GB2482626A

GB2482626A - Photodetector for computer tomography imaging

Info

Publication number: GB2482626A
Application number: GB201119260A
Authority: GB
Inventors: Fan Ji; Mikko Juntunen; Iiro Hietanen
Original assignee: Detection Technology Oy
Current assignee: Detection Technology Oy
Priority date: 2011-11-08
Filing date: 2011-11-08
Publication date: 2012-02-08
Anticipated expiration: 2031-11-08
Also published as: GB2482626B; GB201119260D0

Abstract

The photodetector comprises a substrate 30 including at least one photodiode, the photodetector having a first active area 32 on a first surface of the substrate and a second active area 40 on a second surface of the substrate, wherein the photodetector is provided with a conductive via 58 electrically isolated from the substrate, said conductive via extending from the first surface of the substrate to the second surface of the substrate for connecting the first active area to the second surface of the substrate, and having an opening of a first width at the first surface and an opening of a second width at the second surface, the second width being greater than the first width, the second surface providing electrical connections for the first and second active areas of the photodetector.

Description

PHOTODETECTOR FOR IMAGING SYSTEM

Field of the Invention

The present invention relates to semiconductor devices having active areas formed on both sides of a substrate, and particularly but not exclusively to photo-detectors for use in imaging systems.

Background of the Invention

Photo-detectors are used in imaging systems for medical, security and industrial applications. One particular medical application of photo-detectors is in computed tomography (CT) systems.

In a typical CT system, an X-ray source with a fan-shaped X-ray beam and a two-dimensional radiation detector array are assembled on a mechanical support structure, known as a gantry. In use, the gantry is rotated around an object to be imaged in order to collect X-ray attenuation data from a constantly changing angle with respect to the object. The plane of the gantry rotation is known as an imaging plane, and it is typically defined to be the x-y plane of the coordinate system in a CT system. In addition, the gantry (or more typically the object) is moved slowly along the z-axis of the system in order to collect x-ray attenuation data for a required length of the object. Examples of CT systems are discussed in US Patent Nos. 6,144,718 and 6,173,031.

The radiation detectors of current state of the art CT systems consist of a two-dimensional array of rare earth metal based scintillators and a corresponding two-dimensional array of silicon photodiodes. Both the scintillator crystals and the photodiodes are manufactured in two-dimensional arrays, which are then optically coupled to one another during detector manufacturing.

A typical detector array is shown in Figure 1. A typical detector consists of an array of 16 rows and 16 columns of individual detector elements, i.e. 256 elements in total. Columns are organised in the z direction. The construction of the detector is well-known in the art. The array of detectors is generally illustrated in Figure 1 by reference numeral 2. The z direction or z-axis is also shown in Figure 1. The elements in rows are in the imaging plane, and produce sets of data known as slices'. In a medical CT machine, for example, each slice image corresponds to a two-dimensional X-ray image of a thin slice of a human body as seen in the direction of the body axis and the machine z-axis.

In CT imaging systems, the size of the detector in the imaging plane is increased by placing individual detector arrays, such as the array shown in Figure 1, adjacent to each other to thereby increase the size of the detector in the imaging plane. An edge 4 of the detector of Figure 1 may be placed alongside a corresponding edge of a corresponding detector array, and thereby a larger area can be built up.

A key trend in the CT industry is to build CT machines with more detector elements in order to collect more X-ray attenuation data for each gantry rotation and therefore to speed up the measurements, to improve the accuracy of the measurements, and to decrease patient radiation dose in medical applications. An increase in the number of detector elements similarly may have advantages in other imaging applications, and is not restricted to medical or CT systems.

In CT detector constructions, a major limiting factor in providing more detector elements is the need to readout the electrical signals from the individual photo-detectors of the detector array. In the current art, the readout of these signals is facilitated by manufacturing very narrow metal lines (typically 5 to 20 Jtm) on top of the photo-detector chip, between the active photo-detector elements. A single metal line carries the signal of one photo-detector to the edge of the photo-detector chip, in the z direction, to an area which is specially reserved for the purpose of connecting the signals from the photo-detectors by wire bonding to a substrate placed beneath the photo-detector chip or to a multiplexing or signal processing ASIC chip. Using this method, there is a physical limitation on the size of a photo-detector array that may be manufactured. The number of electrical elements at the chip edge is limited, and this limits the number of photo-detector elements which can be connected. The detector cannot get larger in the z-direction in particular.

