GB2470293B - Surface coating on sampling cone of mass spectrometer - Google Patents

Surface coating on sampling cone of mass spectrometer

Info

Publication number
GB2470293B
GB2470293B GB1008054.7A GB201008054A GB2470293B GB 2470293 B GB2470293 B GB 2470293B GB 201008054 A GB201008054 A GB 201008054A GB 2470293 B GB2470293 B GB 2470293B
Authority
GB
United Kingdom
Prior art keywords
mass spectrometer
surface coating
sampling cone
cone
sampling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
GB1008054.7A
Other versions
GB201008054D0 (en
GB2470293A (en
Inventor
Gordon A Jones
David S Douce
Amir Farooq
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micromass UK Ltd
Original Assignee
Micromass UK Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micromass UK Ltd filed Critical Micromass UK Ltd
Publication of GB201008054D0 publication Critical patent/GB201008054D0/en
Publication of GB2470293A publication Critical patent/GB2470293A/en
Application granted granted Critical
Publication of GB2470293B publication Critical patent/GB2470293B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
GB1008054.7A 2009-05-13 2010-05-13 Surface coating on sampling cone of mass spectrometer Active GB2470293B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB0908250.4A GB0908250D0 (en) 2009-05-13 2009-05-13 Surface coating on sampling cone of mass spectrometer

Publications (3)

Publication Number Publication Date
GB201008054D0 GB201008054D0 (en) 2010-06-30
GB2470293A GB2470293A (en) 2010-11-17
GB2470293B true GB2470293B (en) 2013-09-25

Family

ID=40833950

Family Applications (2)

Application Number Title Priority Date Filing Date
GBGB0908250.4A Ceased GB0908250D0 (en) 2009-05-13 2009-05-13 Surface coating on sampling cone of mass spectrometer
GB1008054.7A Active GB2470293B (en) 2009-05-13 2010-05-13 Surface coating on sampling cone of mass spectrometer

Family Applications Before (1)

Application Number Title Priority Date Filing Date
GBGB0908250.4A Ceased GB0908250D0 (en) 2009-05-13 2009-05-13 Surface coating on sampling cone of mass spectrometer

Country Status (2)

Country Link
GB (2) GB0908250D0 (en)
WO (1) WO2010131005A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2495127B (en) 2011-09-30 2016-10-19 Thermo Fisher Scient (Bremen) Gmbh Method and apparatus for mass spectrometry
CN112705700B (en) * 2020-12-18 2022-02-08 山东大学 Method for improving high-temperature strength of Inconel 718 laser deposition layer
US11667992B2 (en) 2021-07-19 2023-06-06 Agilent Technologies, Inc. Tip for interface cones

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1125903A (en) * 1997-07-04 1999-01-29 Agency Of Ind Science & Technol Metal-ceramic composite smpler and skimmer
JP2002008584A (en) * 2000-06-27 2002-01-11 Hitachi Ltd Plasma ion mass spectrometry device and method thereof
US20030146378A1 (en) * 2002-02-01 2003-08-07 Alex Mordehai Skimmer for mass spectrometry

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6239440B1 (en) * 1996-03-27 2001-05-29 Thermoceramix, L.L.C. Arc chamber for an ion implantation system
US7838842B2 (en) * 1999-12-13 2010-11-23 Semequip, Inc. Dual mode ion source for ion implantation
JP3787549B2 (en) * 2002-10-25 2006-06-21 株式会社日立ハイテクノロジーズ Mass spectrometer and mass spectrometry method
US20080223409A1 (en) * 2003-12-12 2008-09-18 Horsky Thomas N Method and apparatus for extending equipment uptime in ion implantation

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1125903A (en) * 1997-07-04 1999-01-29 Agency Of Ind Science & Technol Metal-ceramic composite smpler and skimmer
JP2002008584A (en) * 2000-06-27 2002-01-11 Hitachi Ltd Plasma ion mass spectrometry device and method thereof
US20030146378A1 (en) * 2002-02-01 2003-08-07 Alex Mordehai Skimmer for mass spectrometry

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Review of Scientific Instruments Vol. 70, No. 3, March 1999, pages 1640-1648 *

Also Published As

Publication number Publication date
GB0908250D0 (en) 2009-06-24
WO2010131005A1 (en) 2010-11-18
GB201008054D0 (en) 2010-06-30
GB2470293A (en) 2010-11-17

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