GB2507350B - Electrical appliance tester and method of testing an electrical appliance - Google Patents

Electrical appliance tester and method of testing an electrical appliance

Info

Publication number
GB2507350B
GB2507350B GB1219428.8A GB201219428A GB2507350B GB 2507350 B GB2507350 B GB 2507350B GB 201219428 A GB201219428 A GB 201219428A GB 2507350 B GB2507350 B GB 2507350B
Authority
GB
United Kingdom
Prior art keywords
electrical appliance
testing
tester
electrical
appliance tester
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
GB1219428.8A
Other versions
GB2507350A (en
GB201219428D0 (en
Inventor
Anthony Barker
Stephen Geoffrey Butler Rudd
Andrew David Teasdale
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SEAWARD ELECTRONICS Ltd
Original Assignee
SEAWARD ELECTRONICS Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SEAWARD ELECTRONICS Ltd filed Critical SEAWARD ELECTRONICS Ltd
Priority to GB1219428.8A priority Critical patent/GB2507350B/en
Publication of GB201219428D0 publication Critical patent/GB201219428D0/en
Publication of GB2507350A publication Critical patent/GB2507350A/en
Application granted granted Critical
Publication of GB2507350B publication Critical patent/GB2507350B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2825—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere in household appliances or professional audio/video equipment
GB1219428.8A 2012-10-29 2012-10-29 Electrical appliance tester and method of testing an electrical appliance Active GB2507350B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB1219428.8A GB2507350B (en) 2012-10-29 2012-10-29 Electrical appliance tester and method of testing an electrical appliance

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB1219428.8A GB2507350B (en) 2012-10-29 2012-10-29 Electrical appliance tester and method of testing an electrical appliance

Publications (3)

Publication Number Publication Date
GB201219428D0 GB201219428D0 (en) 2012-12-12
GB2507350A GB2507350A (en) 2014-04-30
GB2507350B true GB2507350B (en) 2015-08-05

Family

ID=47358812

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1219428.8A Active GB2507350B (en) 2012-10-29 2012-10-29 Electrical appliance tester and method of testing an electrical appliance

Country Status (1)

Country Link
GB (1) GB2507350B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7020310B2 (en) * 2018-06-14 2022-02-16 横河電機株式会社 Test information management device, test information management method, test information management program, and recording medium

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201812175U (en) * 2010-07-08 2011-04-27 西安安路信铁路技术有限公司 Handheld operation test terminal for internal standardized operation specification program
CN102323465A (en) * 2011-06-13 2012-01-18 安徽省电力公司安庆供电公司 Pincerlike tabular form is maked an inspection tour photorecorder
EP2740156A2 (en) * 2011-08-03 2014-06-11 Fluke Corporation Maintenance management systems and methods

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201812175U (en) * 2010-07-08 2011-04-27 西安安路信铁路技术有限公司 Handheld operation test terminal for internal standardized operation specification program
CN102323465A (en) * 2011-06-13 2012-01-18 安徽省电力公司安庆供电公司 Pincerlike tabular form is maked an inspection tour photorecorder
EP2740156A2 (en) * 2011-08-03 2014-06-11 Fluke Corporation Maintenance management systems and methods

Also Published As

Publication number Publication date
GB2507350A (en) 2014-04-30
GB201219428D0 (en) 2012-12-12

Similar Documents

Publication Publication Date Title
TWI563275B (en) Automated test equipment and testing methods
SG11201406561XA (en) Test probe assembly and related methods
PL2676606T3 (en) Quick test device and method
PL2994736T3 (en) Leak test assembly and leak testing method
GB201520857D0 (en) Automated generation of scripted and manual test cases
EP2839280A4 (en) Device for performing an enzyme-based diagnostic test and methods for use thereof
ZA201503108B (en) Method and apparatus for testing utility power devices
SG11201705658WA (en) Testing and monitoring of an electrical connection
EP2883144A4 (en) Hit testing method and apparatus
PL2743712T3 (en) Testing device and method of testing
ZA201404766B (en) Device for measuring electrical current and method of manufacturing the same
IL226984A0 (en) Device and method for an interferometring measuring of an object
HK1202927A1 (en) Test system and method for testing high-voltage technology devices
SG11201406969SA (en) Test probe and machining method thereof
PL2771662T3 (en) Leak test method and leak test apparatus
HK1186877A1 (en) Concurrent testing method and testing server
EP2671287A4 (en) Method of providing an electrical connection arrangement and an electrical connection arrangement
EP2784679A4 (en) Test equipment and test method
PL2932282T3 (en) Circuit assembly and method for producing a test voltage, and testing device for determining a loss factor, which testing device contains said circuit assembly
EP2864753A4 (en) Emissions measurement equipment and method
SG2013075825A (en) Ground contact of an integrated circuit testing apparatus
GB201309302D0 (en) Method and test enviroment for testing an integrated circuit
PL2679978T3 (en) Sample testing apparatus and method
GB201304422D0 (en) Test and Method Apparatus
SG11201500102PA (en) Integrity testing apparatus and related methods