GB2351860B - Method of controlling the switching DI/DT and DV/DT of a mos-gated power transistor - Google Patents
Method of controlling the switching DI/DT and DV/DT of a mos-gated power transistorInfo
- Publication number
- GB2351860B GB2351860B GB0025680A GB0025680A GB2351860B GB 2351860 B GB2351860 B GB 2351860B GB 0025680 A GB0025680 A GB 0025680A GB 0025680 A GB0025680 A GB 0025680A GB 2351860 B GB2351860 B GB 2351860B
- Authority
- GB
- United Kingdom
- Prior art keywords
- mos
- switching
- controlling
- power transistor
- gated power
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/16—Modifications for eliminating interference voltages or currents
- H03K17/161—Modifications for eliminating interference voltages or currents in field-effect transistor switches
- H03K17/165—Modifications for eliminating interference voltages or currents in field-effect transistor switches by feedback from the output circuit to the control circuit
- H03K17/166—Soft switching
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/12—Measuring rate of change
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2621—Circuits therefor for testing field effect transistors, i.e. FET's
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/16—Modifications for eliminating interference voltages or currents
- H03K17/168—Modifications for eliminating interference voltages or currents in composite switches
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Conversion In General (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US2884096P | 1996-10-21 | 1996-10-21 | |
GB9722243A GB2318467B (en) | 1996-10-21 | 1997-10-21 | Method of controlling the switching di/dt and dv/dt of a mos-gated power transistor |
Publications (3)
Publication Number | Publication Date |
---|---|
GB0025680D0 GB0025680D0 (en) | 2000-12-06 |
GB2351860A GB2351860A (en) | 2001-01-10 |
GB2351860B true GB2351860B (en) | 2001-03-21 |
Family
ID=26312463
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB0025680A Expired - Fee Related GB2351860B (en) | 1996-10-21 | 1997-10-21 | Method of controlling the switching DI/DT and DV/DT of a mos-gated power transistor |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB2351860B (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101454979B (en) * | 2006-05-29 | 2013-03-27 | 皇家飞利浦电子股份有限公司 | Switching circuit arrangement |
WO2007138509A2 (en) | 2006-05-29 | 2007-12-06 | Koninklijke Philips Electronics N.V. | Switching circuit arrangement |
CN106226673B (en) * | 2016-09-12 | 2023-02-17 | 河北工业大学 | Combined type fault automatic detection device of IGBT |
CN111527684B (en) | 2018-07-17 | 2023-09-22 | 富士电机株式会社 | Power module with built-in driving circuit |
EP4063878A1 (en) | 2021-03-25 | 2022-09-28 | Nxp B.V. | Integrated circuit and associated method |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4947063A (en) * | 1987-10-09 | 1990-08-07 | Western Digital Corporation | Method and apparatus for reducing transient noise in integrated circuits |
EP0493185A1 (en) * | 1990-12-27 | 1992-07-01 | Automobiles Peugeot | Control circuit for a force commutated power transistor |
GB2257854A (en) * | 1991-07-16 | 1993-01-20 | Motorola Inc | Drive circuits |
EP0645889A1 (en) * | 1993-09-13 | 1995-03-29 | Siemens Aktiengesellschaft | Method and device for limiting the rate of current decrease at swith-off of semiconductor power switches with MOS control imput |
-
1997
- 1997-10-21 GB GB0025680A patent/GB2351860B/en not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4947063A (en) * | 1987-10-09 | 1990-08-07 | Western Digital Corporation | Method and apparatus for reducing transient noise in integrated circuits |
EP0493185A1 (en) * | 1990-12-27 | 1992-07-01 | Automobiles Peugeot | Control circuit for a force commutated power transistor |
GB2257854A (en) * | 1991-07-16 | 1993-01-20 | Motorola Inc | Drive circuits |
EP0645889A1 (en) * | 1993-09-13 | 1995-03-29 | Siemens Aktiengesellschaft | Method and device for limiting the rate of current decrease at swith-off of semiconductor power switches with MOS control imput |
Also Published As
Publication number | Publication date |
---|---|
GB0025680D0 (en) | 2000-12-06 |
GB2351860A (en) | 2001-01-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20041021 |