GB2440764B - Integrated circuit wearout detection - Google Patents
Integrated circuit wearout detectionInfo
- Publication number
- GB2440764B GB2440764B GB0702096A GB0702096A GB2440764B GB 2440764 B GB2440764 B GB 2440764B GB 0702096 A GB0702096 A GB 0702096A GB 0702096 A GB0702096 A GB 0702096A GB 2440764 B GB2440764 B GB 2440764B
- Authority
- GB
- United Kingdom
- Prior art keywords
- integrated circuit
- wearout detection
- wearout
- detection
- integrated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000001514 detection method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31708—Analysis of signal quality
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2882—Testing timing characteristics
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3004—Current or voltage test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31721—Power aspects, e.g. power supplies for test circuits, power saving during test
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/30—Monitoring
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Quality & Reliability (AREA)
- Nonlinear Science (AREA)
- Debugging And Monitoring (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/878,882 US20080036487A1 (en) | 2006-08-09 | 2007-07-27 | Integrated circuit wearout detection |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US83640006P | 2006-08-09 | 2006-08-09 |
Publications (3)
Publication Number | Publication Date |
---|---|
GB0702096D0 GB0702096D0 (en) | 2007-03-14 |
GB2440764A GB2440764A (en) | 2008-02-13 |
GB2440764B true GB2440764B (en) | 2011-03-02 |
Family
ID=37891253
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB0702096A Expired - Fee Related GB2440764B (en) | 2006-08-09 | 2007-02-02 | Integrated circuit wearout detection |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB2440764B (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2496999B1 (en) * | 2009-11-06 | 2014-06-04 | Freescale Semiconductor, Inc. | Response to wearout in an electronic device |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6136619A (en) * | 1997-10-03 | 2000-10-24 | Interuniversitair Micorelektronica Centrum (Imec, Vzw) | Method for measuring electromigration-induced resistance changes |
US6356514B1 (en) * | 1996-09-17 | 2002-03-12 | Xilinx, Inc. | Built-in self test method for measuring clock to out delays |
US6665823B2 (en) * | 1998-03-18 | 2003-12-16 | Micron Technology, Inc. | Method and apparatus for monitoring component latency drifts |
US20040051553A1 (en) * | 2002-09-13 | 2004-03-18 | Chartered Semiconductor Manufacturing Ltd. | Test structures for on-chip real-time reliability testing |
US6717869B2 (en) * | 2002-04-25 | 2004-04-06 | D.S.P. Group Ltd. | Integrated circuit having redundant, self-organized architecture for improving yield |
US20040249612A1 (en) * | 2003-06-04 | 2004-12-09 | Barr Andrew H. | Apparatus and method for monitoring high impedance failures in chip interconnects |
US20050111155A1 (en) * | 2003-11-21 | 2005-05-26 | Alam Muhammad A. | Predictive applications for devices with thin dielectric regions |
-
2007
- 2007-02-02 GB GB0702096A patent/GB2440764B/en not_active Expired - Fee Related
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6356514B1 (en) * | 1996-09-17 | 2002-03-12 | Xilinx, Inc. | Built-in self test method for measuring clock to out delays |
US6136619A (en) * | 1997-10-03 | 2000-10-24 | Interuniversitair Micorelektronica Centrum (Imec, Vzw) | Method for measuring electromigration-induced resistance changes |
US6665823B2 (en) * | 1998-03-18 | 2003-12-16 | Micron Technology, Inc. | Method and apparatus for monitoring component latency drifts |
US6717869B2 (en) * | 2002-04-25 | 2004-04-06 | D.S.P. Group Ltd. | Integrated circuit having redundant, self-organized architecture for improving yield |
US20040051553A1 (en) * | 2002-09-13 | 2004-03-18 | Chartered Semiconductor Manufacturing Ltd. | Test structures for on-chip real-time reliability testing |
US20040249612A1 (en) * | 2003-06-04 | 2004-12-09 | Barr Andrew H. | Apparatus and method for monitoring high impedance failures in chip interconnects |
US20050111155A1 (en) * | 2003-11-21 | 2005-05-26 | Alam Muhammad A. | Predictive applications for devices with thin dielectric regions |
Also Published As
Publication number | Publication date |
---|---|
GB2440764A (en) | 2008-02-13 |
GB0702096D0 (en) | 2007-03-14 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI339877B (en) | Integrated circuit device | |
TWI370515B (en) | Circuit component | |
HK1115657A1 (en) | Integrated circuit assembly | |
HK1120942A1 (en) | Voice-data-rf ic | |
EP2024997A4 (en) | Double-sided integrated circuit chips | |
EP2130216A4 (en) | Isolated integrated circuit devices | |
HK1121874A1 (en) | Integrated circuit | |
EP2031510A4 (en) | Semiconductor integrated circuit | |
HK1127827A1 (en) | Integrated circuit | |
EP2036119A4 (en) | Three-dimensional integrated circuit for analyte detection | |
EP2073263A4 (en) | Electronic device | |
EP2048550A4 (en) | Electronic device | |
EP1818753A4 (en) | Electronic device | |
GB0506597D0 (en) | Sensing circuits | |
EP2072976A4 (en) | Electronic device | |
TWI349901B (en) | Circuit device | |
SG138593A1 (en) | Electronic device | |
TWI346209B (en) | Fuse reading out circuit | |
EP2040378A4 (en) | Semiconductor integrated circuit device | |
TWI341648B (en) | Osciuating circuit | |
HK1121894A1 (en) | Rf integrated circuit | |
TWI329417B (en) | Circuit device | |
GB0621990D0 (en) | Detection | |
GB0618669D0 (en) | Detection | |
GB0516634D0 (en) | Electronic circuit design |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20120202 |