GB2440764B - Integrated circuit wearout detection - Google Patents

Integrated circuit wearout detection

Info

Publication number
GB2440764B
GB2440764B GB0702096A GB0702096A GB2440764B GB 2440764 B GB2440764 B GB 2440764B GB 0702096 A GB0702096 A GB 0702096A GB 0702096 A GB0702096 A GB 0702096A GB 2440764 B GB2440764 B GB 2440764B
Authority
GB
United Kingdom
Prior art keywords
integrated circuit
wearout detection
wearout
detection
integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB0702096A
Other versions
GB2440764A (en
GB0702096D0 (en
Inventor
Daryl Wayne Bradley
Jason Andrew Blome
Scott Mahlke
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ARM Ltd
University of Michigan
Original Assignee
ARM Ltd
Advanced Risc Machines Ltd
University of Michigan
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ARM Ltd, Advanced Risc Machines Ltd, University of Michigan filed Critical ARM Ltd
Publication of GB0702096D0 publication Critical patent/GB0702096D0/en
Priority to US11/878,882 priority Critical patent/US20080036487A1/en
Publication of GB2440764A publication Critical patent/GB2440764A/en
Application granted granted Critical
Publication of GB2440764B publication Critical patent/GB2440764B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2882—Testing timing characteristics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31721—Power aspects, e.g. power supplies for test circuits, power saving during test
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Quality & Reliability (AREA)
  • Nonlinear Science (AREA)
  • Debugging And Monitoring (AREA)
GB0702096A 2006-08-09 2007-02-02 Integrated circuit wearout detection Expired - Fee Related GB2440764B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US11/878,882 US20080036487A1 (en) 2006-08-09 2007-07-27 Integrated circuit wearout detection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US83640006P 2006-08-09 2006-08-09

Publications (3)

Publication Number Publication Date
GB0702096D0 GB0702096D0 (en) 2007-03-14
GB2440764A GB2440764A (en) 2008-02-13
GB2440764B true GB2440764B (en) 2011-03-02

Family

ID=37891253

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0702096A Expired - Fee Related GB2440764B (en) 2006-08-09 2007-02-02 Integrated circuit wearout detection

Country Status (1)

Country Link
GB (1) GB2440764B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2496999B1 (en) * 2009-11-06 2014-06-04 Freescale Semiconductor, Inc. Response to wearout in an electronic device

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6136619A (en) * 1997-10-03 2000-10-24 Interuniversitair Micorelektronica Centrum (Imec, Vzw) Method for measuring electromigration-induced resistance changes
US6356514B1 (en) * 1996-09-17 2002-03-12 Xilinx, Inc. Built-in self test method for measuring clock to out delays
US6665823B2 (en) * 1998-03-18 2003-12-16 Micron Technology, Inc. Method and apparatus for monitoring component latency drifts
US20040051553A1 (en) * 2002-09-13 2004-03-18 Chartered Semiconductor Manufacturing Ltd. Test structures for on-chip real-time reliability testing
US6717869B2 (en) * 2002-04-25 2004-04-06 D.S.P. Group Ltd. Integrated circuit having redundant, self-organized architecture for improving yield
US20040249612A1 (en) * 2003-06-04 2004-12-09 Barr Andrew H. Apparatus and method for monitoring high impedance failures in chip interconnects
US20050111155A1 (en) * 2003-11-21 2005-05-26 Alam Muhammad A. Predictive applications for devices with thin dielectric regions

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6356514B1 (en) * 1996-09-17 2002-03-12 Xilinx, Inc. Built-in self test method for measuring clock to out delays
US6136619A (en) * 1997-10-03 2000-10-24 Interuniversitair Micorelektronica Centrum (Imec, Vzw) Method for measuring electromigration-induced resistance changes
US6665823B2 (en) * 1998-03-18 2003-12-16 Micron Technology, Inc. Method and apparatus for monitoring component latency drifts
US6717869B2 (en) * 2002-04-25 2004-04-06 D.S.P. Group Ltd. Integrated circuit having redundant, self-organized architecture for improving yield
US20040051553A1 (en) * 2002-09-13 2004-03-18 Chartered Semiconductor Manufacturing Ltd. Test structures for on-chip real-time reliability testing
US20040249612A1 (en) * 2003-06-04 2004-12-09 Barr Andrew H. Apparatus and method for monitoring high impedance failures in chip interconnects
US20050111155A1 (en) * 2003-11-21 2005-05-26 Alam Muhammad A. Predictive applications for devices with thin dielectric regions

Also Published As

Publication number Publication date
GB2440764A (en) 2008-02-13
GB0702096D0 (en) 2007-03-14

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20120202