This is illustrated by Figure 1. The photo-detector array 2 is provided with an area 6 and 8 either side of the array in the z direction, which areas provide for connection to a respective set of electrical wires, 10 and 12. The signals from the photo-detector array may be multiplexed or processed in integrated electronics chips or ASIC5 located in areas 6 and 8 before the signals are connected to electrical wires, 10 and 12. Because of the need to accommodate the physical wires and their connections, the number of photo-detectors in an array is limited.

In particular, it is not possible toadd further photo-detectors in the z direction. The physical wires 10 and 12 prevent any expansion of the photo-detector array in the z direction, such that additional photo-detector arrays cannot be added in the z direction. That is, although photo-detectors can be joined together side-by-side, in the horizontal direction in Figure 1, they cannot be joined top-to-bottom, in the vertical direction. This is because of the need to connect the wires 10 and 12 at the top and bottom.

A photo-detector with the possibility of expansion in the z direction is known as a tileabl& detector. In order to provide a tileable detector, it is necessary to make the electrical connections to each photo-detector without wiring the photodetectors to the photo-detector chip edge. If this can be achieved, there is no limit to the growth of the photo-detector array and consequently the number of photo-detector elements.

One solution to the problem of achieving a tileable detector is suggested in European Patent No. 1525623 in the name of Detection Technology. This document discloses a technique in which the connections for the anode and cathode of a photodiode device are provided on a single side of a substrate. This is achieved by forming a conductive via through the substrate and adjacent the photodetector device, for contacting an active area on one surface of the substrate to the other surface of the substrate.

Embodiments of the present invention aim to address one or more of the above problems and to provide an improved photodetector array.

Summary of the Invention

In one aspect the invention provides a substrate according to claim 1. In another aspect the invention provides a method according to claim 13.

The substrate may include at least one photodetector, the photodetector having a first active area on a first surface of the substrate and a second active area on a second surface of the substrate, wherein the photodetector is provided with a conductive via electrically isolated from the substrate, said conductive via extending through the photodetector from the first surface of the substrate to the second surface of the substrate for connecting the first active area to the second surface of the substrate, the second surface providing electrical connections for the first and second active areas of the photodetector.

The photodetector may be a photodetector device. The first and second surface may be on opposite sides of the substrate.

A photodetector may include a substrate, the photodetector having a first active area on a first surface of the substrate and a second active area on a second surface of the substrate, wherein the photodetector is provided with a conductive via electrically isolated from the substrate, said conductive via extending through the photodetector from the first surface of the substrate to the second surface of the substrate for connecting the first active area to the second surface of the substrate, the second surface providing electrical connections for the first and second active areas of the photodetector.

Said conductive via preferably extends through the first active area.

Said conductive via is preferably electrically isolated from the substrate.

Said conductive via preferably comprises polysilicon. The polysilicon preferably fills the conductive via.

There is preferably provided a further conductive element on the second side of the substrate connected to the conductive via. The further conductive element on the second side of the substrate is preferably for making an off-chip connection to the first active area via the conductive via. The further conductive element is preferably an aluminium contact element.

There is preferably provided a further conductive element on the second side of the substrate connected to the second active area. The further conductive element on the second side of the substrate is preferably for making an off-chip connection to the second active area. The further conductive element is preferably an aluminium contact element.

The first active area is preferably an anode. The second active area is preferably a cathode.

There may be provided a plurality of photodetectors and a respective plurality of conductive vias for connecting a respective plurality of first active areas on the first surface of the substrate to the second surface of the substrate. The plurality of photodetectors are preferably formed as an array.

The photodetectors are preferably photodiodes. The photodetector is preferably a photodiode of a medical imaging system. The medical imaging system is preferably a computed tomography system.

A substrate may include a plurality of photodetectors, each photodetector of the plurality having an active area on a first surface of the substrate and a further active area on the second surface of the substrate, wherein each photodetector of the plurality is provided with a conductive via electrically isolated from the substrate, said via extending through the photodetector from the first surface of the substrate to the second surface of the substrate for connecting the active area to the second surface of the substrate, the second surface providing electrical connections for the first and second active areas of the plurality of photodetectors.

