GB2379626A - Orbital polishing apparatus - Google Patents
Orbital polishing apparatusInfo
- Publication number
- GB2379626A GB2379626A GB0227538A GB0227538A GB2379626A GB 2379626 A GB2379626 A GB 2379626A GB 0227538 A GB0227538 A GB 0227538A GB 0227538 A GB0227538 A GB 0227538A GB 2379626 A GB2379626 A GB 2379626A
- Authority
- GB
- United Kingdom
- Prior art keywords
- polishing pad
- orbiting
- platen
- polishing apparatus
- orbits
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000005498 polishing Methods 0.000 title abstract 5
- 238000000034 method Methods 0.000 abstract 2
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/12—Lapping plates for working plane surfaces
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Abstract
The present invention is an apparatus and method for planarizing a front surface of a wafer. The present invention may include a rigid platen (221), for supporting a polishing pad (207), connected to a supporting base that has means, or is connected to means, for orbiting the platen. A carrier (215), preferably a front-reference carrier with a plurality of individually controllable pressure areas (204, 228), may be used to hold and press the wafer against the polishing pad (207) while the supporting base orbits the rigid platen. The planarization process may be further optimized by orbiting the polishing pad in a radius smaller than 4 mm, orbiting the polishing pad faster than 400 orbits per minute or both.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US59031900A | 2000-06-08 | 2000-06-08 | |
PCT/US2001/018351 WO2001094075A1 (en) | 2000-06-08 | 2001-06-06 | Orbital polishing apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
GB0227538D0 GB0227538D0 (en) | 2002-12-31 |
GB2379626A true GB2379626A (en) | 2003-03-19 |
Family
ID=24361775
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB0227538A Withdrawn GB2379626A (en) | 2000-06-08 | 2001-06-06 | Orbital polishing apparatus |
Country Status (7)
Country | Link |
---|---|
US (1) | US20030077986A1 (en) |
JP (1) | JP2004505435A (en) |
KR (1) | KR20030007928A (en) |
AU (1) | AU2001266742A1 (en) |
DE (1) | DE10196317T1 (en) |
GB (1) | GB2379626A (en) |
WO (1) | WO2001094075A1 (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5964653A (en) * | 1997-07-11 | 1999-10-12 | Applied Materials, Inc. | Carrier head with a flexible membrane for a chemical mechanical polishing system |
US20100173567A1 (en) * | 2006-02-06 | 2010-07-08 | Chien-Min Sung | Methods and Devices for Enhancing Chemical Mechanical Polishing Processes |
TW201029807A (en) * | 2009-02-06 | 2010-08-16 | Inotera Memories Inc | A pressure control system for a wafer polish machine |
DE102009030294B4 (en) * | 2009-06-24 | 2013-04-25 | Siltronic Ag | Process for polishing the edge of a semiconductor wafer |
TWI530360B (en) * | 2012-09-28 | 2016-04-21 | 荏原製作所股份有限公司 | Polishing apparatus |
KR102540042B1 (en) | 2021-06-30 | 2023-06-05 | (주)피엔피 | Front-facing Camera Front Area of Encap Glass Polishing Device OLED Display Pannel |
CN115383622B (en) * | 2022-04-20 | 2024-08-27 | 北京晶亦精微科技股份有限公司 | Split universal joint for polishing head and polishing device |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0650806A1 (en) * | 1993-10-28 | 1995-05-03 | Kabushiki Kaisha Toshiba | Polishing apparatus of semiconductor wafer |
US5554064A (en) * | 1993-08-06 | 1996-09-10 | Intel Corporation | Orbital motion chemical-mechanical polishing apparatus and method of fabrication |
EP0803329A2 (en) * | 1996-04-25 | 1997-10-29 | Fujikoshi Kikai Kogyo Kabushiki Kaisha | Polishing machine |
