GB2356983A - Probe assembly for measuring surface resistance - Google Patents
Probe assembly for measuring surface resistance Download PDFInfo
- Publication number
- GB2356983A GB2356983A GB9928591A GB9928591A GB2356983A GB 2356983 A GB2356983 A GB 2356983A GB 9928591 A GB9928591 A GB 9928591A GB 9928591 A GB9928591 A GB 9928591A GB 2356983 A GB2356983 A GB 2356983A
- Authority
- GB
- United Kingdom
- Prior art keywords
- probe
- surface resistance
- measuring surface
- probe assembly
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
Landscapes
- Physics & Mathematics (AREA)
- Geometry (AREA)
- General Physics & Mathematics (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
A probe assembly for measuring surface resistance comprises a central probe 4 an outer annular concentric probe 2 and an insulating sheath 1 outside the outer contact, the surface area of tip the central probe 2 being equal to that of the outer probe 4 and also equal to the area between the probes. A constant pressure is applies the probe tips to a surface whose surface resistance is to be measured.
Description
2356983 PROBE The invention to be patented is a low Ohm meter specially
designed for testing conductive coatings used in the EMC industry. The acceptable test criteria is a measure of Ohms per square measure or area This is an expanding industry world wide and whilst there are test establishments designed for full product testing and so called coating testers, there has been no universally accepted error free system designed for this purpose. Existing testers can produce a variety of different readings depending on operator pressure, and by their design there is always leakage around the test area The new Probe operates with a constant test pressure which satisfies all existing requirements. It can be operated as a hand held tool, be bench mounted or even installed to control quality and material usage on automatic robotically operated production lines.
THEINVENTION.
The new invention in the probe meter is contained in the working head which is of a circular design. The external layer or coating is of a non conductive material to prevent any current leakage (1). Tightly fitted to the inside of this cover is a band of conductive material such as brass (2) which acts as a receiver for the applied charge. Next there is an air gap (3) which surrounds a second rod of conductive material (4) through which the charge is introduced. When not in use both 2 and 4 protrude out from the non conductive material.
The main point of the invention is that contact areas of 2, 3 and 4 are equal. A calibrated load is applied to the internal ends of 2 and 4 by either mechanical or dynamically means. This load is pre-set during manufacture to generate the trial parameters for each particular product range. The outer ridged non conductive layer prevents excess pressure being applied be any external agent. This produces a standard piece of testing equipment which can be hand bench or automatically applied.
2- There already exists a large number of hand or bench test meters which can be adapted to accommodate the tool head. The most suitable of these will be chosen and the LCD unit will be modified to show simply Pass or Fail. A two single sound generator will also be added to correspond to the above signals.
It is anticipated that any meter would also be able to simultaneously test the product for continuity between any predetermined points enabling one meter perform both tests.
In a fully automated system the fail signal would be linked to any coding system being used resulting in that any component failing to comply would not be coded and could be removed from any subsequent operational line.
Each system will be sealed and re-calibrated at source as required.
- 1
Claims (6)
1. The design and operation of the circular head is unique.
2. The tension parameters are pre-set during manufacture to conform to the product specification required test ranges.
3. The system eliminates operator error.
4. It is independent of product shape or size.
5. It can be used either hand held, bench mounted or incorporated into a fully automatic operating system used with custom designed software.
6. It is independent of the coating materials and can be set to test all current and projected future materials.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB9928591A GB2356983A (en) | 1999-12-03 | 1999-12-03 | Probe assembly for measuring surface resistance |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB9928591A GB2356983A (en) | 1999-12-03 | 1999-12-03 | Probe assembly for measuring surface resistance |
Publications (2)
Publication Number | Publication Date |
---|---|
GB9928591D0 GB9928591D0 (en) | 2000-02-02 |
GB2356983A true GB2356983A (en) | 2001-06-06 |
Family
ID=10865641
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB9928591A Withdrawn GB2356983A (en) | 1999-12-03 | 1999-12-03 | Probe assembly for measuring surface resistance |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB2356983A (en) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4218650A (en) * | 1978-06-23 | 1980-08-19 | Nasa | Apparatus for measuring semiconductor device resistance |
EP0137370A2 (en) * | 1983-09-23 | 1985-04-17 | Probe-Rite, Inc. | Surface mating coaxial connector |
GB2166913A (en) * | 1984-11-13 | 1986-05-14 | Tektronix Inc | Impedance matched test probe |
US5512838A (en) * | 1992-09-03 | 1996-04-30 | Hewlett-Packard Company | Probe with reduced input capacitance |
-
1999
- 1999-12-03 GB GB9928591A patent/GB2356983A/en not_active Withdrawn
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4218650A (en) * | 1978-06-23 | 1980-08-19 | Nasa | Apparatus for measuring semiconductor device resistance |
EP0137370A2 (en) * | 1983-09-23 | 1985-04-17 | Probe-Rite, Inc. | Surface mating coaxial connector |
GB2166913A (en) * | 1984-11-13 | 1986-05-14 | Tektronix Inc | Impedance matched test probe |
US5512838A (en) * | 1992-09-03 | 1996-04-30 | Hewlett-Packard Company | Probe with reduced input capacitance |
Also Published As
Publication number | Publication date |
---|---|
GB9928591D0 (en) | 2000-02-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
WAP | Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1) |