GB2401945B - Calibration Device - Google Patents

Calibration Device

Info

Publication number
GB2401945B
GB2401945B GB0319460A GB0319460A GB2401945B GB 2401945 B GB2401945 B GB 2401945B GB 0319460 A GB0319460 A GB 0319460A GB 0319460 A GB0319460 A GB 0319460A GB 2401945 B GB2401945 B GB 2401945B
Authority
GB
United Kingdom
Prior art keywords
calibration device
calibration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB0319460A
Other versions
GB2401945A (en
GB0319460D0 (en
Inventor
Peter Cumpson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
UK Secretary of State for Trade and Industry
Original Assignee
UK Secretary of State for Trade and Industry
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by UK Secretary of State for Trade and Industry filed Critical UK Secretary of State for Trade and Industry
Publication of GB0319460D0 publication Critical patent/GB0319460D0/en
Priority to PCT/GB2004/002134 priority Critical patent/WO2004104516A2/en
Priority to US10/557,275 priority patent/US20060267596A1/en
Priority to EP04733589A priority patent/EP1625349A2/en
Publication of GB2401945A publication Critical patent/GB2401945A/en
Application granted granted Critical
Publication of GB2401945B publication Critical patent/GB2401945B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/28—Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/32—Investigating strength properties of solid materials by application of mechanical stress by applying repeated or pulsating forces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/62—Manufacturing, calibrating, or repairing devices used in investigations covered by the preceding subgroups
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q40/00—Calibration, e.g. of probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/003—Generation of the force
    • G01N2203/005—Electromagnetic means
    • G01N2203/0051—Piezoelectric means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/0202—Control of the test
    • G01N2203/021—Treatment of the signal; Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/026—Specifications of the specimen
    • G01N2203/0286—Miniature specimen; Testing on microregions of a specimen
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/026—Specifications of the specimen
    • G01N2203/0288—Springs
    • G01N2203/029—Leaf spring
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/026—Specifications of the specimen
    • G01N2203/0288—Springs
    • G01N2203/0292—Coil spring
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/06—Indicating or recording means; Sensing means
    • G01N2203/067—Parameter measured for estimating the property
    • G01N2203/0676—Force, weight, load, energy, speed or acceleration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/06—Indicating or recording means; Sensing means
    • G01N2203/067—Parameter measured for estimating the property
    • G01N2203/0682—Spatial dimension, e.g. length, area, angle

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Engineering & Computer Science (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
GB0319460A 2003-05-21 2003-08-19 Calibration Device Expired - Fee Related GB2401945B (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
PCT/GB2004/002134 WO2004104516A2 (en) 2003-05-21 2004-05-18 Spring constant calibration device
US10/557,275 US20060267596A1 (en) 2003-05-21 2004-05-18 Spring constant calibration device
EP04733589A EP1625349A2 (en) 2003-05-21 2004-05-18 Spring constant calibration device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB0311693.6A GB0311693D0 (en) 2003-05-21 2003-05-21 Calibration device

Publications (3)

Publication Number Publication Date
GB0319460D0 GB0319460D0 (en) 2003-09-17
GB2401945A GB2401945A (en) 2004-11-24
GB2401945B true GB2401945B (en) 2007-01-03

Family

ID=9958510

Family Applications (2)

Application Number Title Priority Date Filing Date
GBGB0311693.6A Ceased GB0311693D0 (en) 2003-05-21 2003-05-21 Calibration device
GB0319460A Expired - Fee Related GB2401945B (en) 2003-05-21 2003-08-19 Calibration Device

Family Applications Before (1)

Application Number Title Priority Date Filing Date
GBGB0311693.6A Ceased GB0311693D0 (en) 2003-05-21 2003-05-21 Calibration device

Country Status (1)

Country Link
GB (2) GB0311693D0 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0423780D0 (en) * 2004-10-26 2004-12-01 Trade & Industry Sec Dep For Lateral calibration device
CN104793019B (en) * 2014-01-18 2017-09-29 天津大学 The source tracing method of micro-cantilever elastic constant is demarcated on AFM

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10282128A (en) * 1997-04-01 1998-10-23 Shimadzu Corp Scanning probe microscope
DE19919030A1 (en) * 1999-04-27 2000-11-16 Bosch Gmbh Robert Determination of material properties, such as Young's Modulus, of micro-structures with dimensions less than around 2 mm by deflection of a test element and measurement of a representative value before and during deflection
US20020117611A1 (en) * 1994-07-28 2002-08-29 Kley Victor B. Object inspection and/or modification system and method
US20020158637A1 (en) * 2001-04-17 2002-10-31 Clariant Life Science Molecules (Italia) S.P.A Method and apparatus for self-calibration of capacitive sensors
US20020162388A1 (en) * 2001-02-28 2002-11-07 Roger Proksch Noncontact sensitivity and compliance calibration method for cantilever-based instruments
US20030041671A1 (en) * 2001-08-24 2003-03-06 Symyx Technologies, Inc High throughput mechanical property testing of materials libraries using capacitance

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020117611A1 (en) * 1994-07-28 2002-08-29 Kley Victor B. Object inspection and/or modification system and method
JPH10282128A (en) * 1997-04-01 1998-10-23 Shimadzu Corp Scanning probe microscope
DE19919030A1 (en) * 1999-04-27 2000-11-16 Bosch Gmbh Robert Determination of material properties, such as Young's Modulus, of micro-structures with dimensions less than around 2 mm by deflection of a test element and measurement of a representative value before and during deflection
US20020162388A1 (en) * 2001-02-28 2002-11-07 Roger Proksch Noncontact sensitivity and compliance calibration method for cantilever-based instruments
US20020158637A1 (en) * 2001-04-17 2002-10-31 Clariant Life Science Molecules (Italia) S.P.A Method and apparatus for self-calibration of capacitive sensors
US20030041671A1 (en) * 2001-08-24 2003-03-06 Symyx Technologies, Inc High throughput mechanical property testing of materials libraries using capacitance

Also Published As

Publication number Publication date
GB2401945A (en) 2004-11-24
GB0311693D0 (en) 2003-06-25
GB0319460D0 (en) 2003-09-17

Similar Documents

Publication Publication Date Title
EP1621859A4 (en) Force-detecting device
EP1661596A4 (en) Oxygen-concentrating device
EP1630586A4 (en) Micrroscope device
GB0309778D0 (en) Device
EP1617181A4 (en) Displacement-detecting device
EP1626260A4 (en) Torque-detecting device
EP1623834A4 (en) Liquid-jetting device
GB0322566D0 (en) Device
GB0306449D0 (en) Device
PL1631436T3 (en) Calibrating device
GB0300024D0 (en) Device
GB0309779D0 (en) Device
GB0308593D0 (en) Device
GB2412908B (en) Measuring device
GB0320461D0 (en) Device
GB0302532D0 (en) Calibration device
GB0320510D0 (en) Device
GB0320460D0 (en) Device
GB0321161D0 (en) Device
EP1688703A4 (en) Shape-measuring device
GB0320514D0 (en) Device
EP1589343A4 (en) Analyzer-feeding device
EP1679485A4 (en) Long-object measuring device
GB2408020B (en) Measurement device
GB0301384D0 (en) Device

Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20090819