A photo-detector array including a plurality of sub-arrays of photo-detectors preferably includes such a substrate, wherein the plurality of said sub-arrays of photo-detectors are placed adjacent to each other in a matrix to form the photo-detector array.

The matrix preferably extends in two directions.

An imaging system preferably comprises: a radiation detector including a photo detector array as defined, a radiation source facing the radiation detector, and means for controlling the radiation detector and the radiation source.

The radiation source may be an X-ray tube equipped with a high-voltage generator.

The radiation detector and the radiation source may be radially mounted in a cylindrical scanning structure.

The means for controlling may comprise a computer system.

A method of manufacturing a photodetector device may comprise: forming a first active area of the photodetector device on a first surface of a substrate; forming a second active area on the second surface of the substrate; forming a conductive via electrically isolated from the substrate through the photodetector device from the first surface of the substrate to the second surface of the substrate; and connecting the first active area to the conductive via such that the first active area is connected to the second surface of the substrate.

The conductive via may preferably be formed to extend through the first active area.

The method may further comprise the step of electrically isolating the conductive via from the substrate.

The method may further comprise the step of providing a further conductive element connected between the first active area of the device and the conductive via.

The method may further comprise the step of providing a further conductive element on the second side of the substrate connected to the conductive via. The further conductive element may be a contact pad. The further conductive element on the second side of the substrate is preferably provided for making an off-chip connection to the first active area via the conductive via.

The method may further comprise the step of providing a further conductive element on the second side of the substrate connected to the second active area.

The further conductive element on the second side of the substrate is preferably provided for making an off-chip connection to the second active area.

The photodetector may be a photodiode. The first active area may be an anode and the second active area may be a cathode.

The method may further comprise the step of providing a plurality of photodetector devices and a respective plurality of conductive vias for connecting the active areas of the photodetector devices on the first surface of the substrate to the second surface of the substrate.

A method of manufacturing a plurality of photodetector devices may comprise: forming a plurality of first active area of the photodetector device on a first surface of a substrate; forming a corresponding plurality of second active area on the second surface of the substrate; forming a conductive via for each photodetector electrically isolated from the substrate through the photodetector device from the first surface of the substrate to the second surface of the substrate; and connecting the first active areas to the respective conductive vias such that the first active areas re connected to the second surface of the substrate.

Brief Description of Drawip

For better understanding of the present invention, and to show as to how the same may be carried into effect, reference will now be made by way of example to the accompanying drawings in which: Figure 1 illustrates the basic construction of a photodetector array in accordance with one known arrangement; Figures 2(a) to 2(n) illustrate the main steps in manufacturing a photodetector device in accordance with a preferred embodiment of the invention; Figure 3 illustrates a plan view of a photodetector array manufactured in accordance with the process steps of Figures 2 to 15; Figure 4 illustrates the construction of a large photo-detector array in accordance with an advantageous implementation of the present invention, and Figure 5 illustrates a CT imaging system or machine within which the present invention may be advantageously incorporated in an embodiment.

Description of Preferred Embodiments of the Invention The present invention is described hereinafter with reference to a particular set of embodiments. However the invention is not limited to such embodiments.

The invention is particularly described herein with reference to an example of a photodetector array for a CT medical imaging system. The invention, and embodiments thereof, are however not limited to such applications.

Whilst the invention is illustrated herein by way of reference to various figures, none of these figures are drawn to scale, but rather are drawn to best illustrate various features of the present invention.

With reference to Figures 2(a) to 2(n), there are illustrated selected steps for manufacturing a photo-detector array for a CT imaging system in accordance with a preferred embodiment of the invention. A cross-section through an exemplary device substrate is used for the purpose of explaining the present invention. Only those steps relevant to an understanding of the present invention are shown. Other steps will be familiar to one skilled in the art. One skilled in the art will also be familiar with alternatives to certain steps presented herein in order to achieve the final structure in accordance with the invention.

Referring to Figure 2(a) there is illustrated a cross-section of a n-type semiconductor substrate 30 in which a photo-detector element is formed. A p+ type implant layer 32 is formed in the upper surface of the substrate for forming an active area of a photo-diode. The active area 32 provides the anode of the photo-diode. A field oxide (FOX) layer 38 covers the upper surface of the substrate 30 above the p+ type layer 32.

