GB2351399B - Spring probe assemblies - Google Patents

Spring probe assemblies

Info

Publication number
GB2351399B
GB2351399B GB0021623A GB0021623A GB2351399B GB 2351399 B GB2351399 B GB 2351399B GB 0021623 A GB0021623 A GB 0021623A GB 0021623 A GB0021623 A GB 0021623A GB 2351399 B GB2351399 B GB 2351399B
Authority
GB
United Kingdom
Prior art keywords
spring probe
probe assemblies
assemblies
spring
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
GB0021623A
Other versions
GB2351399A (en
GB0021623D0 (en
Inventor
Gordon A Vinther
Scott D Chabineau
Charles J Johnston
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Delaware Capital Formation Inc
Capital Formation Inc
Original Assignee
Delaware Capital Formation Inc
Capital Formation Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US09/253,320 external-priority patent/US6396293B1/en
Application filed by Delaware Capital Formation Inc, Capital Formation Inc filed Critical Delaware Capital Formation Inc
Publication of GB0021623D0 publication Critical patent/GB0021623D0/en
Publication of GB2351399A publication Critical patent/GB2351399A/en
Application granted granted Critical
Publication of GB2351399B publication Critical patent/GB2351399B/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
GB0021623A 1999-02-18 1999-03-16 Spring probe assemblies Expired - Lifetime GB2351399B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/253,320 US6396293B1 (en) 1999-02-18 1999-02-18 Self-closing spring probe
GB9905858A GB2347023B (en) 1999-02-18 1999-03-16 Spring probe

Publications (3)

Publication Number Publication Date
GB0021623D0 GB0021623D0 (en) 2000-10-18
GB2351399A GB2351399A (en) 2000-12-27
GB2351399B true GB2351399B (en) 2001-07-25

Family

ID=26315268

Family Applications (3)

Application Number Title Priority Date Filing Date
GB0021621A Expired - Lifetime GB2356744B (en) 1999-02-18 1999-03-16 Spring probe
GB0021623A Expired - Lifetime GB2351399B (en) 1999-02-18 1999-03-16 Spring probe assemblies
GB0021622A Expired - Lifetime GB2351398B (en) 1999-02-18 1999-03-16 Spring probe

Family Applications Before (1)

Application Number Title Priority Date Filing Date
GB0021621A Expired - Lifetime GB2356744B (en) 1999-02-18 1999-03-16 Spring probe

Family Applications After (1)

Application Number Title Priority Date Filing Date
GB0021622A Expired - Lifetime GB2351398B (en) 1999-02-18 1999-03-16 Spring probe

Country Status (1)

Country Link
GB (3) GB2356744B (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6462567B1 (en) * 1999-02-18 2002-10-08 Delaware Capital Formation, Inc. Self-retained spring probe
SG129245A1 (en) * 2003-04-29 2007-02-26 Tan Yin Leong Improved probe for integrated circuit test socket
KR101457168B1 (en) 2013-07-19 2014-11-04 황동원 Spring contact
CN103901241A (en) * 2014-04-01 2014-07-02 盐城工业职业技术学院 Telescopic multimeter stick

Also Published As

Publication number Publication date
GB2351399A (en) 2000-12-27
GB2351398A (en) 2000-12-27
GB0021622D0 (en) 2000-10-18
GB0021621D0 (en) 2000-10-18
GB2356744B (en) 2002-03-13
GB0021623D0 (en) 2000-10-18
GB2356744A (en) 2001-05-30
GB2351398B (en) 2001-07-25

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Legal Events

Date Code Title Description
PE20 Patent expired after termination of 20 years

Expiry date: 20190315