape
US6617521B1 (en) * 1998-12-21 2003-09-09 Seiko Epson Corporation Circuit board and display device using the same and electronic equipment
US20060163724A1 (en) * 2005-01-25 2006-07-27 Samsung Electronics Co., Ltd. Display apparatus
EP1895585A2 (en) * 2006-09-01 2008-03-05 Samsung Electronics Co., Ltd. Chip film package and display panel assembly having the same
US20080089018A1 (en) * 2006-09-22 2008-04-17 Jae-Kook Kim Gasket and Display Apparatus Having the Same
US20080078574A1 (en) * 2006-10-02 2008-04-03 Ha-Yun Kang Gasket and display apparatus having the same
US20110176074A1 (en) * 2010-01-20 2011-07-21 Zhang Ge Twisted nematic (tn) based 3d display system and method
US20150160467A1 (en) * 2013-12-11 2015-06-11 Lg Display Co., Ltd. Switchable lens device and 2- and 3-dimensional image display device using the same
KR20160039101A (en) * 2014-09-30 2016-04-08 엘지디스플레이 주식회사 Switchable polarization lens, the method of manufacturing the same, and 2-dimensional and 3-dimensional image display device using the same
KR20160059059A (en) * 2014-11-17 2016-05-26 (주)유니즌이엠씨 Environment-friendly double-sided adhesive tape preventing oxidation of adherend

Also Published As

Publication number Publication date
KR101751407B1 (en) 2017-07-11
WO2017142185A1 (en) 2017-08-24
GB2559272A (en) 2018-08-01
GB201721231D0 (en) 2018-01-31

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