An n+ implant layer 40 is formed in the under surface of the substrate 30, for forming the cathode of the photo-diode. A thin silicon dioxide layer 42 covers the underside of the substrate 30 and the n+ layer 40.

The structure of Figure 2(a) may be fabricated using key process steps for manufacturing high quality diodes on silicon. Such standard techniques are 1 r,n1 nfl /nTflY known generally in the art, and especially in the art of fabricating photo-diodes for CT imaging applications, and are therefore not described herein. Process steps to achieve the structure shown in Figure 2(a) are well-known.

After the fabrication of the structure illustrated in Figure 2(a), a protective low temperature oxide (LTO) layer 44 is grown on the underside of the substrate, on the silicon dioxide layer 42 covering the n+ (cathode) region, as shown in Figure 2(b).

A photo-resist layer 47, or other alternative protective layer, is then deposited on the upperside of the substrate 30, on the field oxide layer 32, to protect the upperside of the substrate during subsequent processing steps, as shown in Figure 2(c).

In a standard lithographic patterning step, a photo-resist layer 46 is deposited on the underside of the substrate 30, on the low temperature oxide layer 44, as illustrated in Figure 2(d). The photo-resist layer 46 is then patterned to form an opening (not shown) which is used as a mask for chemical etching of the low temperature oxide layer 44 and the thin oxide layer 42 on the underside of the substrate. In addition the mask is used to etch through the n+ type region 40 and partially into the substrate 30.

The resulting structure is illustrated in Figure 2(e). The width of the hole is defined as x, corresponding to the width of the opening in the photo-resist formed for the etch process. The thus formed hole is denoted by reference numeral 45.

A further photo-resist layer 511s then deposited on the underside of the substrate 30 to fill the opening 45. The photo-resist layer is then patterned to form an opening smaller than the width of the opening 45, such that the opening has photo-resist sidewalls. As denoted by Figure 2(f), the opening thus formed in the photo-resist layer 51 is denoted by a width y.

An inductively coupled plasma (ICP) reactor is then used for an etch of a high aspect ratio hole through the silicon wafer of the substrate 30 all the way through to the field oxide layer 38 to form a narrower opening 49, as shown in Figure 2(g).

The photo-resist layer 51 is then removed from the underside of the substrate. The remaining low temperature oxide layer 44 and the thin oxide layer 42 are then also removed from the underside of the substrate by etching, as well as the portion of the field oxide layer 38 exposed in the opening 49. The resulting structure is illustrated in Figure 2(h).

The photo-resist layer 47 is then removed from the upper surface of the substrate 30, and a layer of silicon dioxide grown on the wafer as shown in Figure 2(i). The silicon dioxide is grown on the upper surface of the substrate as illustrated by reference numerals 50a, on the inside of the openings 45 and 49 as illustrated by reference numerals 50b, and on the underside of the substrate as illustrated by reference numerals 5Cc. The silicon oxide grows fastest on the inner walls of the openings 45 and 49, as represented by growth SOb, and on the underside of the substrate, as represented by growth SOc. The silicon dioxide 50a on the upper surface of the substrate forms a thin layer. The opening through the substrate is thus narrowed as illustrated by Figure 2(i). The width of the main opening 45 can now be denoted as x1 and the width of the narrower opening 49 can now be denoted as y1.

A layer of polysilicon is then grown on the whole substrate, including the upper surface, the underside surface, and the inner walls of the openings 45 and 48 as shown in Figure 2(j). As an alternative to polysilicon, any sufficiently conductive material may be grown. The polysilicon is grown such that the openings 45 and 49 are fully filled with polysilicon as denoted by reference numeral 58, and polysilicon layers 56 are formed on the upperside and underside of the substrate.

The polysilicon layer is then grinded/polished in order to remove the polysilicon formed on the upper surface and lower surface of the substrate.

Standard lithographic techniques may be used to remove the polysilicon. As a result the structure illustrated in Figure 2(k) is obtained, where the polysilicon remains only in the openings 45 and 49 as denoted by reference numeral 58.

In further steps not illustrated in the Figures, an oxide layer is then grown over the upper and lower surfaces of the substrate to cover the exposed polysilicon.

