GB2379799A - Integrated dual frequency noise attenuator and transient suppressor - Google Patents
Integrated dual frequency noise attenuator and transient suppressorInfo
- Publication number
- GB2379799A GB2379799A GB0229769A GB0229769A GB2379799A GB 2379799 A GB2379799 A GB 2379799A GB 0229769 A GB0229769 A GB 0229769A GB 0229769 A GB0229769 A GB 0229769A GB 2379799 A GB2379799 A GB 2379799A
- Authority
- GB
- United Kingdom
- Prior art keywords
- electrodes
- dual frequency
- capacitors
- semiconductor
- transient suppressor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H7/00—Multiple-port networks comprising only passive electrical elements as network components
- H03H7/01—Frequency selective two-port networks
- H03H7/17—Structural details of sub-circuits of frequency selective networks
- H03H7/1741—Comprising typical LC combinations, irrespective of presence and location of additional resistors
- H03H7/1783—Combined LC in series path
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C7/00—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
- H01C7/10—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material voltage responsive, i.e. varistors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H7/00—Multiple-port networks comprising only passive electrical elements as network components
- H03H7/01—Frequency selective two-port networks
- H03H7/0115—Frequency selective two-port networks comprising only inductors and capacitors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H1/00—Constructional details of impedance networks whose electrical mode of operation is not specified or applicable to more than one type of network
- H03H2001/0021—Constructional details
- H03H2001/0064—Constructional details comprising semiconductor material
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H1/00—Constructional details of impedance networks whose electrical mode of operation is not specified or applicable to more than one type of network
- H03H2001/0021—Constructional details
- H03H2001/0085—Multilayer, e.g. LTCC, HTCC, green sheets
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Power Engineering (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
- Semiconductor Integrated Circuits (AREA)
- Thermistors And Varistors (AREA)
- Filters And Equalizers (AREA)
Abstract
An integral dual frequency by-pass and transient suppressor device (10) has at least two ceramic semiconductor layers (11 and 31), the upper surfaces of which are formed with electrodes (12 and 13) of generally U-shaped configuration. The base portions (14 and 14a) of the electrodes are exposed at opposite surfaces of the semiconductor layers, the leg portions (15 and 16) of the U-shaped electrodes extending toward the base portions of electrodes of opposite polarity. The overlap (19) or registration area of one pair of legs (15 and 15a) differs from the overlap area (20) of the other leg pair (16 and 16a) with the result that two capacitors of different values are formed, the capacitors being in parallel and accordingly defining a low impedance path at two discrete frequencies. By varying the conductive paths as a function of the length of the electrode and/or the base of the U, a desired internal inductance is developed. Use of a semiconductor material in place of a dielectric provides transient energy suppression by shunting to ground any signal introduced to the device at a level at or above the breakdown voltage of the semiconductor.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US22217100P | 2000-08-01 | 2000-08-01 | |
PCT/US2001/024125 WO2002011160A1 (en) | 2000-08-01 | 2001-08-01 | Integrated dual frequency noise attenuator and transient suppressor |
Publications (2)
Publication Number | Publication Date |
---|---|
GB0229769D0 GB0229769D0 (en) | 2003-01-29 |
GB2379799A true GB2379799A (en) | 2003-03-19 |
Family
ID=22831165
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB0229769A Withdrawn GB2379799A (en) | 2000-08-01 | 2001-08-01 | Integrated dual frequency noise attenuator and transient suppressor |
Country Status (6)
Country | Link |
---|---|
JP (1) | JP2004505577A (en) |
CN (1) | CN1436354A (en) |
AU (1) | AU2001283077A1 (en) |
DE (1) | DE10196201T1 (en) |
GB (1) | GB2379799A (en) |
WO (1) | WO2002011160A1 (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7321485B2 (en) | 1997-04-08 | 2008-01-22 | X2Y Attenuators, Llc | Arrangement for energy conditioning |
US9054094B2 (en) | 1997-04-08 | 2015-06-09 | X2Y Attenuators, Llc | Energy conditioning circuit arrangement for integrated circuit |
US7336468B2 (en) | 1997-04-08 | 2008-02-26 | X2Y Attenuators, Llc | Arrangement for energy conditioning |
DE10202915A1 (en) * | 2002-01-25 | 2003-08-21 | Epcos Ag | Electro-ceramic component with internal electrodes |
KR20060031943A (en) * | 2004-10-11 | 2006-04-14 | 삼성전기주식회사 | Varistor-lc filter compositon device |
JP2008535207A (en) | 2005-03-01 | 2008-08-28 | エックストゥーワイ アテニュエイターズ,エルエルシー | Regulator with coplanar conductor |
DE102022114552A1 (en) | 2022-06-09 | 2023-12-14 | Tdk Electronics Ag | Process for producing a multilayer varistor |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5898562A (en) * | 1997-05-09 | 1999-04-27 | Avx Corporation | Integrated dual frequency noise attenuator |
-
2001
- 2001-08-01 WO PCT/US2001/024125 patent/WO2002011160A1/en active Application Filing
- 2001-08-01 GB GB0229769A patent/GB2379799A/en not_active Withdrawn
- 2001-08-01 CN CN 01811267 patent/CN1436354A/en active Pending
- 2001-08-01 AU AU2001283077A patent/AU2001283077A1/en not_active Abandoned
- 2001-08-01 DE DE10196201T patent/DE10196201T1/en not_active Withdrawn
- 2001-08-01 JP JP2002516796A patent/JP2004505577A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5898562A (en) * | 1997-05-09 | 1999-04-27 | Avx Corporation | Integrated dual frequency noise attenuator |
Also Published As
Publication number | Publication date |
---|---|
WO2002011160A1 (en) | 2002-02-07 |
GB0229769D0 (en) | 2003-01-29 |
JP2004505577A (en) | 2004-02-19 |
CN1436354A (en) | 2003-08-13 |
DE10196201T1 (en) | 2003-04-17 |
AU2001283077A1 (en) | 2002-02-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
WAP | Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1) |