GB2385225B - Defect detecting method in infrared thermal imaging system - Google Patents

Defect detecting method in infrared thermal imaging system

Info

Publication number
GB2385225B
GB2385225B GB0211997A GB0211997A GB2385225B GB 2385225 B GB2385225 B GB 2385225B GB 0211997 A GB0211997 A GB 0211997A GB 0211997 A GB0211997 A GB 0211997A GB 2385225 B GB2385225 B GB 2385225B
Authority
GB
United Kingdom
Prior art keywords
imaging system
thermal imaging
detecting method
infrared thermal
defect detecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB0211997A
Other versions
GB0211997D0 (en
GB2385225A (en
Inventor
Jung-Hwa Park
Jin-Sin Ko
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hanwha Systems Co Ltd
Original Assignee
Samsung Thales Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Thales Co Ltd filed Critical Samsung Thales Co Ltd
Publication of GB0211997D0 publication Critical patent/GB0211997D0/en
Publication of GB2385225A publication Critical patent/GB2385225A/en
Application granted granted Critical
Publication of GB2385225B publication Critical patent/GB2385225B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/80—Camera processing pipelines; Components thereof
    • H04N23/81—Camera processing pipelines; Components thereof for suppressing or minimising disturbance in the image signal generation
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/30—Transforming light or analogous information into electric information
    • H04N5/33—Transforming infrared radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J2005/0077—Imaging
GB0211997A 2002-01-31 2002-05-24 Defect detecting method in infrared thermal imaging system Expired - Fee Related GB2385225B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR10-2002-0005624A KR100423061B1 (en) 2002-01-31 2002-01-31 Method for detecting defect in thermal image system

Publications (3)

Publication Number Publication Date
GB0211997D0 GB0211997D0 (en) 2002-07-03
GB2385225A GB2385225A (en) 2003-08-13
GB2385225B true GB2385225B (en) 2004-05-19

Family

ID=19719015

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0211997A Expired - Fee Related GB2385225B (en) 2002-01-31 2002-05-24 Defect detecting method in infrared thermal imaging system

Country Status (2)

Country Link
KR (1) KR100423061B1 (en)
GB (1) GB2385225B (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100919835B1 (en) * 2009-03-26 2009-10-01 삼성탈레스 주식회사 Method for detecting defect in an infrared detector
CN103335721B (en) * 2013-06-21 2015-10-21 中国科学院西安光学精密机械研究所 Based on the infrared focal plane array dynamic blind pixel detection method of scene matching
KR101656173B1 (en) 2014-02-20 2016-09-08 주식회사 콕스 Method and apparatus for detecting faulty pixel in thermal camera
KR101840837B1 (en) * 2017-12-06 2018-03-21 엘아이지넥스원 주식회사 Apparatus and method for detecting dead pixel according to external infrared detector

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1062257A (en) * 1996-08-20 1998-03-06 Nippon Avionics Co Ltd Automatic pixel defect corrector of infrared ray two-dimensional sensor camera system
US6296387B1 (en) * 1998-11-30 2001-10-02 Commissariat A L'energie Atomique Method for correcting image defects from a matrix-type X or γ-ray detector

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1038697A (en) * 1996-07-23 1998-02-13 Nippon Avionics Co Ltd Narcissus correcting circuit and narcissus correcting method in infrared thermal image device
JP2001228028A (en) * 2000-02-21 2001-08-24 Nippon Avionics Co Ltd Infrared thermal imaging device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1062257A (en) * 1996-08-20 1998-03-06 Nippon Avionics Co Ltd Automatic pixel defect corrector of infrared ray two-dimensional sensor camera system
US6296387B1 (en) * 1998-11-30 2001-10-02 Commissariat A L'energie Atomique Method for correcting image defects from a matrix-type X or γ-ray detector

Also Published As

Publication number Publication date
KR100423061B1 (en) 2004-03-12
KR20030065141A (en) 2003-08-06
GB0211997D0 (en) 2002-07-03
GB2385225A (en) 2003-08-13

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Legal Events

Date Code Title Description
732E Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977)
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20180524