WO1999026761A1 (en) * | 1997-11-21 | 1999-06-03 | Ebara Corporation | Polishing apparatus |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5635083A (en) * | 1993-08-06 | 1997-06-03 | Intel Corporation | Method and apparatus for chemical-mechanical polishing using pneumatic pressure applied to the backside of a substrate |
US5582534A (en) * | 1993-12-27 | 1996-12-10 | Applied Materials, Inc. | Orbital chemical mechanical polishing apparatus and method |
US5449316A (en) * | 1994-01-05 | 1995-09-12 | Strasbaugh; Alan | Wafer carrier for film planarization |
US5423716A (en) * | 1994-01-05 | 1995-06-13 | Strasbaugh; Alan | Wafer-handling apparatus having a resilient membrane which holds wafer when a vacuum is applied |
JPH07241764A (en) * | 1994-03-04 | 1995-09-19 | Fujitsu Ltd | Polishing device and polishing method |
US5908530A (en) * | 1995-05-18 | 1999-06-01 | Obsidian, Inc. | Apparatus for chemical mechanical polishing |
US6024630A (en) * | 1995-06-09 | 2000-02-15 | Applied Materials, Inc. | Fluid-pressure regulated wafer polishing head |
US5941758A (en) * | 1996-11-13 | 1999-08-24 | Intel Corporation | Method and apparatus for chemical-mechanical polishing |
DE19651761A1 (en) * | 1996-12-12 | 1998-06-18 | Wacker Siltronic Halbleitermat | Method and device for polishing semiconductor wafers |
US5851140A (en) * | 1997-02-13 | 1998-12-22 | Integrated Process Equipment Corp. | Semiconductor wafer polishing apparatus with a flexible carrier plate |
US5882243A (en) * | 1997-04-24 | 1999-03-16 | Motorola, Inc. | Method for polishing a semiconductor wafer using dynamic control |
JP3027551B2 (en) * | 1997-07-03 | 2000-04-04 | キヤノン株式会社 | Substrate holding device, polishing method and polishing device using the substrate holding device |
JPH11226865A (en) * | 1997-12-11 | 1999-08-24 | Speedfam Co Ltd | Carrier and cmp device |
JP2907209B1 (en) * | 1998-05-29 | 1999-06-21 | 日本電気株式会社 | Back pad for wafer polishing equipment |
US6093089A (en) * | 1999-01-25 | 2000-07-25 | United Microelectronics Corp. | Apparatus for controlling uniformity of polished material |
US6050882A (en) * | 1999-06-10 | 2000-04-18 | Applied Materials, Inc. | Carrier head to apply pressure to and retain a substrate |
-
2001
- 2001-06-06 JP JP2002501624A patent/JP2004505435A/en active Pending
- 2001-06-06 WO PCT/US2001/018351 patent/WO2001094075A1/en active Application Filing
- 2001-06-06 GB GB0227538A patent/GB2379626A/en not_active Withdrawn
- 2001-06-06 DE DE10196317T patent/DE10196317T1/en not_active Withdrawn
- 2001-06-06 AU AU2001266742A patent/AU2001266742A1/en not_active Abandoned
- 2001-06-06 KR KR1020027016763A patent/KR20030007928A/en not_active Application Discontinuation
-
2002
- 2002-11-22 US US10/302,223 patent/US20030077986A1/en not_active Abandoned
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5554064A (en) * | 1993-08-06 | 1996-09-10 | Intel Corporation | Orbital motion chemical-mechanical polishing apparatus and method of fabrication |
EP0650806A1 (en) * | 1993-10-28 | 1995-05-03 | Kabushiki Kaisha Toshiba | Polishing apparatus of semiconductor wafer |
EP0803329A2 (en) * | 1996-04-25 | 1997-10-29 | Fujikoshi Kikai Kogyo Kabushiki Kaisha | Polishing machine |
WO1999026761A1 (en) * | 1997-11-21 | 1999-06-03 | Ebara Corporation | Polishing apparatus |
Also Published As
Publication number | Publication date |
---|---|
US20030077986A1 (en) | 2003-04-24 |
JP2004505435A (en) | 2004-02-19 |
GB0227538D0 (en) | 2002-12-31 |
AU2001266742A1 (en) | 2001-12-17 |
WO2001094075A1 (en) | 2001-12-13 |
KR20030007928A (en) | 2003-01-23 |
DE10196317T1 (en) | 2003-11-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
WAP | Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1) |