Contact openings are then etched in the oxide layer on both sides of the substrate through the silicon dioxide layers as illustrated in Figure 2(l). On the upperside of the substrate, contact openings 64a are etched through the silicon dioxide layer 50a through to the active area of the photo-diode anode 32. A contact opening 64b is etched to the polysilicon layer 58. On the underside of the substrate, a contact opening 66a is etched through to the polysilicon layer 58, and a contact opening 66b is etched through to the photo-diode cathode 40 (i.e. the bulk connection).

Aluminium layers are then deposited on both sides of the substrate, and patterned using the standard lithographic techniques. The resulting structure is shown in Figure 2(m). An aluminium layer 68 is formed and patterned over the upper surface of the substrate such that the aluminium layer 68 makes contact through each of the openings 64a and 64b with the polysilicon layer 58 and the active area of the photo-diode anode 32. An aluminium layer 70 is formed and patterned on the underside of the device to make contact through the opening 66a with the polysilicon layer 58. A further aluminium layer 72 is formed and patterned on the underside of the device to make contact through the opening 66b with the active area of the photo-diode cathode 40.

The structure shown in Figure 2(m) has aluminium contact pads 70 and 72 for both the anode and the cathode on the underside of the substrate.

Figures 2(a) to 2(m) illustrate the formation of, and the structure of, a single photo-diode. For an array of photo-diodes, manufactured on a single silicon chip, a similar structure is provided throughout the whole device. Where an array of photo-diodes are provided on a single silicon chip, a single cathode contact may be common to several or all photo-diodes.

Referring to Figure 2(n), there is shown an upper view of the photo-diode cell of Figure 2(m) viewed from above, i.e. looking down on the device toward the aluminium contact layer 68. The central circle 68 denotes the aluminium contact layer formed over the surface of the polysilicon opening. The square area 32 around the aluminium contact layer 68 denotes the active area of the anode of the photo-diode, which consists of the p+ type region with a layer of silicon dioxide overlaid. The perimeter region 30 denotes the substrate covered by the silicon dioxide layer at the extreme of the active area, where the active area has ceased. The specific shape of the active area and the photo-diode cell may be implementation-dependent, and the arrangement of Figure 2(m) is representative only.

Thus in accordance with the invention and its embodiments the electrical connections for all photo-diodes are provided on the underside of the substrate, for connection off-chip. The electrical connections may be taken off-chip by wire-bonding or bump-bonding, for example, the underside of the substrate to electrical connectors or pads. The inventive arrangement disclosed has a significant advantage in that the contact from the upper surface of the device to the lower surface of the device, such that all electrical contacts may be made at the lower surface of the device, is provided through the device rather than adjacent to the device. As such the overall footprint of the individual photo-diode device (or more generally the photodetector), including the electrical connection from the upper surface to the lower surface, is reduced. Although in the illustrated embodiment the electrical connection from the upper surface of the device to the lower surface of the device is shown to be located in a central position, in accordance with embodiments of the invention the position of this electrical interconnection may be anywhere within the active area of the photo-diode device, i.e. the area 32 denoted by cross hatching in Figure 2(n).

Figures 2(a) to 2(n) illustrate an exemplary process for forming a structure in accordance with the invention. The invention is not limited, however, to such a process. One skilled in the art will appreciate that a structure adhering to the inventive principles may be obtained using an alternative process.

For example, in an alternative, the n+ type layer is doped on the under or lower side fo the substrate to form the cathode contact layer. The via is then formed through the substrate between the upper and lower surfaces. The p+ type layer is then formed at the upper surface of the substrate, followed by the formation of the conductive material in the via.

One skilled in the art will identify alternative processes for achieving the inventive structure. The processes described herein, and the order in which any process is described as being carried out, are exemplary and non-limiting.

Referring now to Figure 3, there is illustrated schematically the structure of an array manufactured according to the techniques of embodiments of the present invention. As can be seen from Figure 3, generally the substrate or wafer surface is provided with a plurality of active areas 70, corresponding to active areas of photodiodes. Although the active areas are shown to be rectangular, the shape of the active areas is not relevant to the present invention and may vary.

Each active area 70 is associated with a via 72, which is formed through the substrate. Although the vias are shown to have a circular cross-section, the shape of the cross-section of the vias is not relevant to the present invention and may vary. Figure 3 is deliberately simplified to illustrate the described embodiment of the invention. Each of the active areas 70 is conductively connected to its associated conductive via by means not shown, but which will be apparent from Figure 2(m).

