GB2354366A - Neutron lens - Google Patents
Neutron lensInfo
- Publication number
- GB2354366A GB2354366A GB0028572A GB0028572A GB2354366A GB 2354366 A GB2354366 A GB 2354366A GB 0028572 A GB0028572 A GB 0028572A GB 0028572 A GB0028572 A GB 0028572A GB 2354366 A GB2354366 A GB 2354366A
- Authority
- GB
- United Kingdom
- Prior art keywords
- neutron
- wafers
- neutrons
- reflecting coating
- lens
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/061—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements characterised by a multilayer structure
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/064—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/067—Construction details
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/068—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements specially adapted for particle beams
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Measurement Of Radiation (AREA)
Abstract
A neutron lens comprises a series of silicon wafers (2), each preferably shaped to describe a two dimensional ellipsoidal surface, with a neutron reflecting coating (4) sandwiched between adjacent wafers. The wafers are arranged so that their major axes are approximately aligned with the neutron beam direction. The wafers of silicon act as conduits for the neutrons and also provide structural surfaces to which the neutron reflecting coating (4) is applied. With the neutron lens the gauge volume can be defined with a higher flux of neutrons than has previously been possible.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB9909052.4A GB9909052D0 (en) | 1999-04-20 | 1999-04-20 | Neutron lens |
PCT/GB2000/001574 WO2000063922A1 (en) | 1999-04-20 | 2000-04-20 | Neutron lens |
Publications (2)
Publication Number | Publication Date |
---|---|
GB0028572D0 GB0028572D0 (en) | 2001-01-10 |
GB2354366A true GB2354366A (en) | 2001-03-21 |
Family
ID=10851907
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GBGB9909052.4A Ceased GB9909052D0 (en) | 1999-04-20 | 1999-04-20 | Neutron lens |
GB0028572A Withdrawn GB2354366A (en) | 1999-04-20 | 2000-04-20 | Neutron lens |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GBGB9909052.4A Ceased GB9909052D0 (en) | 1999-04-20 | 1999-04-20 | Neutron lens |
Country Status (2)
Country | Link |
---|---|
GB (2) | GB9909052D0 (en) |
WO (1) | WO2000063922A1 (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10138313A1 (en) | 2001-01-23 | 2002-07-25 | Zeiss Carl | Collector for lighting systems with a wavelength <193 nm |
WO2003014833A2 (en) | 2001-08-10 | 2003-02-20 | Carl Zeiss Smt Ag | Collector with fastening devices for fastening mirror shells |
DE10138284A1 (en) | 2001-08-10 | 2003-02-27 | Zeiss Carl | Lighting system with nested collectors for use in EUV microlithography |
US7084412B2 (en) | 2002-03-28 | 2006-08-01 | Carl Zeiss Smt Ag | Collector unit with a reflective element for illumination systems with a wavelength of smaller than 193 nm |
CN111060538B (en) * | 2019-11-12 | 2021-02-26 | 倪其棍 | Vehicle safety inspection equipment |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02307099A (en) * | 1989-05-23 | 1990-12-20 | Seiko Epson Corp | X-ray optical guide |
JPH07159599A (en) * | 1993-12-10 | 1995-06-23 | Nikon Corp | Neutron reflecting mirror |
WO1997006534A1 (en) * | 1995-08-04 | 1997-02-20 | X-Ray Optical Systems, Inc. | Multiple channel optic |
DE19844300A1 (en) * | 1998-09-17 | 2000-03-30 | Hahn Meitner Inst Berlin Gmbh | Neutron-optical component, especially a sub-thermal neutron beam collimator or polarizer, has repeating sequences of a neutron conducting metal foil between neutron absorbing and/or spin selective reflecting layers |
-
1999
- 1999-04-20 GB GBGB9909052.4A patent/GB9909052D0/en not_active Ceased
-
2000
- 2000-04-20 WO PCT/GB2000/001574 patent/WO2000063922A1/en active Application Filing
- 2000-04-20 GB GB0028572A patent/GB2354366A/en not_active Withdrawn
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02307099A (en) * | 1989-05-23 | 1990-12-20 | Seiko Epson Corp | X-ray optical guide |
JPH07159599A (en) * | 1993-12-10 | 1995-06-23 | Nikon Corp | Neutron reflecting mirror |
WO1997006534A1 (en) * | 1995-08-04 | 1997-02-20 | X-Ray Optical Systems, Inc. | Multiple channel optic |
DE19844300A1 (en) * | 1998-09-17 | 2000-03-30 | Hahn Meitner Inst Berlin Gmbh | Neutron-optical component, especially a sub-thermal neutron beam collimator or polarizer, has repeating sequences of a neutron conducting metal foil between neutron absorbing and/or spin selective reflecting layers |
Non-Patent Citations (8)
Title |
---|
CUSSEN L D;"A Design for Improved Neutron Collimators", Nuclear Instruments and Methods in * |
MILDNER D F R "Neutron Focussing Using Microguides",15.11.90Nuclear Instruments and Methods in * |
MILDNER D F R :"The neutrom microguide as a probe for materials analysis" 20 December 1990 * |
Nuclear Instruments and Methods in Physics Research SectionAPages 416-419, Netherlands. * |
Patent Abstracts of Japan, Vol.015, No.091, 05.03.1991 & JP 02 307 099 A 20.12.1990 * |
Physics Research, Section A, pages 365-371, North Holland Publishing Co.Amsterdam, NL 11.09.1998 * |
Physics Research, Section A, pages 38-46, North Holland Publishing Company, Amsterdam, NL * |
WPI Abstract Accession Number 1995-257169 & JP 07 159 599 A, 23.06.1995 * |
Also Published As
Publication number | Publication date |
---|---|
GB9909052D0 (en) | 1999-06-16 |
WO2000063922A1 (en) | 2000-10-26 |
GB0028572D0 (en) | 2001-01-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
WAP | Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1) |