GB2481459B - Capturing a surface structure of an object surface - Google Patents

Capturing a surface structure of an object surface

Info

Publication number
GB2481459B
GB2481459B GB1010818.1A GB201010818A GB2481459B GB 2481459 B GB2481459 B GB 2481459B GB 201010818 A GB201010818 A GB 201010818A GB 2481459 B GB2481459 B GB 2481459B
Authority
GB
United Kingdom
Prior art keywords
capturing
surface structure
object surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
GB1010818.1A
Other versions
GB2481459A (en
GB201010818D0 (en
Inventor
Stork Andre
Ritz Martin
Scholz Manuel
Danch Daniel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV
Original Assignee
Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV filed Critical Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV
Priority to GB1010818.1A priority Critical patent/GB2481459B/en
Publication of GB201010818D0 publication Critical patent/GB201010818D0/en
Priority to DE102011078052.1A priority patent/DE102011078052B4/en
Publication of GB2481459A publication Critical patent/GB2481459A/en
Application granted granted Critical
Publication of GB2481459B publication Critical patent/GB2481459B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2527—Projection by scanning of the object with phase change by in-plane movement of the patern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/22—Measuring arrangements characterised by the use of optical techniques for measuring depth
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
GB1010818.1A 2010-06-25 2010-06-25 Capturing a surface structure of an object surface Active GB2481459B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
GB1010818.1A GB2481459B (en) 2010-06-25 2010-06-25 Capturing a surface structure of an object surface
DE102011078052.1A DE102011078052B4 (en) 2010-06-25 2011-06-24 Capture the surface structure of an object surface

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB1010818.1A GB2481459B (en) 2010-06-25 2010-06-25 Capturing a surface structure of an object surface

Publications (3)

Publication Number Publication Date
GB201010818D0 GB201010818D0 (en) 2010-08-11
GB2481459A GB2481459A (en) 2011-12-28
GB2481459B true GB2481459B (en) 2017-05-03

Family

ID=42583078

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1010818.1A Active GB2481459B (en) 2010-06-25 2010-06-25 Capturing a surface structure of an object surface

Country Status (2)

Country Link
DE (1) DE102011078052B4 (en)
GB (1) GB2481459B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140307055A1 (en) 2013-04-15 2014-10-16 Microsoft Corporation Intensity-modulated light pattern for active stereo
CN104101611A (en) * 2014-06-06 2014-10-15 华南理工大学 Mirror-like object surface optical imaging device and imaging method thereof

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001006210A1 (en) * 1999-07-14 2001-01-25 Solvision Inc. Method and system for measuring the relief of an object
US6373963B1 (en) * 1998-02-05 2002-04-16 Textile/Clothing Technology Corporation Systems, methods and computer program for measuring the surface contour of an object
US20020072874A1 (en) * 2000-11-22 2002-06-13 Bernd Michaelis Method of detecting flaws in the structure of a surface
WO2004046645A2 (en) * 2002-11-21 2004-06-03 Solvision Fast 3d height measurement method and system
US20040105580A1 (en) * 2002-11-22 2004-06-03 Hager Gregory D. Acquisition of three-dimensional images by an active stereo technique using locally unique patterns
EP1884740A2 (en) * 2006-08-01 2008-02-06 Mitsubishi Electric Corporation Method and system for sensing the surface shape of a reflective object
WO2008052092A2 (en) * 2006-10-25 2008-05-02 D4D Technologies, Llc 3d photogrammetry using projected patterns
WO2008116917A1 (en) * 2007-03-28 2008-10-02 S.O.I.Tec Silicon On Insulator Technologies Method for detecting surface defects on a substrate and device using said method
US20090225333A1 (en) * 2008-03-05 2009-09-10 Clark Alexander Bendall System aspects for a probe system that utilizes structured-light

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3938714A1 (en) * 1989-11-23 1991-05-29 Bernd Dr Breuckmann Optical determination of object shapes, shape variations - using structured coloured light projected onto objects for high resolution, dynamic measurement
US5636025A (en) * 1992-04-23 1997-06-03 Medar, Inc. System for optically measuring the surface contour of a part using more fringe techniques
DE19623172C1 (en) * 1996-06-10 1997-10-23 Univ Magdeburg Tech Three-dimensional optical measuring method for object surface

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6373963B1 (en) * 1998-02-05 2002-04-16 Textile/Clothing Technology Corporation Systems, methods and computer program for measuring the surface contour of an object
WO2001006210A1 (en) * 1999-07-14 2001-01-25 Solvision Inc. Method and system for measuring the relief of an object
US20020072874A1 (en) * 2000-11-22 2002-06-13 Bernd Michaelis Method of detecting flaws in the structure of a surface
WO2004046645A2 (en) * 2002-11-21 2004-06-03 Solvision Fast 3d height measurement method and system
US20040105580A1 (en) * 2002-11-22 2004-06-03 Hager Gregory D. Acquisition of three-dimensional images by an active stereo technique using locally unique patterns
EP1884740A2 (en) * 2006-08-01 2008-02-06 Mitsubishi Electric Corporation Method and system for sensing the surface shape of a reflective object
WO2008052092A2 (en) * 2006-10-25 2008-05-02 D4D Technologies, Llc 3d photogrammetry using projected patterns
WO2008116917A1 (en) * 2007-03-28 2008-10-02 S.O.I.Tec Silicon On Insulator Technologies Method for detecting surface defects on a substrate and device using said method
US20090225333A1 (en) * 2008-03-05 2009-09-10 Clark Alexander Bendall System aspects for a probe system that utilizes structured-light

Also Published As

Publication number Publication date
DE102011078052B4 (en) 2014-07-03
GB2481459A (en) 2011-12-28
GB201010818D0 (en) 2010-08-11
DE102011078052A1 (en) 2011-12-29

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