It should also be understood that the via need not be formed generally in the middle of the photodiode. The advantages of the invention are achieved by forming the via such that it is within the photodiode rather than adjacent to it or otherwise proximate to it. As illustrated in part of Figure 3, for example, reference numeral 72a and 72b denote alternative positions within the photodiode device for forming the via.

The present invention thus provides a technique for constructing a photo-detector array which has two significant advantages.

The inventive technique does not require the provision of space at the edge of the array for the connection of the electrical output signals from the array.

This advantage is obtained by connecting all signals from the semiconductor devices through the substrate, such that they can be connected on the underside of the array rather than the side of the array.

As a result of the removal of the connections from the edge of the array, previously provided in the z direction, there is provided the possibility to extend the size of the overall photo-detector array in the z-axis. Referring to Figure 4, a set of photo-detector arrays 80a to 80d in accordance with the known techniques for assembling arrays is placed together with a further set of arrays 82a to 82d, such that the overall array is extended in the z-axis. As will be appreciated, the array may be further extended in the z-axis. Although the arrays in Figure 4 are shown slightly spaced apart, this is only to illustrate the fact that separate arrays are joined in two dimensions. In practice the arrays are in close proximity to each other in both directions, so as to combine to make a larger array. As such, a tiled structure of arrays can be built in two dimensions, to improve the performance of imaging systems.

The arrays 80a to 80d and 82a to 82d can be considered as sub-arrays, which together form a photo-detector array. The sub-arrays can be considered to form a matrix which forms a photo-detector array. The matrix effectively extends in two-dimensions, although in practice, as can be seen in Figure 5 below, the matrix is curved such that the array extends in a third dimension.

The inventive technique further has the advantage that no connections for the photodiode devices are required outside of the substrate area of the devices.

This means that the overall area required to implement the photodiode device is not increased, the area required corresponding to the size of the active area of the device itself. This is advantageous particularly in photodiode arrays in which a number of devices are provided, the size of such arrays being reduced using the

invention compared with any prior art techniques.

Whilst the present invention has been described in relation to a particular processing technique for forming the advantageous structure of the present invention, it is not limited to such a technique. A chemical or mechanical method may be utilised to manufacture the hole through the substrate, although a chemical method is preferred to maintain structural integrity. Although inductively coupled plasma etching is foreseen as a practical solution to achieve this, other dry etching methods, drilling, spark erosion or laser drilling may also be used.

The invention enables the manufacture of fully tileable' detector structures with highly uniform detector properties, which include a dense array of

photodiodes compared to the prior art..

The present invention has been described herein by way of reference to specific, non-limiting examples. For example, the invention is more generally applicable than the described application to photo-detectors in imaging systems.

In addition, the invention is not limited to any particular material given herein by way of example. The invention is more generally applicable to substrates, wafers and semiconductor devices and the manufacture thereof. The invention, however, is clearly advantageously applicable in implementations requiring arrays of semiconductor devices that must be connected off the device.

Referring to Figure 5, there is illustrated the main elements of a CT imaging machine within which a photo-detector array may be constructed in accordance with a preferred embodiment of the invention, and advantageously utilised. The construction of such machines is well-known in the art, and will be familiar to one skilled in the art. Only the main elements of such a machine are shown in Figure 5, to illustrate the use of the present invention.

The machine principally comprises a scanner generally designated by reference numeral 100, a control and processing means generally designated by reference numeral 102, and an operator interface generally designated by reference numeral 104.

The scanner 100 generally comprises a cylindrical structure 114, a cross-section through which is illustrated in Figure 5. Within the cylindrical structure 114 there is mounted an x-ray source 118 and an array of photo-detectors 120. The array of photo-detectors 120 comprises a plurality of arrays such as the arrays 80 of Figure 4. Thus the array 120 is made up of a plurality of arrays 120a, 120b etc. In the arrangement of Figure 5, the photo-detector arrays 120a, 120b etc are implemented in a tiled structure, and the arrays are connected not only in the plane shown in the cross-section of Figure 5, but also in the z-direction, i.e. into the page along the length of the cylindrical structure 114.

The X-ray source 118 emits X-rays under the control of a signal on line 110 from the control and processing means 102. The X-rays, having a radiation pattern in cross-section generally designated by dashed lines 122, have a footprint which falls onto the photo-detector array 120, which in accordance with the desired techniques extends in the direction of the cylindrical axis, as well as in the direction shown in the cross-section of Figure 5. The outputs from the photo-detectors are provided to the control and processing means 102 on a signal line 112.

An object to be imaged, such as a patient 124, is placed on a table 126 which is typically moved through the imaging machine in the z-direction. In utilising a photo-detector array as described, any movement of the table may be reduced or rendered unnecessary.

The control and processing means 102 includes all necessary means for controlling the mechanical and electronic operation of the scanner 100, including the means for controlling the X-ray source 118 and for processing signals received from the photo-detector array 120. Additional transfer of signals between the control and processing means and the scanner 100 are represented by signal connections 106.

The operator interface 104 communicates with the control and processing means, as represented by signals 108. The operator interface 104 preferably is used to control the operation of the scanner 100, and display results of the scanning process.

Figure 5 represents one useful application of a photo-detector array constructed in accordance with the principles of a preferred embodiment of the present invention. Other useful and advantageous applications will be apparent to one skilled in the art.

It should be understood that the invention is more generally applicable than the examples given herein. One skilled in the art will understand the broader applicability of the present invention. The scope of the invention is defined by the appended claims.

Claims

CLAIMS: 1. A substrate including at least one photodetector, the photodetector having a first active area on a first surface of the substrate and a second active area on a second surface of the substrate, wherein the photodetector is provided with a conductive via electrically isolated from the substrate, said conductive via extending from the first surface of the substrate to the second surface of the substrate for connecting the first active area to the second surface of the substrate, and having an opening of a first width at the first surface and an opening of a second width at the second surface, the second width being greater than the first width, the second surface providing electrical connections for the first and second active areas of the photodetector.
2. A substrate according to claim I wherein the via has a first portion of the first width and a second portion of the second width.
3. A substrate according to claim 2 wherein the portion of the second width is formed proximate the second surface and the portion of the first width extends from the portion of the second width to the first surface.
4. A substrate according to claim 2 or claim 3 wherein the depth of the first portion is greater than the depth of the second portion.
5. A substrate according to any preceding claim wherein said conductive via extends through the first active area.
6. A substrate according to any preceding claim wherein there is provided a further conductive element on the second side of the substrate connected to the conductive via.
7. A substrate according to claim 6 wherein the further conductive element on the second side of the substrate is for making an off-chip connection to the first active area via the conductive via.
8. A substrate according to claim 6 or claim 7 wherein the further conductive element is an aluminium contact element.
9. A substrate according to any preceding claim wherein there is provided a plurality of photodetectors and a respective plurality of conductive vias for connecting a respective plurality of first active areas on the first surface of the substrate to the second surface of the substrate.
10. A substrate according to claim 9 wherein the plurality of photodetectors are photodiodes of a medical imaging system.
11. A substrate according to claim 10 wherein the medical imaging system is a computed tomography system.
12. An imaging system according to claim 10 or claim 11 wherein the medical imaging system has an X-ray radiation source.
13. A method of manufacturing a photodetector device comprising: forming a first active area of the photodetector device on a first surface of a substrate; forming a second active area on the second surface of the substrate; forming a conductive via electrically isolated from the substrate from the first surface of the substrate to the second surface of the substrate, having an opening of a first width at the first surface and an opening of a second width at the second surface, the second width being greater than the first width; and connecting the first active area to the conductive via such that the first active area is connected to the second surface of the substrate.
14. A method according to claim 13 comprising forming the conductive via with a first portion of the first width and a second portion of the second width.
15. A method according to claim 14 comprising forming the portion of the second width proximate the second surface and forming the portion of the first width extending from the portion of the second width to the first surface.
16. A method according to claim 14 or claim 15 comprising forming the depth of the first portion to be greater than the depth of the second portion.
17. A method according to any one of claims 13 to 16 comprising forming the conductive via extending through the first active area.
18. A method according to any one of claims 13 to 17 further comprising the step of providing a further conductive element on the second side of the substrate connected to the conductive via.
19. A method according to claim 18 wherein the further conductive element on the second side of the substrate is provided for making an off-chip connection to the first active area via the conductive via.
20. A method according to any one of claims 13 to 19 further comprising the step of providing a plurality of photodetector devices and a respective plurality of conductive vias for connecting the active areas of the photodetector devices on the first surface of the substrate to the second surface of the substrate.